The present application is the national stage entry of International Patent Application No. PCT/EP2021/061980, filed on May 6, 2021, and published as WO 2021/002465 A1 on Jan. 6, 2022, which claims the benefit of priority of EP Patent Application No. 20182918.1, filed on Jun. 29, 2020, all of which are incorporated by reference herein in their entireties.
The disclosure relates to a low-dropout regulator for low voltage applications and to a communication device including the low-dropout regulator for providing a regulated output voltage for supplying power to electronic circuitries inside of the communication device.
Low-dropout regulators (LDOs) are used for power management in the majority of battery-powered portable devices. Most integrated circuits need internal LDOs to convert battery voltage that is changing to a stable internal supply, which is needed for blocks inside of the integrated circuits. The future development of electronic circuits is increasingly moving towards the use of low supply voltages for driving high loads in order to reduce the standby power and prolong the battery runtime.
There is a desire to provide a design of a low-dropout regulator for low voltage applications which can be operated with a wide range of load current and input supply voltage.
An embodiment of a low-dropout regulator that may be used in low voltage applications with wide input supply voltage range and wide load current range to provide a stable output voltage is specified in claim 1.
The low-dropout regulator comprises an input supply terminal to provide an input supply voltage, and a reference supply terminal to provide a reference supply voltage. The low-dropout regulator further comprises an error amplifier having a first and second input terminal and an output terminal. The low-dropout regulator comprises a pass device having a control node to control a conductivity of the pass device, and a buffer circuit arranged between the output terminal of the error amplifier and the control node of the pass device.
The buffer circuit comprises a first current path arranged between the input supply terminal and the reference supply terminal. The first current path includes a driver comprising a first transistor having a control node to control a conductivity of the first transistor. The first transistor is embodied as an NMOS transistor. The output terminal of the error amplifier is coupled to the control node of the first transistor. The control node of the pass device is coupled to a first internal node of the first current path located between the first transistor and the reference supply terminal.
The proposed LDO design may be used even if the specification of the LDO requires a wide input voltage range and a wide load range with a small output capacitor. Moreover, the proposed design of a low-dropout regulator gives the possibility to realize a stable internal LDO of an electric circuitry with high efficiency and high load capability, for example to drive up an output load current of more than 100 mA, even if the output voltage needs to be very near to the input supply voltage and even if the input supply voltage is very low. In particular, the LDO design allows the use of the low-dropout regulator in devices having a low input supply voltage range, for example 1.1 V, . . . , 1.8 V.
The first transistor has a drain node coupled to the input supply terminal, and a source node coupled to the internal node of the first current path. According to a preferred embodiment of the low-dropout regulator, the first transistor is configured as a source follower transistor. In particular, the first transistor may be embodied as a native NMOS transistor.
According to a further possible embodiment of the low-dropout regulator, the buffer circuit comprises a second transistor arranged between the power supply terminal and the internal node of the first current path. The second transistor is configured as a PMOS transistor. The second transistor has a source node coupled to the power supply terminal, and a drain node coupled to the first internal node of the first current path.
The arrangement of the second transistor between the power supply terminal and the first internal node of the first current path enables to realize the buffer circuit with dynamically-biased shunt feedback for output resistance reduction under different load currents.
According to an embodiment of the low-dropout regulator, the first current path comprises a current source being arranged in the first current path between the power supply terminal and the first transistor.
According to an embodiment of the low-dropout regulator, the second transistor has a control node being connected to a second internal node of the first current path. The second internal node of the first current path is arranged between the current source of the first current path and the first transistor.
According to a possible embodiment of the low-dropout regulator, the low-dropout regulator comprises a third transistor being arranged between the power supply terminal and the second internal node of the first current path. The third transistor has a source node being connected to the power supply terminal, and a drain node being connected to the second internal node of the first current path. The third transistor has a control node to apply a control signal for controlling a conductivity of the third transistor.
The buffer circuit is configured to generate the control signal for controlling the conductivity of the third transistor in response to an amount of a load current of the low-dropout regulator. In particular, the buffer circuit is configured to sense the load current of the low-dropout regulator, and to compare the sensed load current with a constant current. The result of the comparison is then used to turn on the third transistor, when the load current is very low. The third transistor is configured as a PMOS switch. As a consequence, since the source node of the third transistor and the control node of the second transistor are coupled together, the second transistor is turned off in order to keep the first transistor in saturation, when a low load current is detected.
According to a possible embodiment of the low-dropout regulator, the buffer circuit comprises a current mirror configured to provide a biasing current in the first current path of the buffer circuit. The buffer circuit comprises a second current path. The current mirror is configured to provide the bias current in the first current path of the buffer circuit in response to a current in the second current path.
According to a possible embodiment of the low-dropout regulator, the buffer circuit comprises a fourth transistor. The second current path comprises a second current source being arranged between the power supply terminal and the current mirror. The fourth transistor is arranged between the power supply terminal and a third internal node of the second current path located between the second current source and the current mirror.
