A variety of approaches have been developed for measuring surface topography optically. For example, optical systems and methods have been developed and employed that can be used to optically measure surface topography of a patient's teeth. The measured surface topography of the teeth can be used, for example, to design and manufacture a dental prosthesis and/or to determine an orthodontic treatment plan to correct a malocclusion.
One technique for measuring surface topography optically employs laser triangulation to measure distance between a surface of the tooth and an optical distance probe, which is inserted into the oral cavity of the patient. Surface topography measured via laser triangulation, however, may be less accurate than desired due to, for example, sub-optimal reflectivity from the surface of the tooth.
Other techniques for measuring surface topography optically, which are embodied in CEREC-1 and CEREC-2 systems commercially available from Siemens GmbH or Sirona Dental Systems, utilize the light-section method and phase-shift method, respectively. Both systems employ a specially designed hand-held probe to measure the three-dimensional coordinates of a prepared tooth. Both of these approaches, however, require a specific coating (i.e. measurement powder and white-pigments suspension, respectively) to be deposited to the tooth. The thickness of the coating layer should meet specific, difficult to control requirements, which leads to inaccuracies in the measurement data.
In yet another technique, mapping of teeth surface is based on physical scanning of the surface by a probe and by determining the probe's position, e.g., by optical or other remote sensing means.
U.S. Pat. No. 5,372,502 discloses an optical probe for three-dimensional surveying. Various patterns are projected onto the tooth or teeth to be measured and corresponding plurality of distorted patterns are captured by the optical probe. Each captured pattern provides refinement of the topography.
Systems and methods for optically determining surface topography of three-dimensional structures are provided. In many embodiments, a system for optically determining surface topography includes an optical assembly configured to focus a two-dimensional array of light beams each comprising a plurality of wavelengths to a plurality of focal lengths relative to the optical assembly. The systems and methods described herein provide chromatic confocal scanning of three-dimensional structures without using an axial scanning mechanism (e.g., mechanism for scanning in the direction of propagation of the chief rays of the incident light), thus enabling smaller and faster scanning optics. The systems and methods described herein can also be used to provide chromatic confocal scanning of three-dimensional structures without using a lateral scanning mechanism, thereby further enabling smaller and faster scanning optics. Furthermore, embodiments described herein permit scanning using a two-dimensional array of light beams focused to a continuous spectrum of focal lengths, thereby providing improved measurement accuracy, resolution, and depth.
Thus, in one aspect, a system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit, an optical assembly, a detector, and a processor. The illumination unit can be configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. The optical assembly can be configured to focus the plurality of wavelengths of each light beam of to a plurality of focal lengths relative to the optical assembly so as to simultaneously illuminate the structure over a two-dimensional field of view. The detector can be configured to measure a characteristic of light reflected from the structure for each of a plurality of locations distributed in two dimensions over the field of view. The processor can be operatively coupled with the detector and configured to generate data representative of the surface topography of the structure based on the measured characteristics of the light reflected from the structure.
In another aspect, a method for determining surface topography of a three-dimensional structure is provided. The method includes generating a two-dimensional array of light beams each comprising a plurality of wavelengths. The plurality of wavelengths of each light beam can be focused to a plurality of focal lengths relative to the structure so as to simultaneously illuminate the structure over a two-dimensional field of view. A characteristic of light reflected from the structure can be measured for each of a plurality of locations distributed in two dimensions over the field of view. Data representative of the surface topography of the structure can be generated based on the measured characteristics of the light reflected from the structure.
Other objects and features of the present invention will become apparent by a review of the specification, claims, and appended figures.
All publications, patents, and patent applications mentioned in this specification are herein incorporated by reference to the same extent as if each individual publication, patent, or patent application was specifically and individually indicated to be incorporated by reference.
The novel features of the invention are set forth with particularity in the appended claims. A better understanding of the features and advantages of the present invention will be obtained by reference to the following detailed description that sets forth illustrative embodiments, in which the principles of the invention are utilized, and the accompanying drawings of which:
In many embodiments, the systems and methods described herein for determining surface topography of a three-dimensional structure focus a two-dimensional array of light beams that each include a plurality of wavelengths to a plurality of focal lengths relative to an optical assembly. The surface topography can be ascertained by determining, at each point in a two-dimensional field of view, the wavelength having the best focus. Since each wavelength of the plurality of wavelengths is focused to a unique respective focal length, the distance to each point can thus be inferred. The structure being measured can be simultaneously illuminated with the array of light beams over the two-dimensional field of view. In many embodiments, the two-dimensional array of light beams projects a two-dimensional array of spots onto the structure. Light reflected from each of the spots on the structure over the two-dimensional field of view can be directed onto a two-dimensional detector configured to process the reflected light to determine, for each location of the reflected light distributed over the two-dimensional field of view, a characteristic of the light indicative of the respective distance to the structure being measured. In contrast to prior approaches that require a lateral scanning mechanism (a mechanism for scanning the light laterally relative to the direction of propagation of the chief rays of light used to illuminate the structure), the embodiments disclosed herein provide optical measurements without a lateral scanning mechanism. The use of a two-dimensional spot array for illuminating the structure may provide improved measurement depth, accuracy, and resolution compared to prior approaches. In many embodiments, the plurality of focal lengths covers a sufficient overall distance so that no axial scanning mechanism (a mechanism for scanning the plurality of focal lengths relative to the optical assembly) is required. In many embodiments, the wavelengths of the light beams are focused to a continuous spectrum of focal lengths, which may provide increased measurement accuracy compared to prior approaches. Accordingly, the optical systems described herein can be smaller, more compact, and faster than conventional systems.
The array of light beams can be used to simultaneously illuminate the structure over the two-dimensional field of view, thereby generating returning light reflected from the structure over the two-dimensional field of view. One or more characteristics of the returning reflected light can be measured for each point in the field of view and used to determine the distance to the structure for each of the points. Suitable characteristics can include intensity, wavelength, polarization, phase shift, interference, and/or dispersion of the returning light beams. Any description herein relating to light intensity can also be applied to other suitable characteristics of light, and vice-versa.
For example, in many embodiments, the intensity of a particular returning wavelength for a particular point in the two-dimensional field of view is maximized when the wavelength is focused on the surface of the structure. Accordingly, by focusing each light beam to the plurality of focal lengths relative to the optical assembly so as to illuminate the structure over the two-dimensional field of view, the relative distance to the structure from the optical assembly from which the light is emitted can be determined for each point in the field of view based on which returning wavelength has the highest measured intensity for the respective point in the field of view. In many embodiments, the plurality of focal lengths covers a sufficient depth so as to obviate the need for axial scanning of the wavelengths to identify the in-focus distance, thereby enabling completely static imaging optics. By decreasing the need for axial scanning, the cost, weight, and size of the optical measurement device can be reduced, and faster optical scans are possible.
The systems and methods described herein can be used to take optical measurements of the surfaces of any suitable three-dimensional structure. In many embodiments, optical measurements are taken to generate data representing the three-dimensional surface topography of a patient's dentition. The data can be used, for example, to produce a three-dimensional virtual model of the dentition that can be displayed and manipulated. The three-dimensional virtual models can be used to, for example, define spatial relationships of a patient's dentition that are used to create a dental prosthesis (e.g., a crown or a bridge) for the patient. The surface topography data can be stored and/or transmitted and/or output, such as to a manufacturing device that can be used to, for example, make a physical model of the patient's dentition for use by a dental technician to create a dental prosthesis for the patient.
In one aspect, a system for determining surface topography of a three-dimensional structure is provided. The system can comprise an illumination unit, an optical assembly, a detector, and a processor. The illumination unit is configured to output a two-dimensional array of light beams, each light beam comprising a plurality of wavelengths. The optical assembly can be operatively coupled to the illumination unit and configured to focus the plurality of wavelengths of each light beam to a plurality of focal lengths relative to the optical assembly so as to simultaneously illuminate the structure over a two-dimensional field of view. The detector can be configured to measure a characteristic of light reflected from the structure for each of a plurality of locations distributed in two dimensions over the field of view. The processor can be coupled with the detector and configured to generate data representative of the surface topography of the structure based on the measured characteristics of the light reflected from the structure. In many embodiments, the characteristic comprises an intensity.
Any suitable plurality of wavelengths can be used. In many embodiments, the two-dimensional array of light beams comprises broad-band light beams. The plurality of wavelengths can include wavelengths from 400 nm to 800 nm. The plurality of wavelengths can comprise at least three spectral bands, and the at least three spectral bands may comprise overlapping wavelengths of light. The plurality of wavelengths may comprise a continuous spectrum of wavelengths.
The two-dimensional array of light beams may form a two-dimensional array of spots on the structure over the field of view. A ratio of pitch to spot size for the two-dimensional array of spots can be configured to inhibit cross-talk between the two-dimensional array of spots.
In many embodiments, the optical assembly is configured to focus the light beams of the two-dimensional array to the plurality of focal lengths using at least one optical component with longitudinal chromatic aberration. The plurality of focal lengths may provide for a sufficient range of measurement depth without any axial scanning of the distance between the optical assembly and the focal lengths. For example, the plurality of focal lengths can cover a depth of at least 20 mm. In many embodiments, the plurality of focal lengths covers a depth of about 30 mm. In many embodiments, the plurality of focal lengths can be fixed relative to the optical assembly.
