The present invention relates to gas or liquid sensors, and systems for estimating concentrations of gases and liquids of interest.
Gas detecting sensors have many applications. One such application is to detect the presence of a dangerous gas, or to detect a gas whose presence indicates a dangerous situation. For example, NASA (National Aeronautics and Space Association) has sponsored research in detecting low concentrations of sulfur dioxide (SO2) in closed environments, such as for example aboard the international space station or the space shuttle. SO2 could be a probable breakdown product from leaking lithium-thionyl chloride batteries. SO2 is a colorless gas or liquid under pressure with a pungent odor. Inhalation or exposure could have adverse effects on human health.
In addition to detecting various gases, or liquids, of interest, it may also be of utility to provide estimates of the concentrations of various gases or liquids of interest. For example, various industrial processes may require that various gases or liquids be present within some range of concentration levels. In other applications, some dangerous gases may be tolerated if their concentrations fall below some threshold level.
In the description that follows, the scope of the term “some embodiments” is not to be so limited as to mean more than one embodiment, but rather, the scope may include one embodiment, more than one embodiment, or perhaps all embodiments.
When the sensor system is operating, air is pumped from the surroundings into sensor chamber 101. The air is directed either through activated charcoal filter 102, which is put in line to provide clean air for baseline data, or though a dummy filter of glass beads, dummy filter 104, which is put in line to provide a pressure drop similar to that due to charcoal filter 102. Solenoid valve 106 is programmed to open the path to charcoal filter 102 and provide clean airflow for a pre-selected period of time at selected time intervals; otherwise, the air is directed through filter 104. When air enters sensing chamber 101, whether through dummy filter 104 or activated charcoal filer 102, the resistance of each sensor is measured. By processing the changes in resistances, embodiments provide for detection of various gases or liquids and estimation of their concentrations.
Sensor chamber 101 may also include other sensors. In the particular embodiment of
Microcontroller and data acquisition module 107 controls the various components in the sensor system, measures resistance, and records the acquired measurements. Microcontroller and data acquisition module 107 may also include analog-to-digital conversion. Bus 108 provides an interconnect to other external components, such as a computer to process the resistance measurements.
Some examples of analytes are ammonia, mercury, sulfur dioxide, acetone, dichloromethane, ethanol, Freon 218, methanol, 2-propanol, toluene, and formaldehyde. Of course, this is merely a list of examples, and embodiments are not limited to detecting these analytes, and some embodiments may be designed without necessarily being able to detect these listed analytes.
Substrate 204 may be flexible or rigid, and may be conductive or non-conductive, depending upon the way in which the sorbed gas is detected. Sorption of the analyte of interest causes a change in one or more physical properties of film 202. By measuring this change, detection of a sorbed gas may be accomplished, provided the change is sufficiently large to allow a measurement.
For example, for some embodiments, substrate 204 may be formed from silicon dioxide, and film 202 may include carbon so that the electrical resistance of the carbon changes, depending upon the sorption of the analyte by film 202. In this way, a resistance measuring device, in combination with the system of
Plot 304 is a resistance vs. time plot for a particular sensor, say sensor number 32. Shown in plot 304 is a baseline resistance, denoted as R0. The baseline resistance is not necessarily measured directly, but may be estimated from resistance measurements. The resistance measurements may for some embodiments be obtained from raw resistance measurements after filtering has been applied. In the particular example of
is estimated from the resistance measurements, where t denoted the time index. (In practice, computations may be performed in finite arithmetic, so that mathematical operations for some embodiments may be understood to be approximate with finite precision.) An event occurs when the time derivative
is determined to be greater than some selected threshold, T. That is, an event is declared when
dR/dt>T.
For some embodiments, a baseline resistance associated with an event may be the measured resistance value at the beginning of the event. Accordingly, associated with each event is a baseline resistance. Baseline resistance may be denoted as R0. For some embodiments, the baseline resistance associated with an event may be taken at a time value other than the beginning of an event, or may be based upon filtered resistance measurements over some time interval associated with the event.
When an event is declared, a differential resistance dR associated with an event is provided by taking a difference in resistances. For some embodiments, the differential resistance may be the difference between the resistance associated with an event taken at some time, say the beginning of the event, and the baseline resistance associated with that event.
For the particular example of
The ratio of interest in plot 306 is dR/R0. The ratio dR/R0 may be referred to as a dynamic relative resistance change, where the term dynamic indicates that the baseline, as well as the differential in the resistance, may change with time. Plot 306 illustrates the dynamic relative resistance change for the 32 sensors, plotted as a bar graph. The ratio dR/R0 may also be referred to as a response.
In general, the set of responses dR/R0 for all the sensors will yield a pattern indicative, to some degree, upon the various analytes present. This pattern may be referred to as a fingerprint. Based upon a fingerprint, embodiments estimate the presence and concentration of various analytes. For some embodiments, the responses dR/R0 are adjusted for humidity by subtracting out the expected humidity response. For example, let dR(i)/R0(i) denote the response for sensor i, where i is an index ranging over sensor labels. Let dRH(i)/R0H(i) denotes the expected, or estimated, response of sensor i due to humidity alone. Then, some embodiments may form a humidity-corrected response by subtracting out dRH(i)/R0H(i) from dR(i)/R0(i) for each sensor i.
