Patent Application
20100155955
The present application claims priority under 35 U.S.C. 119 to Korean Patent Application No. 10-2008-0130154 (filed on Dec. 19, 2008) which is hereby incorporated by reference in its entirety.
Embodiments relate to semiconductor devices and methods thereof. Some embodiments relate to a method of manufacturing a System In Package and devices thereof.
Developments in the electronic industry may have attempted to address user needs, which may include relatively smaller, lighter and/or multi-functional electronic products. Electronic product assembly technologies may have been developed to address such needs, and technologies under development may include substantially identical and/or different integrated circuit chips disposed on and/or over one module. New package technologies may be developed, and may include System on Chip (SoC) and/or System In Package (SIP). SIP may include a structure in which semiconductor chips, which may have a plurality of substantially different package functions, may be stacked in one package and/or may include a multi-layer form.
Semiconductor chips of a stacked structure may include metal connection portions bonded to one another, and/or deep contacts connected to respective metal connection portions. Semiconductor chips of a stacked structure may be connected to one another with deep contacts. In order to form a deep contact, a deep contact hole which passes through a semiconductor chip may be formed. Reactive ion etching (RIE) may be used. However, if a deep contact hole is formed by reactive ion etching, plasma may damage an inside portion of a contact hole. A side wall of a deep contact hole may also be affected, for example by heat transmitted from a bonded metal connection portion which may be exposed to a lower side of a contact hole.
Accordingly, there is a need of a method of manufacturing a System In Package and a System In Package that may improve a surface roughness of an inside portion of a deep contact hole which may be caused by plasma damage, for example at a time of formation of a deep contact hole. There is a need of a method of manufacturing a System In Package and a System In Package that may maximize dissipation of heat generated, for example at a time of bonding.
Embodiments relate to a method of manufacturing a System In Package and a System In Package. According to embodiments, a method of manufacturing a System In Package and a System In Package may improve a surface roughness of an inside portion of a deep contact hole which may be caused by plasma damage, for example at a time of formation of a deep contact hole. In embodiments, a method of manufacturing a System In Package and a System In Package may maximize dissipation of heat generated, for example at a time of bonding.
According to embodiments, a method of manufacturing a System In Package (SIP) may include providing a first chip having a first substrate region. In embodiments, a first metal connection portion may be formed on and/or over a first substrate region. In embodiments, a method of manufacturing a SIP may include providing a second chip having a second substrate region. In embodiments, a second metal connection portion may be formed on and/or over a second substrate region.
According to embodiments, a method of manufacturing a SIP may include bonding a first metal connection portion to a second metal connection portion and/or stacking a second chip on and/or over a first chip. In embodiments, a method of manufacturing a SIP may include subjecting a second substrate region to reactive ion etching (RIE). In embodiments, RIE may expose a portion of a second metal connection portion and/or form a deep contact hole. In embodiments, a method of manufacturing a SIP may include treating a surface of a deep contact hole with tetra-methyl ammonium hydroxide (TMAH) and/or nitric acid (HNO3).
According to embodiments, a method of manufacturing an SIP may maximize uniformity of an inside surface of a deep contact hole, for example by treating an inside surface of a deep contact hole. In embodiments, treatment may include TMAH, which may include a relatively strong alkaline organic substance, and/or nitric acid HNO3, which may include a relatively strong acidic substance. In embodiments, device characteristics may be maximized, for example by dissipating heat generated at a time of bonding. In embodiments, a contact including gold and/or silver may be formed which may include a relatively stronger reductive power than, for example, copper that may be used.
Example
Example
Embodiments relate to a method of manufacturing a System In Package (SIP). Referring to example
According to embodiments, first substrate region 110 may include a semiconductor device, such as a transistor, an inductor and/or a capacitor. In embodiments, first substrate region may include an insulating layer, a metal line and/or a metal pad. In embodiments, first metal connection portion 115 may include copper, an alloy of copper and/or tin.
Referring to
According to embodiments, second substrate region 200 may include a semiconductor device, such as a transistor, an inductor and/or a capacitor. In embodiments, second substrate region 200 may include an insulating layer, a metal line and/or a metal pad. In embodiments, second metal connection portion 117 may include copper, an alloy of copper and/or tin.