In many embodiments, the detector includes a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the structure over the field of view. Each sensor element can be configured to measure the intensity of at least one wavelength of the light reflected from the structure. For example, the sensor elements can include a plurality of red sensor elements, a plurality of green sensor elements, and a plurality of blue sensor elements. Each of the red sensor elements is configured to measure the intensity of a red light wavelength. Each of the green sensor elements is configured to measure the intensity of a green light wavelength. And each of the blue sensor elements is configured to measure the intensity of a blue light wavelength. In many embodiments, the sensor elements can be arranged in a Bayer pattern. Alternatively, the sensor elements can be arranged in a modified Bayer pattern, or any other suitable pattern. Furthermore, in some instances, the sensor elements can be arranged in a plurality of layers.
In many embodiments, the optical assembly is configured to focus the plurality of wavelengths to the plurality of focal lengths without using an axial scanning mechanism. The optical assembly can be configured to focus the plurality of wavelengths to the plurality of focal lengths relative to the optical assembly without relative movement of components of the optical assembly and components of the illumination unit. The optical assembly can focus the plurality of wavelengths to the plurality of focal lengths to a depth within a range from 10 mm to 30 mm.
In another aspect, a method for determining surface topography of a three-dimensional structure is provided. The method can include generating a two-dimensional array of light beams each comprising a plurality of wavelengths. The plurality of wavelengths of each light beam can be focused to a plurality of focal lengths relative to the structure so as to simultaneously illuminate the structure over a two-dimensional field of view. A characteristic of the light reflected from the structure can be measured for each of a plurality of locations distributed in two dimensions over the field of view. Data representative of the surface topography of the structure can be generated based on the measured characteristics of the light reflected from the structure. In many embodiments, the measured characteristic comprises an intensity.
Any suitable plurality of wavelengths can be used. In many embodiments, the two-dimensional array of light beams comprises broad-band light beams. The plurality of wavelengths can include wavelengths from 400 nm to 800 nm. The plurality of wavelengths may comprise at least three spectral bands, and the at least three spectral bands may comprise overlapping wavelengths of light. The plurality of wavelengths may comprise a continuous spectrum of wavelengths.
The two-dimensional array of light beams may form a two-dimensional array of spots on the structure over the field of view. A ratio of pitch to spot size for the two-dimensional array of spots can be configured to inhibit cross-talk between the two-dimensional array of spots.
In many embodiments, the optical assembly is configured to focus the light beams of the two-dimensional array to the plurality of focal lengths using at least one optical component with longitudinal chromatic aberration. The plurality of focal lengths may provide for a sufficient range of measurement depth without any axial scanning of the distance between the optical assembly and the focal lengths. For example, the plurality of focal lengths can cover a depth of at least 20 mm. In many embodiments, the plurality of focal lengths covers a depth of about 30 mm. In many embodiments, the plurality of focal lengths can be fixed relative to the optical assembly.
In many embodiments, the detector includes a plurality of sensor elements distributed over a surface area configured to receive the light reflected from the structure over the field of view. Each sensor element can be configured to measure the intensity of at least one wavelength of the light reflected from the structure. For example, the sensor elements can include a plurality of red sensor elements, a plurality of green sensor elements, and a plurality of blue sensor elements. Each of the red sensor elements is configured to measure the intensity of a red light wavelength. Each of the green sensor elements is configured to measure the intensity of a green light wavelength. And each of the blue sensor elements is configured to measure the intensity of a blue light wavelength. In many embodiments, the sensor elements can be arranged in a Bayer pattern. Alternatively, the sensor elements can be arranged in a modified Bayer pattern, or any other suitable pattern. Furthermore, in some instances, the sensor elements can be arranged in a plurality of layers.
In many embodiments, the focusing of the plurality of wavelengths to the plurality of focal lengths is performed without using an axial scanning mechanism. The focusing of the plurality of wavelengths to the plurality of focal lengths can be formed without relative movement of components of an optical assembly and components of an illumination unit. The optical assembly can focus the plurality of wavelengths to the plurality of focal lengths to a depth within a range from 10 mm to 30 mm.
Turning now to the drawings, in which like numbers designate like elements in the various figures,
The optical device 22 includes, in the illustrated embodiment, a light source 28 emitting light, as represented by arrow 30. In many embodiments, the light source is configured to emit light having a plurality of wavelengths, such as broad-band light. For example, the light source can be a broad-band light source, such as a white light source. The light passes through a polarizer 32, which causes the light passing through the polarizer 32 to have a certain polarization. The light then enters into an optic expander 34, which increases the diameter of the light beam 30. The light beam 30 then passes through a module 38, which can, for example, be a grating or a micro lens array that splits the parent beam 30 into a plurality of light beams 36, represented here, for ease of illustration, by a single line.
The optical device 22 further includes a partially transparent mirror 40 having a small central aperture. The mirror 40 allows transfer of light from the light source 28 through the downstream optics, but reflects light travelling in the opposite direction. It should be noted that in principle, rather than a partially transparent mirror, other optical components with a similar function may be used (e.g., a beam splitter). The aperture in the mirror 40 improves the measurement accuracy of the apparatus. As a result of this mirror structure, the light beams produce a light annulus with respect to a particular wavelength on the illuminated area of the imaged object as long as the area is not in focus relative to the particular wavelength. The annulus becomes a sharply-focused illuminated spot with respect to the particular wavelength when the particular wavelength is in focus relative to the imaged object. Accordingly, a difference between the measured intensity of the particular wavelength when out-of-focus and in-focus is larger. Another advantage of a mirror of this kind, as opposed to a beam splitter, is that internal reflections that occur in a beam splitter are avoided, and hence the signal-to-noise ratio is greater.
The optical device 22 further includes confocal optics 42, typically operating in a telecentric mode, relay optics 44, and an endoscopic probe member 46. In many embodiments, the confocal optics 42 is configured to avoid distance-introduced magnification changes and maintain the same magnification of the image over a wide range of distances in the Z direction (the Z direction being the direction of beam propagation). The confocal optics 42 optics can include an optical assembly configured to focus the light to a plurality of focal lengths along the Z direction, as described in further detail below. In many embodiments, the relay optics 44 is configured to maintain a certain numerical aperture of the light beam's propagation.
The endoscopic probe member 46 can include a light-transmitting medium, which can be a hollow object defining within it a light transmission path or an object made of a light transmitting material (e.g., a glass body or tube). The light-transmitting medium may be rigid or flexible (e.g., fiber optics). In many embodiments, the endoscopic probe member 46 includes a mirror of the kind ensuring total internal reflection and directing the incident light beams towards the patient's teeth 26. The endoscope 46 thus emits a plurality of incident light beams 48 impinging on to the surface of the patient's teeth 26.
The incident light beams 48 form an array of light beams arranged in an X-Y plane, relative to a Cartesian reference frame 50, and propagating along the Z-axis. In many embodiments, each of the incident light beams 48 includes a plurality of wavelengths focused to a plurality of focal lengths relative to the endoscopic probe member 46. When the incident light beams 48 are incident upon an uneven surface, resulting illuminated spots 52 are displaced from one another along the Z-axis, at different (Xi, Yi) locations. Thus, while a particular wavelength of an illuminated spot 52 at a one location may be in focus, the same wavelength of illuminated spots 52 at other locations may be out of focus. Additionally, while one wavelength of an illuminated spot 52 may be in focus, other wavelengths of the same illuminated spot 52 may be out of focus. Therefore, returned wavelengths corresponding to focused incident wavelengths will have the highest light intensities, while returned wavelengths corresponding to out-of-focus incident wavelengths will have lower light intensities. Thus, for each illuminated spot, measurement of light intensity can be made for each of a plurality of different wavelengths spanning different fixed focal lengths. The relative Z distance between the endoscope 46 and the respective illuminated spot 52 can be determined by identifying the focal length corresponding to the returned wavelength having the peak measured light intensity.
The light reflected from each of the illuminated spots 52 includes a beam travelling initially in the Z axis in the opposite direction of the optical path traveled by the incident light beams. Each returned light beam 54 corresponds to one of the incident light beams 36. Given the asymmetrical properties of mirror 40, the returned light beams 54 are reflected in the direction of a detection assembly 60. The detection assembly 60 includes a polarizer 62 that has a plane of preferred polarization oriented normal to the polarization plane of polarizer 32. The returned polarized light beam 54 pass through imaging optics 64, typically a lens or a plurality of lenses, and then through an array of pinholes 66. Each returned light beam 54 passes at least partially through a respective pinhole of the array of pinholes 66. A sensor array 68 (e.g., a charge-coupled device (CCD) sensor array) includes a matrix of sensing elements. In many embodiments, each sensing element represents a pixel of the image and each sensing element corresponds to one pinhole in the array 66. The sensor array 68 can be configured to detect the intensities of each of a plurality of wavelengths of the returned light beams 54, as described in further detail below.
The sensor array 68 is connected to an image-capturing module 80 of the processor unit 24. The light intensity measured by each of the sensing elements of the sensor array 68 is analyzed, in a manner described below, by the processor 24. Although the optical device 22 is depicted in
The optical device 22 includes a control module 70 that controls operation of the light source 28. The control module 70 synchronizes the operation of the image-capturing module 80 with the operation of the light source 28 during acquisition of data representative of the light intensity from each of the sensing elements.
