BRIEF DESCRIPTION OF THE DRAWINGS
The accompanying drawings are included to provide a further understanding of the present invention and are incorporated in and constitute a part of this specification. The drawings illustrate the embodiments of the present invention and together with the description serve to explain the principles of the invention. Other embodiments of the present invention and many of the intended advantages of the present invention will be readily appreciated as they become better understood by reference to the following detailed description. The elements of the drawings are not necessarily to scale relative to each other. Like reference numerals designate corresponding similar parts.
The invention will now be explained in more detail with reference to the accompanying figures.
FIGS. 1 to 7 illustrate schematic views of components which are joined together for the production of a semiconductor sensor device.
FIG. 1 illustrates a schematic plan view of a substrate plate.
FIG. 2 illustrates a schematic cross section through the substrate plate from FIG. 1.
FIG. 3 illustrates a schematic cross section through the substrate plate in accordance with FIG. 2 after the application of a buffer layer composed of rubber-elastic composition.
FIG. 4 illustrates a schematic cross section through the substrate plate from FIG. 3 after the application of a sensor chip onto the buffer layer.
FIG. 5 illustrates a schematic plan view of a covering plate.
FIG. 6 illustrates a schematic cross section through the substrate plate from FIG. 4 after the application of the covering plate.
FIG. 7 illustrates a schematic cross section through a semiconductor sensor device after the filling of an intermediate region with rubber-elastic composition.
FIGS. 8 to 11 illustrate schematic views of components which are assembled for the production of a semiconductor sensor device of a second embodiment of the invention.
FIG. 8 illustrates a schematic plan view of a covering plate.
FIG. 9 illustrates a schematic cross section through a sandwich-like framework after the application of the covering plate onto corresponding spacers.
FIG. 10 illustrates a schematic cross section of the sandwich-like framework from FIG. 9 after the insertion of a mold stamp.
FIG. 11 illustrates a schematic cross section through a semiconductor sensor device of the second embodiment of the invention after the filling of an intermediate region and removal of the mold stamp.