| Compass Development, Inc. ATOP Automatic Test Optimization Program, May 1988, pp. 1-4. |
| Compass Development, Inc., SAV Stimulus Analysis and Verification, May 1988, pp. 1-4. |
| Simutest, Inc., ATELink, 5 pages. |
| Bruce Hadley, "Design and Test Integration With TDS", STRATEGIES, Issue No. 14, Fall 1988, pp. 1-16. |
| Chris Pieper, "New Concepts for Test Stimulus Generation and Editing", Electronics Test, Jun. 1988, pp. 46, 48, 50 and 52. |
| Chris Pieper, "The Myth and Reality of Linking Design and Test", Electronics Test, 55-58., Apr. 1988. |
| Arium Corporation, Logic Analyzers/Application: Using Split-Screen Displays In Modern Logic Analysis, Apr. 1989, pp. 68-74 Evaluation Engineering. |
| Chris Everett, "CAE systems that incorporate CAT tools strengthen the link between design and test", EDN Feb. 20, 1986, pp. 52-58. |
| Peter Singer, "Test Software Development", Semiconductor Intl., Sep. 1986, pp. 76-81. |
| Johathon Vollmar, "A High-Speed Window-Based Pattern Debugger", 1987 International Test Conference, Paper 44.3, pp. 1058-1064. |
| Tinaztepe and Ozguc, "Functional Test Program Generation Through Interactive Graphics", 1988 International Test Conference, Paper 28.3, pp. 551-558. |
| National Instruments Corporation, pamphlet entitled "LabVIEW-New Technology for Scientific Test and Measurement", 1986, 6 pages. |
| John Ivie, "A High level Approach to Integrating Design and Test", 1988 International Test Conference (Aug.), Paper 24.1, pp. 452-459. |
| Test Systems Strategies, Inc. Reference Manual entitled "TesTools", Copyright 1984-1985. |
| Sangster and Monahan, "Aquarius: Logic Simulation On An Engineering Workstation", 20th Design Automation Conference, Paper 8.2, pp. 93-99. |