The intensity data is processed by the processor 24 per processing software 82 to determine relative intensity in each pixel over the entire range of wavelengths of light (e.g., using a suitable color analysis algorithm). As explained above, when a wavelength of a light spot is in focus on the three-dimensional structure being measured, the measured intensity of the wavelength of the corresponding returning light beam will be maximal. Thus, by determining the wavelength corresponding to the maximal light intensity, for each pixel, the relative in-focus focal length along the Z-axis can be determined for each light beam. Thus, data representative of the three-dimensional topography of the external surfaces of the teeth is obtained. A resulting three-dimensional representation can be displayed on a display 84 and manipulated for viewing (e.g., viewing from different angles, zooming in or out) by a user control module 85 (e.g., utilizing a computer keyboard, mouse, joystick, or touchscreen). In addition, the data representative of the surface topography can be transmitted through an appropriate data port such as, for example, a modem 88 or any suitable communication network (e.g., a telephone network) to a recipient (e.g., to an off-site CAD/CAM apparatus).
By capturing, in this manner, relative distance data between the probe and the structure being measured from two or more angular locations around the structure (e.g., in the case of a teeth segment, from the buccal direction, lingual direction and/or optionally from above the teeth), an accurate three-dimensional representation of the structure can be generated. The three-dimensional data and/or the resulting three-dimensional representation can be used to create a virtual model of the three-dimensional structure in a computerized environment and/or a physical model fabricated in any suitable fashion (e.g., via a computer controlled milling machine, a rapid prototyping apparatus such as a stereolithography apparatus).
As already pointed out above, a particular and preferred application is imaging of a segment of teeth having at least one missing tooth or a portion of a tooth. The resulting three-dimensional surface topography data can, for example, be used for the design and subsequent manufacture of a crown or any other prosthesis to be fitted into this segment.
Referring now to
The optical probe 200 can be used in conjunction with any suitable device producing a plurality of wavelengths of light, such the embodiments described herein. For example, the light source 28 of the optical device 22 can be used to generate light that includes a plurality of wavelengths, including the wavelengths 206, 208, and 210. The light may be passed through a grating or microlens array 38 or other suitable optics in order to provide a two-dimensional array of light beams. The two-dimensional array of light beams can be projected onto the structure 202 so as to form a two-dimensional array of light spots, as described below.
The plurality of wavelengths for each light beam may include a plurality of discrete wavelengths, a continuous spectrum of wavelengths, or suitable combinations thereof. In many embodiments, the plurality of wavelengths may include wavelengths from 400 nm to 800 nm. The wavelengths may include at a plurality of spectral bands, such as at least three spectral bands. The spectral bands may include overlapping wavelengths of light. Alternatively or in combination, the spectral bands may include wavelengths of light that do not overlap with each other. For example, the wavelengths can include a red light wavelength (e.g., a wavelength between about 640 nm and about 660 nm), a green light wavelength (e.g., a wavelength between about 500 nm and about 520 nm), and a blue light wavelength (e.g., a wavelength between about 465 nm and about 485 nm). In many embodiments, the plurality of wavelengths may include a spectrum of wavelengths having a continuous distribution, such as a wavelength distribution spanning at least a portion of the visible spectrum. The plurality of wavelengths of light can be focused relative to the optical probe 200 to a plurality of focal lengths covering a suitable depth or range of depths, such as a depth of at least approximately 5 mm, 10 mm, 20 mm, 30 mm, 40 mm, 50 mm, or more. The depth can be within a range between any two of the following: 5 mm, 10 mm, 20 mm, 30 mm, 40 mm, or 50 mm. In many embodiments, the wavelengths are focused along a continuous range of fixed focal lengths, such that the focal lengths differ by an infinitesimal amount. The wavelengths can be focused to the corresponding focal lengths without requiring the movement of any optical components, as described in greater detail below.
In many embodiments, the light source 304 produces the plurality of light beams 302. The plurality of light beams can be produced by a micro lens array, grating, or other device capable of producing a two-dimensional array. The light source 304 can be a polychromatic or broad-band light source, such that each of the plurality of light beams includes a plurality of different wavelengths, such as a continuous distribution of wavelengths over the visible wavelength spectrum. For example, the light source 304 can include a white light source. Alternatively or in combination, the light source 304 can include a plurality of different monochromatic light sources, such as a red light source, a green light source, and a blue light source.
The imaging optics 306 can include an optical assembly configured to focus each of the light beams 302 to a plurality of focal lengths relative to the optical system 300 or a component of the optical system 300 (e.g., a hand held probe such as the probing member 90). For example, in the embodiment depicted in
In many embodiments, the optical system 300 can be used to illuminate the structure 308 with the two-dimensional array of light beams so as to form a two-dimensional array of light spots on the structure over a two-dimensional field of view, each light spot having a plurality of wavelengths focused to a corresponding plurality of focal lengths. The geometry and arrangement of the two-dimensional array of spots (e.g., spot size or diameter, pitch or distance between neighboring spots, spot density, etc.) can be configured to reduce noise and increase measurement accuracy of the optical system 300. For example, the ratio of pitch to spot size for the two-dimensional spot array can be selected to minimize or inhibit cross-talk between the spots of the two-dimensional array The use of a two-dimensional array of light spots can provide coverage of the structure 308 over an area lateral to the direction of propagation of the wavelengths, while the focusing of the plurality of wavelengths to a plurality of focal lengths can provide coverage over a distance along the direction of propagation of the wavelengths. Consequently, the three-dimensional surface topography data of the structure can be determined independently of any axial scanning mechanisms or lateral scanning mechanisms used to scan the wavelengths along axial or lateral directions, respectively. For example, the wavelengths can be focused to the appropriate focal depths without movement of any components of the imaging optics 306 relative to any components of the light source 304. Therefore, the imaging optics 306 can be entirely static, without any movable components.
The sensor array 500 can include any suitable number of the sensor elements 502. For example, the number of red sensor elements, green sensor elements, and blue sensor elements present in the sensor array 500 can be equal. Conversely, one or more types of sensor elements can be more numerous than one or more other types of sensor elements. The different types of sensor elements can be arranged in any suitable pattern, such as a Bayer pattern or modified Bayer pattern. Other sensor array patterns suitable for use with the sensor arrays described herein include RGBE patterns, CYYM patterns, CYGM patterns, RGBW Bayer patterns, RGBW #1 patterns, RGBW #2 patterns, RGBW #3 patterns, and so on. A minimal image element of the sensor array 500 can include any suitable number of sensor elements. For example, as depicted in
The sensor elements 512 can include a plurality of different types of sensor elements, each configured to measure the intensities of a different wavelength of light as previously described. In many embodiments, each of the layers 514, 516, 518 includes a single type of sensor element. For example, the first layer 514 can include only blue sensor elements, the second layer 516 can include only green sensor elements, and the third layer 518 can include only red sensor elements. Alternatively, some of the layers can include sensor elements of more than one type. The positioning of a sensor element type within the different layers can be based on the penetration depth of the corresponding measured wavelength. In many embodiments, sensor elements corresponding to wavelengths with greater penetration depths are situated farther from the incident light, and sensor elements corresponding to wavelengths with smaller penetration depths are situated closer to the incident light. In many embodiments, a minimal image element of the sensor array 510 includes a single sensor from each layer, the sensors being positioned vertically adjacent to each other. Accordingly, the size (e.g., horizontal surface area) of a minimal image element of the sensor array 510 can be the same as the size (e.g., horizontal surface area) of a single sensor element.
In step 610, a two-dimensional array of light beams is generated. The array can be generated using a suitable illumination unit and optics (e.g., microlens array), as previously described herein. Each light beam can include a plurality of wavelengths. The plurality of wavelengths can be discrete wavelengths or a continuous spectrum of wavelengths.
In step 620, the plurality of wavelengths of each light beam is focused to a plurality of focal lengths relative to the structure so as to illuminate the structure over a two-dimensional field of view. The two-dimensional array of light beams may be projected onto the structure so as to form a two-dimensional array of light spots. The plurality of wavelengths of each light beam can be focused using a suitable optical assembly or other imaging optics, as described elsewhere herein. The plurality of focal lengths may be a plurality of discrete focal lengths or a continuous spectrum of focal lengths. In many embodiments, the focusing is performed without using movable optical components, thus obviating the need for axial scanning mechanisms or movement of focusing optics relative to an illumination source, as previously described herein. Furthermore, the structure can be illuminated with area illumination or an array of light beams, such that no movable optical components are needed to scan the wavelengths axially or laterally.
In step 630, a characteristic of the light reflected from the structure is measured for each of a plurality of locations distributed in two dimensions over the field of view. The reflected light may include a plurality of wavelengths corresponding to the wavelengths of the incident light. In many embodiments, the characteristic is intensity, although other characteristics can also be used, as described elsewhere herein. A suitable sensor array or color detector can be used to measure the intensities, as previously described herein. In many embodiments, the sensor is a two-dimensional or area sensor. For example, the sensor can be a Bayer patterned color detector, a multilayered color detector (e.g., a FOVEON X3® sensor), or any other color detector having a suitable sensor array pattern, as previously described herein.
In step 640, data representative of the surface topography of the three-dimensional structure is generated, based on the measured characteristics of the light reflected from the structure. For example, in many embodiments, the returning wavelength having the highest measured intensity corresponds to an incident wavelength focused on the surface of the structure. Accordingly, the fixed focal length of the incident wavelength can be used to determine the relative height of the point on the structure. By determining the intensities of light returning from a plurality of locations on the structure, the overall three-dimensional surface topography can be reconstructed.