According to embodiments, first metal connection portion 115 of first chip 100 and second metal connection portion 117 of second chip 200 may be bonded by thermal compressive bonding, or the like. In embodiments, second chip 200 may be stacked with first chip 100. In embodiments, first metal connection portion 115 and/or second metal connection portion 117 may be heated at bonded portions in thermal compressive bonding. In embodiments, a SIP characteristic may be affected.
Referring to
According to embodiments, second chip 200 may be etched using photoresist pattern 130 as an etch mask. In embodiments, etching substrate region 120 of second chip 200 may expose a portion of second metal connection portion 117. In embodiments, etching may include reactive ion etching. In embodiments, deep contact hole 135 may be formed. In embodiments, ashing and/or stripping may be performed to remove photoresist pattern 130, for example remaining after reactive ion etching.
According to embodiments, an inside surface of deep contact hole 135 may be damaged. In embodiments, inside sidewall 137 of deep contact hole 135 may be damaged, for example by plasma generated at a time of reactive ion etching. In embodiments, inside sidewall 137 of deep contact hole may be relatively rough and/or partly lost, for example by plasma attack.
Referring to
According to embodiments, an inside surface, such as inside sidewall 137 of the deep contact hole, may become relatively rough and/or may be partly lost, for example by plasma attack. In embodiments, a surface of a deep contact hole may become substantially uniform by treating the surface in accordance with embodiments. In embodiments, uniform surface 139 may be formed. In embodiments, an inside surface of deep contact hole including silicon may include an increased roughness, for example by plasma attack which may be generated at a time of reactive ion etching, such that relatively many crystalline directions may be formed on and/or over a surface. In embodiments, energy may tend to go to a stabilizing direction, and/or at least one plane having a relatively high surface energy may be etched by TMAH and/or HNO3. In embodiments, a surface may be etched such that a surface energy may relatively stabilize and/or to make a surface substantially uniform.
Referring to
Referring to
According to embodiments, a metal used to bury deep contact hole 135 may include a metal having an ionization tendency lower relative to a metal of first metal connection portion 115 and/or second metal connection portion 117. In embodiments, a metal of first metal connection portion 115 and/or second metal connection portion 117 may include copper Cu. In embodiments, a metal buried in deep contact hole 135 may include silver Ag and/or gold Au, which may have an ionization tendency lower than copper Cu. At an interface of deep contact 140 and second metal connection portion 117, oxidative and reductive reactions according to the following reaction formulas may occur.
Cu→Cu+2+2e Reaction Formula 1
Ag++e→Ag
Au+3+3e→Au Reaction Formula 2
According to embodiments, Reaction Formula 1 including an oxidative reaction may emit heat, and/or Reaction Formula 2 including a reductive reaction may absorb heat. In embodiments, first metal connection portion 115 and/or second metal connection portion 117 including copper Cu may emit heat by an oxidative reaction. In embodiments, contact 140 having silver Ag and/or Au including a reductive reaction may absorbs heat. In embodiments, using oxidative and/or reductive reactions, heat emitted at a time of bonding first metal connection portion 115 and second metal connection portion 117 may be absorbed by contact 140. In embodiments, heat absorbed may be dissipated to an outside, for example through an upper side of contact 140 as illustrated in
According to embodiments, a method of manufacturing a SIP may maximize uniformity of an inside surface of a deep contact hole, for example by treating an inside surface of a deep contact hole with tetra-methyl ammonium hydroxide (TMAH), which may include a strongly alkaline organic substance, and/or nitric acid (HNO3), which may include a strong acid. In embodiments, a method of manufacturing a SIP may maximize device characteristics, for example by dissipating heat generated at a time of bonding. In embodiments, device characteristics may be maximized by, for example, forming a contact of gold and/or silver which may include a relatively stronger reductive power than, for example, copper.
It will be obvious and apparent to those skilled in the art that various modifications and variations can be made in the embodiments disclosed. Thus, it is intended that the disclosed embodiments cover the obvious and apparent modifications and variations, provided that they are within the scope of the appended claims and their equivalents.
| Number | Date | Country | Kind |
|---|---|---|---|
| 10-2008-0130154 | Dec 2008 | KR | national |
