Number | Name | Date | Kind |
---|---|---|---|
4549206 | Suzuki et al. | Oct 1985 | |
5272762 | Sezaki et al. | Dec 1993 | |
5495535 | Smilansky et al. | Feb 1996 | |
5506793 | Straayer et al. | Apr 1996 |
Entry |
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Ito et al. Recognition of Pattern Defects of Printed Circuit Board Using Topological Information. IEEE/CHMT '91 Symposium. Jul. 1991. pp. 202-206, Jul. 1991. |