Although the above steps show method 600 of determining surface topography in accordance with many embodiments, a person of ordinary skill in the art will recognize many variations based on the teaching described herein. Some of the steps may comprise sub-steps. Many of the steps may be repeated as often as appropriate. One or more steps of the method 600 may be performed with any suitable system, such as the embodiments described herein. Some of the steps may be optional. For example, step 620 may be optional, such that the light may not be focused prior to illuminating the structure, as previously described with respect to the embodiments providing front-end homogeneous illumination.
While preferred embodiments of the present invention have been shown and described herein, it will be obvious to those skilled in the art that such embodiments are provided by way of example only. Numerous variations, changes, and substitutions will now occur to those skilled in the art without departing from the invention. It should be understood that various alternatives to the embodiments of the invention described herein may be employed in practicing the invention. It is intended that the following claims define the scope of the invention and that methods and structures within the scope of these claims and their equivalents be covered thereby.
This application is a continuation application of U.S. application Ser. No. 14/980,337, filed Dec. 28, 2015, now U.S. Pat. No. 9,752,867, issued Sep. 5, 2017, which is a is a continuation application of U.S. application Ser. No. 14/323,225, filed Jul. 3, 2014, now U.S. Pat. No. 9,261,358, issued Feb. 16, 2016, each of which is incorporated herein by reference in their entirety.
Number | Name | Date | Kind |
---|---|---|---|
2467432 | Kesling | Apr 1949 | A |
3407500 | Kesling | Oct 1968 | A |
3600808 | Reeve | Aug 1971 | A |
3660900 | Andrews | May 1972 | A |
3676671 | Sheldon | Jul 1972 | A |
3683502 | Wallshein | Aug 1972 | A |
3738005 | Cohen et al. | Jun 1973 | A |
3860803 | Levine | Jan 1975 | A |
3916526 | Schudy | Nov 1975 | A |
3922786 | Lavin | Dec 1975 | A |
3950851 | Bergersen | Apr 1976 | A |
3983628 | Acevedo | Oct 1976 | A |
4014096 | Dellinger | Mar 1977 | A |
4195046 | Kesling | Mar 1980 | A |
4253828 | Coles et al. | Mar 1981 | A |
4324546 | Heitlinger et al. | Apr 1982 | A |
4324547 | Arcan et al. | Apr 1982 | A |
4348178 | Kurz | Sep 1982 | A |
4368955 | Masson | Jan 1983 | A |
4478580 | Barrut | Oct 1984 | A |
4500294 | Lewis | Feb 1985 | A |
4504225 | Yoshii | Mar 1985 | A |
4505673 | Yoshii | Mar 1985 | A |
4526540 | Dellinger | Jul 1985 | A |
4575330 | Hull | Mar 1986 | A |
4575805 | Moermann | Mar 1986 | A |
4588265 | Takahashi | May 1986 | A |
4591341 | Andrews | May 1986 | A |
4609349 | Cain | Sep 1986 | A |
4611288 | Duret et al. | Sep 1986 | A |
4656860 | Orthuber et al. | Apr 1987 | A |
4663720 | Duret | May 1987 | A |
4664626 | Kesling | May 1987 | A |
4676747 | Kesling | Jun 1987 | A |
4742464 | Duret | May 1988 | A |
4755139 | Abbatte et al. | Jul 1988 | A |
4763791 | Halverson et al. | Aug 1988 | A |
4783593 | Noble | Nov 1988 | A |
4793803 | Martz | Dec 1988 | A |
4798534 | Breads | Jan 1989 | A |
4836778 | Baumrind et al. | Jun 1989 | A |
4837732 | Brandestini et al. | Jun 1989 | A |
4850864 | Diamond | Jul 1989 | A |
4850865 | Napolitano | Jul 1989 | A |
4856991 | Breads et al. | Aug 1989 | A |
4877398 | Kesling | Oct 1989 | A |
4880380 | Martz | Nov 1989 | A |
4889238 | Batchelor | Dec 1989 | A |
4890608 | Steer | Jan 1990 | A |
4935635 | O'Harra | Jun 1990 | A |
4936862 | Walker et al. | Jun 1990 | A |
4937928 | Van Der Zel | Jul 1990 | A |
4941826 | Loran et al. | Jul 1990 | A |
4964770 | Steinbichler | Oct 1990 | A |
4975052 | Spencer et al. | Dec 1990 | A |
4983334 | Adell | Jan 1991 | A |
5011405 | Lemchen | Apr 1991 | A |
5017133 | Miura | May 1991 | A |
5027281 | Rekow et al. | Jun 1991 | A |
5035613 | Breads et al. | Jul 1991 | A |
5055039 | Abbatte et al. | Oct 1991 | A |
5059118 | Breads et al. | Oct 1991 | A |
5100316 | Wildman | Mar 1992 | A |
5121333 | Riley et al. | Jun 1992 | A |
5125832 | Kesling | Jun 1992 | A |
5128870 | Erdman et al. | Jul 1992 | A |
5130064 | Smalley et al. | Jul 1992 | A |
5131843 | Hilgers et al. | Jul 1992 | A |
5131844 | Marinaccio et al. | Jul 1992 | A |
5132143 | Deckard | Jul 1992 | A |
5139419 | Andreiko et al. | Aug 1992 | A |
5145364 | Martz et al. | Sep 1992 | A |
5176517 | Truax | Jan 1993 | A |
5184306 | Erdman et al. | Feb 1993 | A |
5186623 | Breads et al. | Feb 1993 | A |
5239178 | Derndinger | Aug 1993 | A |
5257203 | Riley et al. | Oct 1993 | A |
5273429 | Rekow et al. | Dec 1993 | A |
5278756 | Lemchen et al. | Jan 1994 | A |
5328362 | Watson et al. | Jul 1994 | A |
5338198 | Wu et al. | Aug 1994 | A |
5340309 | Robertson | Aug 1994 | A |
5342202 | Deshayes | Aug 1994 | A |
5368478 | Andreiko et al. | Nov 1994 | A |
5372502 | Massen et al. | Dec 1994 | A |
5378154 | Van Der Zel | Jan 1995 | A |
5382164 | Stern | Jan 1995 | A |
5395238 | Andreiko et al. | Mar 1995 | A |
5431562 | Andreiko et al. | Jul 1995 | A |
5440326 | Quinn | Aug 1995 | A |
5440496 | Andersson et al. | Aug 1995 | A |
5447432 | Andreiko et al. | Sep 1995 | A |
5452219 | Dehoff et al. | Sep 1995 | A |
5454717 | Andreiko et al. | Oct 1995 | A |
5456600 | Andreiko et al. | Oct 1995 | A |
5474448 | Andreiko et al. | Dec 1995 | A |
RE35169 | Lemchen et al. | Mar 1996 | E |
5503152 | Oakley | Apr 1996 | A |
5518397 | Andreiko et al. | May 1996 | A |
5528735 | Strasnick et al. | Jun 1996 | A |
5533895 | Andreiko et al. | Jul 1996 | A |
5542842 | Andreiko et al. | Aug 1996 | A |
5549476 | Stern | Aug 1996 | A |
5562448 | Mushabac | Oct 1996 | A |
5587912 | Andersson | Dec 1996 | A |
5605459 | Kuroda et al. | Feb 1997 | A |
5607305 | Andersson et al. | Mar 1997 | A |
5614075 | Andre, Sr. | Mar 1997 | A |
5621648 | Crump | Apr 1997 | A |
5645420 | Bergersen | Jul 1997 | A |
5645421 | Slootsky | Jul 1997 | A |
5655653 | Chester | Aug 1997 | A |
5659420 | Wakai | Aug 1997 | A |
5668665 | Choate | Sep 1997 | A |
5683243 | Andreiko et al. | Nov 1997 | A |
5692894 | Schwartz et al. | Dec 1997 | A |
5725376 | Poirier | Mar 1998 | A |
5725378 | Wang | Mar 1998 | A |
5733126 | Andersson et al. | Mar 1998 | A |
5737084 | Ishihara | Apr 1998 | A |
5740267 | Echerer et al. | Apr 1998 | A |
5742700 | Yoon et al. | Apr 1998 | A |
5790242 | Stern et al. | Aug 1998 | A |
5799100 | Clarke et al. | Aug 1998 | A |
5800174 | Andersson | Sep 1998 | A |
5823778 | Schmitt et al. | Oct 1998 | A |
5848115 | Little et al. | Dec 1998 | A |
5857853 | Van Nifterick et al. | Jan 1999 | A |
5866058 | Batchelder et al. | Feb 1999 | A |
5879158 | Doyle et al. | Mar 1999 | A |
5880961 | Crump | Mar 1999 | A |
5880962 | Andersson et al. | Mar 1999 | A |
5934288 | Avila et al. | Aug 1999 | A |
5957686 | Anthony | Sep 1999 | A |
5964587 | Sato | Oct 1999 | A |
5971754 | Sondhi et al. | Oct 1999 | A |
5975893 | Chishti et al. | Nov 1999 | A |
6015289 | Andreiko et al. | Jan 2000 | A |
6044309 | Honda | Mar 2000 | A |
6049743 | Baba | Apr 2000 | A |
6062861 | Andersson | May 2000 | A |
6068482 | Snow | May 2000 | A |
6099314 | Kopelman et al. | Aug 2000 | A |
6123544 | Cleary | Sep 2000 | A |
6152731 | Jordan et al. | Nov 2000 | A |
6183248 | Chishti et al. | Feb 2001 | B1 |
