"Microscopic Optical Beam Induced Current Measurements and their Applications", Koshi Haraguchi, 1994, IEEE, pp. 693-699. (unavailable month). |
"Novel OBIC Observation Method for . . . ", Nikawa et al., The 19th International Symposium for Testing & Failure Analysis, Los Angeles, CA, U.S.A., Nov. 1993, p. 3. |
"Tempreature Dependence of Optical Beam Reduced Current (OBREC) Signal in VLSI Metal Interconnection", Kawamura et al. |
Extended Abstracts, The 55th Autumn Meeting, 1994, Japan Society of Applied Physics, pp. 49 and 586, published Sep. 19, 1994. |
'94 Digital OBIC Scanner Seminar, pp. 23-33, published Nov. 9, 1994. |