This arrangement enables the biasing current of the buffer circuit to be adjusted in response to the sensed load current. In particular, the configuration allows the buffer circuit to be operated with a higher biasing current, when the load current increases.
According to an embodiment of the low-dropout regulator, the low-dropout regulator comprises an output current path including the pass device and an output terminal to provide a regulated output voltage. The low-dropout regulator comprises a feedback path including a capacitor being arranged between the output terminal and a third input terminal of the error amplifier.
The arrangement of the capacitor in the feedback path between the output terminal and the third input terminal of the error amplifier enables to provide the low-dropout regulator with Miller frequency compensation to achieve stability in the full range of the load current.
An embodiment of a communication device comprising the low-dropout regulator is specified in claim 15.
In particular, the low-dropout regulator may be used to provide a regulated output voltage in a plurality of communication devices, for example devices being embodied as a sensor or as a battery-powered device.
Additional features and advantages of the low-dropout regulator are set forth in the detailed description that follows. It is to be understood that both the foregoing general description and the following detailed description are merely exemplary, and are intended to provide an overview or framework for understanding the nature and character of the claims.
The accompanying drawings are included to provide further understanding, and are incorporated in, and constitute a part of, the specification. As such, the disclosure will be more fully understood from the following detailed description, taken in conjunction with the accompanying figures in which:
The structure of an LDO shown in
As illustrated in
Basically, different solutions for the error amplifier 100 and the buffer circuit 500 can be used depending on the specification that is required.
A possible approach to realize a low-dropout regulator with an intermediate buffer circuit is illustrated in
Referring to
The proposed BIA technique efficiently reduces the output impedance of the buffer circuit through the dynamically-biased shunt feedback. As a result, the pole at the gate of the pass device Mp is pushed far beyond the unity-gain frequency of the LDO regulation loop over the entire load current range, even if a huge pass device is used to achieve low dropout voltage and for sourcing high load current.
However, although there is no series resistor connected to the pass device, this kind of regulator still cannot work with very low input supply voltage, for example an input supply voltage in the range of between 1.1 V to 1.8 V, due to an additional gate-source voltage introduced by the PMOS transistor M21 in the buffer.
The transistor Mp of the pass device 200 and the transistor M21 respectively need a gate-source voltage to be higher than its respective threshold voltage. Both are embodied as PMOS transistors, so that the potential at node T1 is lower by at least two threshold voltages of the PMOS transistor than the input supply voltage Vin.
In conclusion, even if the solution of the buffer circuit 500′ has a high performance, there is a serious limitation. If the input supply voltage Vin is very low and the potential at the output node T1 of the error amplifier is even lower by two threshold voltages, there is no headroom anymore for NMOS transistors in the error amplifier structure.
Referring to the embodiment of the low-dropout regulator 1 for low voltage applications shown in
The pass device 200 is arranged in an output current path 40 in series with a resistive divider comprising resistors 210 and 220. The LDO 1 provides regulated output voltage Vout at output terminal OUT.
The buffer circuit 500 comprises a first current path 10 arranged between the input supply terminal IN and the reference supply terminal G. The first current path 10 includes a driver comprising a first transistor 11. The first transistor 11 has a control/gate node C11 to control the conductivity of the first transistor 11. In particular, the first transistor 11 is embodied as an NMOS transistor. The output terminal O100 of the error amplifier 100 is coupled to the control node C11 of the first transistor 11 of the driver. The control node C200 of the pass device 200 is coupled to a first internal node N1 of the first current path 10. The first internal node N1 of the first current path 10 is located between the first transistor 11 and the reference supply terminal G.
The first transistor 11 of the driver has a drain node D11 coupled to the input supply terminal IN, and a source node S11 coupled to the internal node N1 of the first current path 10. The first transistor of the driver is configured as a source follower transistor. To give enough headroom to error amplifier output at low loads, according to an advantageous embodiment of the low-dropout regulator 1, the first transistor 11 can be embodied as a native NMOS transistor.
If the design of the circuit buffer 500 shown in
According to the embodiment of the low-dropout regulator 1, the buffer circuit 500 comprises a second transistor 12. The second transistor 12 is arranged between the power supply terminal IN and the first internal node N1 of the first current path 10. The second transistor 12 is configured as a PMOS transistor. In particular, the second transistor 12 has a source node coupled to the power supply terminal IN, and a drain node coupled to the first internal node N1 of the first current path 10.
The arrangement of the second transistor 12 in a current path between the power supply terminal IN and the first internal node N1 of the first current path enables the buffer circuit 500 to be provided with dynamically-biased shunt feedback for output resistance reduction under different load currents to achieve high stability of the LDO.
Referring to
The low-dropout regulator comprises a third transistor 13 being arranged between the power supply terminal IN and the second internal node N2 of the first current path 10. The third transistor 13 has a source node being connected to the power supply terminal IN, and a drain node being connected to the second internal node N2 of the first current path 10.