6190165 | Andreiko et al. | Feb 2001 | B1 |
6217325 | Chishti et al. | Apr 2001 | B1 |
6217334 | Hultgren | Apr 2001 | B1 |
6236521 | Nanba | May 2001 | B1 |
6244861 | Andreiko et al. | Jun 2001 | B1 |
6263234 | Engelhardt | Jul 2001 | B1 |
6309215 | Phan et al. | Oct 2001 | B1 |
6315553 | Sachdeva et al. | Nov 2001 | B1 |
6322359 | Jordan et al. | Nov 2001 | B1 |
6350120 | Sachdeva et al. | Feb 2002 | B1 |
6382975 | Poirier | May 2002 | B1 |
6398548 | Muhammad et al. | Jun 2002 | B1 |
6399942 | Ishihara | Jun 2002 | B1 |
6402707 | Ernst | Jun 2002 | B1 |
6482298 | Bhatnagar | Nov 2002 | B1 |
6524101 | Phan et al. | Feb 2003 | B1 |
6554611 | Chishti et al. | Apr 2003 | B2 |
6572372 | Phan et al. | Jun 2003 | B1 |
6573998 | Cohen-Sabban | Jun 2003 | B2 |
6594539 | Geng | Jul 2003 | B1 |
6629840 | Chishti et al. | Oct 2003 | B2 |
6697164 | Babayoff et al. | Feb 2004 | B1 |
6705863 | Phan et al. | Mar 2004 | B2 |
6722880 | Chishti et al. | Apr 2004 | B2 |
6940611 | Babayoff et al. | Sep 2005 | B2 |
7092107 | Babayoff et al. | Aug 2006 | B2 |
7230725 | Babayoff et al. | Jun 2007 | B2 |
7319529 | Babayoff | Jan 2008 | B2 |
7446885 | Zabolitzky | Nov 2008 | B2 |
7477402 | Babayoff et al. | Jan 2009 | B2 |
7511829 | Babayoff | Mar 2009 | B2 |
7561273 | Stautmeister et al. | Jul 2009 | B2 |
7626705 | Altendorf | Dec 2009 | B2 |
7630089 | Babayoff et al. | Dec 2009 | B2 |
7672527 | Arenberg et al. | Mar 2010 | B2 |
7724378 | Babayoff | May 2010 | B2 |
7791810 | Powell | Sep 2010 | B2 |
7796277 | Babayoff et al. | Sep 2010 | B2 |
7944569 | Babayoff et al. | May 2011 | B2 |
7990548 | Babayoff et al. | Aug 2011 | B2 |
8126025 | Takeda | Feb 2012 | B2 |
8310683 | Babayoff et al. | Nov 2012 | B2 |
8451456 | Babayoff | May 2013 | B2 |
8488113 | Thiel et al. | Jul 2013 | B2 |
8577212 | Thiel | Nov 2013 | B2 |
8638447 | Babayoff et al. | Jan 2014 | B2 |
8638448 | Babayoff et al. | Jan 2014 | B2 |
8675706 | Seurin et al. | Mar 2014 | B2 |
8743923 | Geske et al. | Jun 2014 | B2 |
8767270 | Curry et al. | Jul 2014 | B2 |
9089277 | Babayoff et al. | Jul 2015 | B2 |
9261356 | Lampert | Feb 2016 | B2 |
9261358 | Atiya et al. | Feb 2016 | B2 |
9393087 | Moalem | Jul 2016 | B2 |
9439568 | Atiya et al. | Sep 2016 | B2 |
9675429 | Lampert | Jun 2017 | B2 |
9696264 | Lange | Jul 2017 | B2 |
9752867 | Atiya | Sep 2017 | B2 |
9844427 | Atiya et al. | Dec 2017 | B2 |
9939258 | Lampert | Apr 2018 | B2 |
20020006597 | Andreiko et al. | Jan 2002 | A1 |
20020023903 | Ann Ngoi et al. | Feb 2002 | A1 |
20020030812 | Ortyn et al. | Mar 2002 | A1 |
20030009252 | Pavlovskaia et al. | Jan 2003 | A1 |
20030139834 | Nikolskiy et al. | Jul 2003 | A1 |
20030224311 | Cronauer | Dec 2003 | A1 |
20040128010 | Pavlovskaia et al. | Jul 2004 | A1 |
20050055118 | Nikolskiy et al. | Mar 2005 | A1 |
20050283065 | Babayoff | Dec 2005 | A1 |
20060158665 | Babayoff et al. | Jul 2006 | A1 |
20070109559 | Babayoff et al. | May 2007 | A1 |
20070114362 | Feng et al. | May 2007 | A1 |
20070211605 | Sakamoto | Sep 2007 | A1 |
20090051995 | Shechterman | Feb 2009 | A1 |
20090218514 | Klunder et al. | Sep 2009 | A1 |
20090219612 | Hirata | Sep 2009 | A1 |
20100099984 | Graser et al. | Apr 2010 | A1 |
20110080576 | Thiel et al. | Apr 2011 | A1 |
20120081786 | Mizuyama et al. | Apr 2012 | A1 |
20120147912 | Moench et al. | Jun 2012 | A1 |
20120281293 | Gronenborn et al. | Nov 2012 | A1 |
20130163627 | Seurin et al. | Jun 2013 | A1 |
20130177866 | Babayoff et al. | Jul 2013 | A1 |
20130266326 | Joseph et al. | Oct 2013 | A1 |
20130286174 | Urakabe | Oct 2013 | A1 |
20140022356 | Fisker et al. | Jan 2014 | A1 |
20140104620 | Babayoff et al. | Apr 2014 | A1 |
20140139634 | Lampert et al. | May 2014 | A1 |
20150037750 | Moalem | Feb 2015 | A1 |
20160000535 | Atiya et al. | Jan 2016 | A1 |
20160003610 | Lampert et al. | Jan 2016 | A1 |
20160003613 | Atiya et al. | Jan 2016 | A1 |
20160015489 | Atiya et al. | Jan 2016 | A1 |
20160064898 | Atiya et al. | Mar 2016 | A1 |
20160109226 | Atiya et al. | Apr 2016 | A1 |
20170027670 | Atiya et al. | Feb 2017 | A1 |
20180235738 | Atiya et al. | Aug 2018 | A1 |
Number | Date | Country |
---|---|---|
3031677 | May 1979 | AU |
517102 | Jul 1981 | AU |
5598894 | Jun 1994 | AU |
1121955 | Apr 1982 | CA |
1646894 | Jul 2005 | CN |
2749802 | May 1978 | DE |
69327661 | Jul 2000 | DE |
102005043627 | Mar 2007 | DE |
102012009836 | Nov 2013 | DE |
0091876 | Oct 1983 | EP |
0299490 | Jan 1989 | EP |
0376873 | Jul 1990 | EP |
0490848 | Jun 1992 | EP |
0541500 | May 1993 | EP |
0667753 | Jan 2000 | EP |
0774933 | Dec 2000 | EP |
0731673 | May 2001 | EP |
1970668 | Sep 2008 | EP |
1970743 | Sep 2008 | EP |
2213223 | Aug 2010 | EP |
2439489 | Apr 2012 | EP |
463897 | Jan 1980 | ES |
2369828 | Jun 1978 | FR |
2652256 | Mar 1991 | FR |
1550777 | Aug 1979 | GB |
S5358191 | May 1978 | JP |
H0428359 | Jan 1992 | JP |
H08508174 | Sep 1996 | JP |
WO-9008512 | Aug 1990 | WO |
WO-9104713 | Apr 1991 | WO |
WO-9410935 | May 1994 | WO |
WO-9832394 | Jul 1998 | WO |
WO-9844865 | Oct 1998 | WO |
WO-9858596 | Dec 1998 | WO |
WO-9924786 | May 1999 | WO |
WO-0008415 | Feb 2000 | WO |
WO-02095475 | Nov 2002 | WO |
WO-2007090865 | Aug 2007 | WO |
WO-2012083967 | Jun 2012 | WO |
Entry |
---|
AADR. American Association for Dental Research, Summary of Activities, Mar. 20-23, 1980, Los Angeles, CA, p. 195. |
Alcaniz, et aL, “An Advanced System for the Simulation and Planning of Orthodontic Treatments,” Karl Heinz Hohne and Ron Kikinis (eds.), Visualization in Biomedical Computing, 4th Intl. Conf., VBC '96, Hamburg, Germany, Sep. 22-25, 1996, Springer-Verlag, pp. 511-520. |
Alexander et al., “The DigiGraph Work Station Part 2 Clinical Management,” JCO, pp. 402-407 (Jul. 1990). |
Altschuler, “3D Mapping of Maxillo-Facial Prosthesis,” AADR Abstract #607, 2 pages total, (1980). |
Altschuler et al., “Analysis of 3-D Data for Comparative 3-D Serial Growth Pattern Studies of Oral-Facial Structures,” AADR Abstracts, Program and Abstracts of Papers, 57th General Session, IADR HP Annual Session, Mar. 29, 1979-Apr. 1, 1979, New Orleans Marriot, Journal of Dental Research, vol. 58, Jan. 1979, Special Issue a, p. 221. |
Altschuler et al., “Laser Electro-Optic System for Rapid Three-Dimensional (3D) Topographic Mapping of Surfaces,” Optical Engineering, 20(6):953-961 (1981). |
Altschuler et al., “Measuring Surfaces Space-Coded by a Laser-Projected Dot Matrix,” SPIE Imaging Applications for Automated Industrial Inspection and Assembly, vol. 182, p. 187-191 (1979). |
Andersson et al., “Clinical Results with Titanium Crowns Fabricated with Machine Duplication and Spark Erosion,” Acta. Odontol. Scand., 47:279-286 (1989). |
Andrews, The Six Keys to Optimal Occlusion Straight Wire, Chapter 3, pp. 13-24 (1989). |
Bartels, et al., An Introduction to Splines for Use in Computer Graphics and Geometric Modeling, Morgan Kaufmann Publishers, pp. 422-425 (1987). |
Baumrind, “A System for Craniofacial Mapping Through the Integration of Data from Stereo X-Ray Films and Stereo Photographs,” an invited paper submitted to the 1975 American Society of Photogram Symposium on Close-Range Photogram Systems, University of Ill., Aug. 26-30, 1975, pp. 142-166. |
Baumrind et al., “A Stereophotogrammetric System for the Detection of Prosthesis Loosening in Total Hip Arthroplasty,” NATO Symposium on Applications of Human Biostereometrics, Jul. 9-13, 1978, SPIE, vol. 166, pp. 112-123. |
