Claims
- 1. A method of reducing a resistivity of an electrically conductive layer, which comprises:
providing an electrically conductive layer of a material selected from the group consisting of molybdenum and molybdenum alloy; and forming a MoO2 layer on a surface of the electrically conductive layer.
- 2. The method according to claim 1, which comprises forming the MoO2 layer with a layer thickness of between 5 nm and 50 nm.
- 3. The method according to claim 1, which comprises forming the MoO2 layer with a layer thickness of between 20 nm and 30 nm.
- 4. The method according to claim 1, which comprises, in a first step, converting a surface zone of the electrically conductive layer into a MoO3 layer by an oxidation treatment process, and, in a second step, converting the MoO3 layer into a MoO2 layer by a reduction treatment process.
- 5. The method according to claim 4, which comprises performing the oxidation treatment process for a period of 5 to 20 minutes at a temperature of between 250° C. and 325° C. with flowing, pure oxygen, and performing the reduction treatment process for a period of 5 to 20 min at a temperature of between 375° C. and 450° C. with flowing hydrogen.
Priority Claims (1)
Number |
Date |
Country |
Kind |
GM 949/2000 |
Dec 2000 |
AT |
|
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is a continuation of copending International Application No. PCT/AT01/00401, filed Dec. 21, 2001, which designated the United States and was not published in English.
Continuations (1)
|
Number |
Date |
Country |
Parent |
PCT/AT01/00401 |
Dec 2001 |
US |
Child |
10228887 |
Aug 2002 |
US |