Comparing the structure of the buffer circuit 500′ of
The third transistor 13 is configured as a switch, and has a control node to apply a control signal for controlling a conductivity of the third transistor 13. The buffer circuit 500 is configured to generate the control signal for controlling the conductivity of the third transistor 13 in response to an amount of a load current of the low-dropout regulator.
The buffer circuit is configured to generate the control signal for controlling the conductivity of the third transistor 13 in dependence on a level of a load current of the low-dropout regulator. For this purpose the low-dropout regulator 1 comprises a current path 30 being arranged between the power supply terminal IN and the reference supply terminal G to apply the reference supply voltage VSS. The current path 30 includes a current source 32 and a transistor 31 being connected in series between the power supply terminal IN and the reference supply terminal G. The current source 32 is configured as a transistor having a source node being connected to the reference supply terminal, and a drain node being connected to an internal node N4 of the third current path 30. The transistor 31 has a source node being connected to the power supply terminal IN and a drain node being connected to the internal node N4. The internal node N4 is connected to the control node of the third transistor 13.
The control/gate node of transistor 31 is coupled to the first internal node N1 of the first current path 10 in the same way as the control/gate node C200 of the pass transistor 200. This arrangement enables the buffer circuit 1 being configured to sense the load current of the low-dropout regulator. In particular, the load current is sensed and compared with a constant current provided by current source 32. As a result, the potential at node N4 depends on the level of the load current in relation to the level of the constant current of current source 32. The third transistor 13 is configured as a PMOS switch. Since the potential at node N4 is used as control signal for the third transistor 13, the result of the comparison of the load current and the constant current of current source 32 is used to turn the third transistor 13 on or off.
In particular, the third transistor 13 is turned on, i.e. operated in a state of low resistance, when the load current is very low. As a consequence, since the drain node of the third transistor 13 and the control/gate node of the second transistor 12 are coupled together, the second transistor 12 is turned off, i.e. operated in a state of high resistance, which allows to operate the first/source follower transistor 11 in saturation. This means that the local feedback is switched off for low loads to keep the source follower transistor 11 in saturation. This gives more headroom for the first transistor 11 at low loads, where the potential at the control/gate node of the pass device 200 is in any case near the input supply voltage Vin.
On the other hand, in the case of a high load current, the potential at internal node N4 is near the input supply voltage vin, and the third transistor 13 is turned off, i.e. operated in a state of high resistance. Consequently, the second transistor 12 is turned on so that the value of the output resistance of the buffer circuit is reduced which improves the stability of the LDO.
The buffer circuit 500 comprises a current mirror 70 being configured to provide a biasing current in the first current path 10 of the buffer circuit 500. The buffer circuit 500 comprises a second current path 20. The current mirror 70 is configured to provide the bias current in the first current path 10 in dependence on a current in the second current path 20.
The second current path 20 comprises a second current source 21 being arranged between the power supply terminal IN and the current mirror 70. The low-dropout regulator 1 further comprises a fourth transistor 14. The fourth transistor 14 is arranged between the power supply terminal IN and a third internal node N3 of the second current path 20 located between the second current source 21 and the current mirror 70.
As illustrated in
As shown in
The low-dropout regulator 1 comprises an output current path 40 including the pass device/transistor 200 and an output terminal OUT to provide the regulated output voltage Vout. The low-dropout regulator 1 comprises a feedback path 50 including a capacitor 51. The capacitor 51 is arranged between the output terminal OUT and a third input terminal I100c of the error amplifier 100.
The capacitor 51 provides Miller compensation to stabilize the LDO structure in order to achieve stability in the full range of the load current. By employing Miller compensation in the low-dropout regulator 1, only a single pole is realized within the unity-gain frequency and a good phase margin is achieved for the entire load current range with a small compensation capacitor.
The proposed design for the low-dropout regulator shown in
The embodiments of the low-dropout regulator for low voltage applications disclosed herein have been discussed for the purpose of familiarizing the reader with novel aspects of the design of the voltage regulator. Although preferred embodiments have been shown and described, many changes, modifications, equivalents and substitutions of the disclosed concepts may be made by one having skill in the art without unnecessarily departing from the scope of the claims.
In particular, the design of the low-dropout voltage regulator is not limited to the disclosed embodiments, and gives examples of many alternatives as possible for the features included in the embodiments discussed. However, it is intended that any modifications, equivalents and substitutions of the disclosed concepts be included within the scope of the claims which are appended hereto.
Features recited in separate dependent claims may be advantageously combined. Moreover, reference signs used in the claims are not limited to be construed as limiting the scope of the claims.
Furthermore, as used herein, the term “comprising” does not exclude other elements. In addition, as used herein, the article “a” is intended to include one or more than one component or element, and is not limited to be construed as meaning only one.
Number | Date | Country | Kind |
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20182918 | Jun 2020 | EP | regional |
Filing Document | Filing Date | Country | Kind |
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PCT/EP2021/061980 | 5/6/2021 | WO |
Publishing Document | Publishing Date | Country | Kind |
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WO2022/002465 | 1/6/2022 | WO | A |
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20230229182 A1 | Jul 2023 | US |