Baumrind et al., “Mapping the Skull in 3-D,” reprinted from J. Calif. Dent. Assoc., 48(2), 11 pages total, (1972 Fall Issue). |
Baumrind, “Integrated Three-Dimensional Craniofacial Mapping: Background, Principles, and Perspectives,” Semin. in Orthod., 7(4):223-232 (Dec. 2001). |
Begole et al., “A Computer System for the Analysis of Dental Casts,” The Angle Orthod., 51(3):253-259 (Jul. 1981). |
Bernard et al.,“Computerized Diagnosis in Orthodontics for Epidemiological Studies: A Progress Report,” Abstract, J. Dental Res. Special Issue, vol. 67, p. 169, paper presented at International Association for Dental Research 66th General Session, Mar. 9-13, 1988, Montreal, Canada. |
Bhatia et al., “A Computer-Aided Design for Orthognathic Surgery,” Br. J. Oral Maxillofac. Surg., 22:237-253 (1984). |
Biggerstaff, “Computerized Diagnostic Setups and Simulations,” Angle Orthod., 40(1):28-36 (Jan. 1970). |
Biggerstaff et al., “Computerized Analysis of Occlusion in the Postcanine Dentition,” Am. J. Orthod., 61(3): 245-254 (Mar. 1972). |
Biostar Opeation & Training Manual. Great Lakes Orthodontics, Ltd. 199 Fire Tower Drive, Tonawanda, New York. 14150-5890, 20 pages total (1990). |
Blu, et al., “Linear interpolation revitalized”, IEEE Trans. Image Proc., 13(5):710-719 (May 2004. |
Bourke, “Coordinate System Transformation,” (Jun. 1996), p. 1, retrieved from the Internet Nov. 5, 2004, URL< http://astronomy.swin.edu.au/—pbourke/prolection/coords>. |
Boyd et al., “Three Dimensional Diagnosis and Orthodontic Treatment of Complex Malocclusions With the Invisalipn Appliance,” Semin. Orthod., 7(4):274-293 (Dec. 2001). |
Brandestini et al., “Computer Machined Ceramic Inlays: In Vitro Marginal Adaptation,” J. Dent. Res. Special Issue, Abstract 305, vol. 64, p. 208 (1985). |
Brook et al., “An Image Analysis System for the Determination of Tooth Dimensions from Study Casts: Comparison with Manual Measurements of Mesio-distal Diameter,” J. Dent. Res., 65(3):428-431 (Mar. 1986). |
Burstone et al., Precision Adjustment of the Transpalatal Lingual Arch: Computer Arch Form in Predetermination, Am, Journal of Orthodontics, vol. 79, No. 2 (Feb. 1981), pp. 115-133. |
Burstone (interview), “Dr. Charles J. Burstone on the Uses of the Computer in Orthodontic Practice (Part 1),” J. Clin. Orthod., 13(7):442-453 (Jul. 1979). |
Burstone (interview), “Dr. Charles J. Burstone on the Uses of the Computer in Orthodontic Practice (Part 2),” J. Clin. Orthod., 13(8):539-551 (Aug. 1979). |
Cardinal Industrial Finishes, Powder Coatings information posted at<http://www.cardinalpaint.com>on Aug. 25, 2000, 2 pages. |
Carnaghan, “An Alternative to Holograms for the Portrayal of Human Teeth,” 4th Int'l. Conf. on Holographic Systems, Components and Applications, Sep. 15, 1993, pp. 228-231. |
CEREC Omnicam and CEREC Bluecam brochure. The first choice in every case. The Dental Company Sirona. 2014. |
Chaconas et al., “The DigiGraph Work Station, Part 1, Basic Concepts,” JCO, pp. 360-367 (Jun. 1990). |
Chafetz et al., “Subsidence of the Femoral Prosthesis, a Stereophotogrammetric Evaluation,” Clin. Orthop. Relat. Res., No. 201, pp. 60-67 (Dec. 1985). |
Chiappone, (1980). Constructing the Gnathologic Setup and Positioner, J. Clin. Orthod, vol. 14, pp. 121-133. |
Cottingham, (1969). Gnathologic Clear Plastic Positioner, Am. J. Orthod, vol. 55, pp. 23-31. |
Crawford, “CAD/CAM in the Dental Office: Does It Work?”, Canadian Dental Journal, vol. 57, No. 2, pp. 121-123 (Feb. 1991). |
Crawford, “Computers in Dentistry: Part 1 CAD/CAM: The Computer Moves Chairside,” Part 2 F. Duret—A Man with a Vision,“Part 3 the Computer Gives New Vision—Literally,” Part 4 Bytes 'N Bites—The Computer Moves from the Front Desk to the Operatory, Canadian Dental Journal, vol. 54 (9), pp. 661-666 (1988). |
Crooks, “CAD/CAM Comes to USC,” USC Dentistry, pp. 14-17 (Spring 1990). |
Cureton, Correcting Malaligned Mandibular Incisors with Removable Retainers, J. Clin. Orthod, vol. 30, No. 7 (1996) pp. 390-395. |
Curry et al., “Integrated Three-Dimensional Craniofacial Mapping at the Craniofacial Research Instrumentation Laboratory/University of the Pacific,” Semin. Orthod., 7(4):258-265 (Dec. 2001). |
Cutting et al., “Three-Dimensional Computer-Assisted Design of Craniofacial Surgical Procedures: Optimization and Interaction with Cephalometric and CT-Based Models,” Plast. 77(6):877-885 (Jun. 1986). |
DCS Dental AG, “The CAD/CAM ‘DCS Titan System’ for Production of Crowns/Bridges,” DSC Production AG, pp. 1-7 (Jan. 1992. |
Definition for gingiva. Dictionary.com p. 1-3. Retrieved from the internet Nov. 5, 2004< http://reference.com/search/search?q=gingiva>. |
Defranco et al., “Three-Dimensional Large Displacement Analysis of Orthodontic Appliances,” J. Biomechanics, 9:793-801 (1976). |
Dental Institute University of Zurich Switzerland, Program for International Symposium JD on Computer Restorations: State of the Art of the CEREC-Method, May 1991, 2 pages total. |
Dentrac Corporation, Dentrac document, pp. 4-13 (1992). |
Dent-X posted on Sep. 24, 1998 at< http://www.dent-x.com/DentSim.htm>, 6 pages. |
Doyle, “Digital Dentistry,” Computer Graphics World, pp. 50-52, 54 (Oct. 2000). |
Dummer, et al. Computed Radiography Imaging Based on High-Density 670 nm VCSEL Arrays. Proceedings of SPIE vol. 7557, 75570H (2010)http://vixarinc.com/pdf/SPIE_radiography_manuscript_submission1.pdf. |
DuraClear™ product information, Allesee Orthodontic Appliances-Pro Lab, 1 page (1997). |
Duret et al., “CAD/CAM Imaging in Dentistry,” Curr. Opin. Dent., 1:150-154 (1991). |
Duret et al, “CAD-CAM in Dentistry,” J. Am. Dent. Assoc. 117:715-720 (Nov. 1988). |
Duret, “The Dental CAD/CAM, General Description of the Project,” Hennson International Product Brochure, 18 pages total, Jan. 1986. |
Duret,“Vers Une Prosthese Informatisee,” (English translation attached), Tonus, vol. 75, pp. 55-57 (Nov. 15, 1985). |
Economides, “The Microcomputer in the Orthodontic Office,” JCO, pp. 767-772 (Nov. 1979). |
Elsasser, Some Observations on the History and Uses of the Kesling Positioner, Am. J. Orthod. (1950) 36:368-374. |
English translation of Japanese Laid-Open Publication No. 63-11148 to inventor T. Ozukuri (Laid-Open on Jan. 18, 1998) pp. 1-7. |
Felton et al., “A Computerized Analysis of the Shape and Stability of Mandibular Arch Form,” Am. J. Orthod. Dentofacial Orthop., 92(6):478-483 (Dec. 1987). |
Friede et al., “Accuracy of Cephalometric Prediction in Orthognathic Surgery,” Abstract of Papers, J. Dent. Res., 70:754-760 (1987). |
Futterling et a/., “Automated Finite Element Modeling of a Human Mandible with Dental Implants,” JS WSCG '98—Conference Program, retrieved from the Internet<http://wscg.zcu.cz/wscg98/papers98/Strasser 98.pdf>, 8 pages. |
Gao et al., “3-D element Generation for Multi-Connected Complex Dental and Mandibular Structure,” Proc. Intl Workshop on Medical Imaging and Augmented Reality, pp. 267-271 (Jun. 12, 2001). |
Gim-Alldent Deutschland, “Das DUX System: Die Technik,” 2 pages total (2002). |
Gottleib et al., “JCO Interviews Dr. James A. McNamura, Jr., on the Frankel Appliance: Part 2: Clinical 1-1 Management,” J. Clin. Orthod., 16(6):390-407 (Jun. 1982). |
