Number | Date | Country | Kind |
---|---|---|---|
3-119441 | Apr 1991 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4818169 | Schram | Apr 1989 | |
5028780 | Kaito et al. | Jul 1991 |
Number | Date | Country |
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WO9104634 | Apr 1991 | WOX |
Entry |
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IBM Technical Disclosure Bulletin, vol. 31, No. 10, Mar. 1989 pp. 474-479. |
Japanese Abstracts of Japan No. JP 1254845, Publication Date Nov. 10, 1989 Hidehiko et al, Method and Device for Inspecting Semiconductor Element. |
Japanese Abstracts of Japan No. 62-87838, Publication date Apr. 1987 Ueda, Specimen Preparing Jig for Observing Cross-Section of IC Chip. |