Grayson, “New Methods for Three Dimensional Analysis of Craniofacial Deformity, Symposium: JW Computerized Facial Imaging in Oral and Maxiiofacial Surgery,” AAOMS, 3 pages total, (Sep. 13, 1990). |
Guess et al., “Computer Treatment Estimates in Orthodontics and Orthognathic Surgery,” JCO, pp. 262-28 (Apr. 1989). |
Heaven et a/., “Computer-Based Image Analysis of Artificial Root Surface Caries,” Abstracts of Papers, J. Dent. Res., 70:528 (Apr. 17-21, 1991). |
Highbeam Research, “Simulating Stress Put on Jaw,” Tooling & Production [online], Nov. 1996, n pp. 1-2, retrieved from the Internet on Nov. 5, 2004, URL http://static.highbeam.com/t/toolingampproduction/november011996/simulatingstressputonfa . . . >. |
Hikage, “Integrated Orthodontic Management System for Virtual Three-Dimensional Computer Graphic Simulation and Optical Video Image Database for Diagnosis and Treatment Planning”, Journal of Japan KA Orthodontic Society, Feb. 1987, English translation, pp. 1-38, Japanese version, 46(2), pp. 248-269 (60 pages total). |
Hoffmann, et al., “Role of Cephalometry for Planning of Jaw Orthopedics and Jaw Surgery Procedures,” (Article Summary in English, article in German), Informatbnen, pp. 375-396 (Mar. 1991). |
Hojjatie et al., “Three-Dimensional Finite Element Analysis of Glass-Ceramic Dental Crowns,” J. Biomech., 23(11):1157-1166 (1990). |
Huckins, “CAD-CAM Generated Mandibular Model Prototype from MRI Data,” AAOMS, p. 96 (1999). |
Important Tip About Wearing the Red White & Blue Active Clear Retainer System, Allesee Orthodontic Appliances—Pro Lab, 1 page 1998). |
International search report and written opinion dated Oct. 23, 2015 for PCT/IB2015/054911. |
“International search report with written opinion dated Oct. 15, 2015 for PCT/IB2015/054910”. |
Jco Interviews, Craig Andreiko , DDS, MS on the Elan and Orthos Systems, JCO, pp. 459-468 (Aug. 1994). |
JCO Interviews, Dr. Homer W. Phillips on Computers in Orthodontic Practice, Part 2, JCO. 1997; 1983:819-831. |
Jerrold, “The Problem, Electronic Data Transmission and the Law,” AJO-DO, pp. 478-479 (Apr. 1988). |
Jones et al., “An Assessment of the Fit of a Parabolic Curve to Pre- and Post-Treatment Dental Arches,” Br. J. Orthod., 16:85-93 (1989). |
JP Faber et al., “Computerized Interactive Orthodontic Treatment Planning,” Am. J. Orthod., 73(1):36-46 (Jan. 1978). |
Kamada et.al., Case Reports on Tooth Positioners Using LTV Vinyl Silicone Rubber, J. Nihon University School of Dentistry (1984) 26(1): 11-29. |
Kamada et.al., Construction of Tooth Positioners with LTV Vinyl Silicone Rubber and Some Case KJ Reports, J. Nihon University School of Dentistry (1982) 24(1):1-27. |
Kanazawa et al., “Three-Dimensional Measurements of the Occlusal Surfaces of Upper Molars in a Dutch Population,” J. Dent Res., 63(11):1298-1301 (Nov. 1984). |
Kesling, Coordinating the Predetermined Pattern and Tooth Positioner with Conventional Treatment, KN Am. J. Orthod. Oral Surg. (1946) 32:285-293. |
Kesling et al., The Philosophy of the Tooth Positioning Appliance, American Journal of Orthodontics and Oral surgery. 1945; 31:297-304. |
Kleeman et al., The Speed Positioner, J. Clin. Orthod. (1996) 30:673-680. |
Kochanek, “Interpolating Splines with Local Tension, Continuity and Bias Control,” Computer Graphics, ri 18(3):33-41 (Jul. 1984). KM Oral Surgery (1945) 31 :297-30. |
Kunii et al., “Articulation Simulation for an Intelligent Dental Care System,” Displays 15:181-188 (1994). |
Kuroda et al., Three-Dimensional Dental Cast Analyzing System Using Laser Scanning, Am. J. Orthod. Dentofac. Orthop. (1996) 110:365-369. |
Laurendeau, et al., “A Computer-Vision Technique for the Acquisition and Processing of 3-D Profiles of 7 KR Dental Imprints: An Application in Orthodontics,” IEEE Transactions on Medical Imaging, 10(3):453-461 (Sep. 1991. |
Leinfelder, et al., “A New Method for Generating Ceramic Restorations: a CAD-CAM System,” J. Am. 1-1 Dent. Assoc., 118(6):703-707 (Jun. 1989). |
Manetti, et al., “Computer-Aided Cefalometry and New Mechanics in Orthodontics,” (Article Summary in English, article in German), Fortschr Kieferorthop. 44, 370-376 (Nr. 5), 1983. |
Mccann, “Inside the ADA,” J. Amer. Dent. Assoc., 118:286-294 (Mar. 1989). |
Mcnamara et al., “Invisible Retainers,” J. Cfin. Orthod., pp. 570-578 (Aug. 1985). |
McNamara et al., Orthodontic and Orthopedic Treatment in the Mixed Dentition, Needham Press, pp. 347-353 (Jan. 1993). |
Moermann et al., “Computer Machined Adhesive Porcelain Inlays: Margin Adaptation after Fatigue Stress,” IADR Abstract 339, J. Dent. Res., 66(a):763 (1987). |
Moles, “Correcting Mild Malalignments—As Easy As One, Two, Three,” AOA/Pro Corner, vol. 11, No. 1, 2 pages (2002). |
Mormann et al., “Marginale Adaptation von adhasuven Porzellaninlays in vitro,” Separatdruck aus: Schweiz. Mschr. Zahnmed. 95: 1118-1129, 1985. |
Nahoum, “The Vacuum Formed Dental Contour Appliance,” N. Y. State Dent. J., 30(9):385-390 (Nov. 1964). |
Nash, “CEREC CAD/CAM Inlays: Aesthetics and Durability in a Single Appointment,” Dent. Today, 9(8):20, 22-23 (Oct. 1990). |
Nishiyama et al., “A New Construction of Tooth Repositioner by LTV Vinyl Silicone Rubber,” J. Nihon Univ. Sch. Dent., 19(2):93-102 (1977). |
Paul et al., “Digital Documentation of Individual Human Jaw and Tooth Forms for Applications in Orthodontics, Oral Surgery and Forensic Medicine” Proc. of the 24th Annual Conf. Of the IEEE Industrial Electronics Society (IECON '98), Sep. 4, 1998, pp. 2415-2418. |
Pellin Broca Prisms—Specifications. Thor Labs. Updated Nov. 30, 2012. www.thorlabs.com. |
Pinkham, “Foolish Concept Propels Technology,” Dentist, 3 pages total, Jan./Feb. 1989. |
Pinkham, “Inventors CAD/CAM May Transform Dentistry,” Dentist, 3 pages total, Sep. 1990. |
Ponitz, “Invisible Retainers,” Am. J. Orthod., 59(3):266-272 (Mar. 1971). |
PROCERA Research Projects, “PROCERA Research Projects 1993—Abstract Collection,” pp. 3-7; 28 (1993). |
Proffit et al., Contemporary Orthodontics, (Second Ed.), Chapter 15, Mosby Inc., pp. 470-533 (Oct. 1993. |
Raintree Essix & ARS Materials, Inc., Raintree Essix, Technical Magazine Table of contents and Essix Appliances,< http:// www.essix.com/magazine/defaulthtml> Aug. 13, 1997. |
Redmond et al., “Clinical Implications of Digital Orthodontics,” Am. J. Orthod. Dentofacial Orthop., 117(2):240-242 (2000). |
Rekow, “A Review of the Developments in Dental CAD/CAM Systems,” (contains references to Japanese efforts and content of the papers of particular interest to the clinician are indicated with a one line summary of their content in the bibliography), Curr. Opin. Dent., 2:25-33 (Jun. 1992). |
Rekow, “CAD/CAM in Dentistry: A Historical Perspective and View of the Future,” J. Can. Dent. Assoc., 58(4):283, 287-288 (Apr. 1992). |
Rekow, “Computer-Aided Design and Manufacturing in Dentistry: A Review of the State of the Art,” J. Prosthet. Dent., 58(4):512-516 (Oct. 1987). |
Rekow, “Dental CAD-CAM Systems: What is the State of the Art?”, J. Amer. Dent. Assoc., 122:43-48 1991. |
Rekow et al., “CAD/CAM for Dental Restorations—Some of the Curious Challenges,” IEEE Trans. Biomed. Eng., 38(4):314-318 (Apr. 1991). |
Rekow et al., “Comparison of Three Data Acquisition Techniques for 3-D Tooth Surface Mapping,” Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 13(1):344-345 1991. |
Rekow, “Feasibility of an Automated System for Production of Dental Restorations, Ph.D. Thesis,” Univ. of Minnesota, 244 pages total, Nov. 1988. |
Richmond et al., “The Development of a 3D Cast Analysis System,” Br. J. Orthod., 13(1):53-54 (Jan. 1986). |
Richmond et al., “The Development of the PAR Index (Peer Assessment Rating): Reliability and Validity,” Eur. J. Orthod., 14:125-139 (1992). |
Richmond, “Recording the Dental Cast in Three Dimensions,” Am. J. Orthod. Dentofacial Orthop., 92(3):199-206 (Sep. 1987). |
Rudge, “Dental Arch Analysis: Arch Form, a Review of the Literature,” Eur. J. Orthod., 3(4):279-284 1981. |
Sakuda et al., “Integrated Information-Processing System in Clinical Orthodontics: An Approach with Use of a Computer Network System,” Am. J. Orthod. Dentofacial Orthop., 101(3): 210-220 (Mar. 1992). |
Schellhas et al., “Three-Dimensional Computed Tomography in Maxillofacial Surgical Planning,” Arch. Otolamp!. Head Neck Sur9., 114:438-442 (Apr. 1988). |
Schroeder et al., Eds. The Visual Toolkit, Prentice Hall PTR, New Jersey (1998) Chapters 6, 8 & 9, (pp. 153-210,309-354, and 355-428, respectively. |
Shilliday, (1971). Minimizing finishing problems with the mini-positioner, Am. J. Orthod. 59:596-599. |
Siemens, “CEREC—Computer-Reconstruction,” High Tech in der Zahnmedizin, 14 pages total (2004). |
Sinclair, “The Readers' Corner,” J. Clin. Orthod., 26(6):369-372 (Jun. 1992). |
Sirona Dental Systems GmbH, CEREC 3D, Manuel utiiisateur, Version 2.0X (in French), 2003,114 pages total. |
Stoll et al., “Computer-aided Technologies in Dentistry,” (article summary in English, article in German), Dtsch Zahna'rztl Z 45, pp. 314-322 (1990). |
Sturman, “Interactive Keyframe Animation of 3-D Articulated Models,” Proceedings Graphics Interface '84, May-Jun. 1984, pp. 35-40. |
The Choice Is Clear: Red, White & Blue . . . The Simple, Affordable, No-Braces Treatment, Allesee HI Orthodontic Appliances-Pro Lab product information for doctors. http://ormco.com/aoa/appliancesservices/RWB/doctorhtml>, 5 pages (May 19, 2003). |
The Choice is Clear: Red, White & Blue . . . The Simple, Affordable, No-Braces Treatment, Allesee HJ Orthodontic Appliances-Pro Lab product information for patients,<http://ormco.com/aoa/appliancesservices/RWB/patients.html>, 2 pages (May 19, 2003). |
The Choice Is Clear: Red, White & Blue . . . The Simple, Affordable, No-Braces Treatment, Allesee Orthodontic Appliances—Pro Lab product information, 6 pages (2003). |
The Red, White & Blue Way to Improve Your Smile! Allesee Orthodontic Appliances-Pro Lab product information for patients, 2 pages 1992. |
Truax L., “Truax Clasp-Less(TM) Appliance System,” Funct. Orthod., 9(5):22-4, 26-8 (Sep.-Oct. 1992). |
Tru-Tain Orthodontic & Dental Supplies, Product Brochure, Rochester, Minnesota 55902, 16 pages total (1996). |
U.S. Department of Commerce, National Technical Information Service, “Automated Crown Replication Using Solid Photography SM,” Solid Photography Inc., Melville NY, Oct. 1977, 20 pages total. |
U.S. Department of Commerce, National Technical Information Service, “Holodontography: An Introduction to Dental Laser Holography,” School of Aerospace Medicine Brooks AFB Tex, Mar. 1973, 37 pages total. |
U.S. Appl. No. 60/050,342, filed Jun. 20,1997, 41 pages total. |
Van Der Linden, “A New Method to Determine Tooth Positions and Dental Arch Dimensions,” J. Dent. Res., 51(4):1104 (Jul.-Aug. 1972). |
Van Der Linden et al., “Three-Dimensional Analysis of Dental Casts by Means of the Optocom,” J. Dent. Res., p. 1100 (Jul.-Aug. 1972). |
Van Der Zel, “Ceramic-Fused-to-Metal Restorations with a New CAD/CAM System,” Quintessence Int., 24(11):769-778 (1993. |
Varady et al., “Reverse Engineering of Geometric Models—An Introduction,” Computer-Aided Design, 29(4):255-268,1997. |
Verstreken et al., “An Image-Guided Planning System for Endosseous Oral Implants,” IEEE Trans. Med. Imaging, 17(5):842-852 (Oct. 1998). |
Warunek et al., Physical and Mechanical Properties of Elastomers in Orthodonic Positioners, Am J. Orthod. Dentofac. Orthop, vol. 95, No. 5, (May 1989) pp. 399-400. |
Warunek et.al., Clinical Use of Silicone Elastomer Applicances, JCO (1989) XXIII(10):694-700. |
Wells, Application of the Positioner Appliance in Orthodontic Treatment, Am. J. Orthodont. (1970) 58:351-366. |
Williams, “Dentistry and CAD/CAM: Another French Revolution,” J. Dent. Practice Admin., pp. 2-5 (Jan./Mar. 1987). |
Williams, “The Switzerland and Minnesota Developments in CAD/CAM,” J. Dent. Practice Admin., pp. 50-55 (Apr./Jun. 1987. |
Wishan, “New Advances in Personal Computer Applications for Cephalometric Analysis, Growth Prediction, Surgical Treatment Planning and Imaging Processing,” Symposium: Computerized Facial Imaging in Oral and Maxilofacial Surgery Presented on Sep. 13, 1990. |
WSCG'98—Conference Program, “The Sixth International Conference in Central Europe on Computer Graphics and Visualization '98,” Feb. 9-13, 1998, pp. 1-7, retrieved from the Internet on Nov. 5, 2004, URL<http://wscg.zcu.cz/wscg98/wscg98.h>. |
Xia et al., “Three-Dimensional Virtual-Reality Surgical Planning and Soft-Tissue Prediction for Orthognathic Surgery,” IEEE Trans. Inf. Technol. Biomed., 5(2):97-107 (Jun. 2001). |
Yamamoto et al., “Optical Measurement of Dental Cast Profile and Application to Analysis of Three-Dimensional Tooth Movement in Orthodontics,” Front. Med. Biol. Eng., 1(2):119-130 (1988). |
Yamamoto et al., “Three-Dimensional Measurement of Dental Cast Profiles and Its Applications to Orthodontics,” Conf. Proc. IEEE Eng. Med. Biol. Soc., 12(5):2051-2053 (1990). |
Yamany et al., “A System for Human Jaw Modeling Using Intra-Oral Images,” Proc. of the 20th Annual Conf. of the IEEE Engineering in Medicine and Biology Society, Nov. 1, 1998, vol. 2, pp. 563-566. |
Yoshii, “Research on a New Orthodontic Appliance: The Dynamic Positioner (D.P.); I. The D.P. Concept and Implementation of Transparent Silicone Resin (Orthocon),” Nippon Dental Review, 452:61-74 (Jun. 1980). |
Yoshii, “Research on a New Orthodontic Appliance: The Dynamic Positioner (D.P.); II. The D.P. Manufacturing Procedure and Clinical Applications,” Nippon Dental Review, 454:107-130 (Aug. 1980). |
Yoshii, “Research on a New Orthodontic Appliance: The Dynamic Positioner (D.P.); III. The General Concept of the D.P. Method and Its Therapeutic Effect, Part 1, Dental and Functional Reversed Occlusion Case Reports,” Nippon Dental Review, 457:146-164 (Nov. 1980). |
Yoshii, “Research on a New Orthodontic Appliance: The Dynamic Positioner (D.P.); III.—The General Concept of the D.P. Method and Its Therapeutic Effect, Part 2. Skeletal Reversed Occlusion Case Reports,” Nippon Dental Review, 458:112-129 (Dec. 1980). |
You May Be a Candidate for This Invisible No-Braces Treatment, Allesee Orthodontic Appliances—Pro Lab product information for patients, 2 pages (2002). |
Ishii. Fast Focus Mechanism Using a Pair of Convergent and Divergent Lenses Differentially for Three-dimensional Imaging. IEICE Transactions on Information and Systems. Jan. 1, 2012. pp. 168-172. |
Schaack. Variation of Magnification with Focus. Applied Optics, vol. 41, No. 7. Mar. 1, 2002. p. 1282. |
Number | Date | Country | |
---|---|---|---|
20170328704 A1 | Nov 2017 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 14980337 | Dec 2015 | US |
Child | 15668197 | US | |
Parent | 14323225 | Jul 2014 | US |
Child | 14980337 | US |