The expected, or estimated, humidity response may be provided as follows for some embodiments. The set of responses may be measured in a controlled setting at various known humidity levels in which no detectable analytes are present so that a table of humidity responses for the various humidity levels may be generated and stored. In the field, the humidity level may be measured during real-time, such as for example with sensor 105 when air is being filtered by filter 102 and the path through dummy filter 104 is closed. A look-up procedure applied to the stored table may yield an estimate of the expected set of humidity responses.
As is well known, various interpolation and extrapolation techniques may be applied during a table look-up procedure. For example, in general the measured humidity level will not correspond exactly to any of the humidity level entries in the stored table, so that interpolation and extrapolation may be used. Other embodiments may correct the set of responses dR (i)/R0(i) for environmental factors other than humidity. For example, temperature may be taken into account.
If a known target analyte, or analytes, are detected (module 414), the estimated concentrations are reported out and recorded (module 416). In the particular embodiment of
In the flow diagram of
In determining whether a target analyte is present based upon a fingerprint of responses, for example where the fingerprint of responses may be the set of dynamic relative resistance changes
i=1, 2, . . . , n, where n is the number of sensors, some model of response versus the concentrations is chosen. This model may be represented abstractly as
{right arrow over (y)}=f(A,{right arrow over (x)}),
where {right arrow over (y)} is a vector of responses, {right arrow over (x)} is a vector of concentrations, f (•,•) is a function, and A is a system model parameter describing system characteristics. In practice, A is a set of parameters, but for simplicity it may be referred to as a parameter. The dimension of {right arrow over (y)} is equal to or less than the number of sensors. For example, for some embodiments in which detection of a functional group is desired, the number of sensors under consideration may be a proper subset of the set of sensors, so that the dimension of {right arrow over (y)} is less than the number of sensors. When detection of one or more target analytes is desired, for some embodiments the responses of all the sensors are processed, so that the dimension of {right arrow over (y)} is equal to the number of sensors. For some embodiments the dimension of {right arrow over (x)} is equal to the number of target analytes. In practice, the dimension of {right arrow over (x)} is less than or equal to the dimension of {right arrow over (y)}.
It has been found that for some embodiments, interesting results were obtained with the following model
{right arrow over (y)}=A
1
{right arrow over (x)}+A
2
{right arrow over (x)}
2, (1)
where the superscript in {right arrow over (x)}2 is a notational convenience to mean that the ith component of {right arrow over (x)}2 is the square of the ith component of {right arrow over (x)}, and A1 and A2 are matrices modeling the system characteristics. If the convention is chosen such that the dimension of {right arrow over (y)} is n and the dimension of {right arrow over (x)} is m, then for some embodiments using the above model, A1 and A2 are n by m matrices.
The system modeling matrices A1 and A2 may be estimated by introducing known analytes of known concentrations, so that {right arrow over (x)} and {right arrow over (x)}2 are known and {right arrow over (y)} is measured. Standard numerical techniques may then be applied to Eq. (1) to find an estimate of the system modeling matrices. For example, as is well known, minimum norm least squares methods using singular value decomposition may be applied to Eq. (1) to find estimates of A1 and A2 when {right arrow over (x)}, {right arrow over (x)}2, and {right arrow over (y)} are given.
Once the system modeling matrices are estimated, Eq. (1) then comes into play when an embodiment is deployed in the field, but where now A1 and A2 are known, {right arrow over (y)} is measured, and {right arrow over (x)} is to be estimated. Various well known numerical techniques may be applied to eq. (1) to estimate {right arrow over (x)} for a given A1, A2, and {right arrow over (y)}, and one or more criteria of goodness are chosen for modules 414 and 418 to determine whether a target analyte or functional group is present.
It has been found for some embodiments that a numerical technique based upon a modification to the Levenberg Marquart Nonlinear Least Squares method, outlined in the flow diagram of
Referring to
{right arrow over (X)}←{right arrow over (x)}+Δ{right arrow over (x)},
where Δ{right arrow over (x)} is a correction vector.
A correction vector is generated as follows. Some initial starting point for the concentration vector {right arrow over (x)}, denoted as {right arrow over (x)}0, is chosen in module 502. In module 504, each component in the residual vector {right arrow over (y)}−f(A, {right arrow over (x)}) is weighted according to a weight vector {right arrow over (w)} to provided a weighted residual vector {right arrow over (r)}, where
{right arrow over (r)}={right arrow over (w)}*({right arrow over (y)}−f(A,{right arrow over (x)}),
where * denotes component by component multiplication. The Jacobian matrix J is calculated in module 506,
J=d{right arrow over (r)}/d{right arrow over (x)},
and the curvature matrix C is calculated in module 508,
C=J†J,
where † denotes transposition and complex conjugation (the Hermitian adjoint operation). In module 510, the matrix Jn is calculated based upon the Jacobian and curvature matrices,
J
n
=JC
1/2,
followed by a singular value decomposition
Jn=UDV†.
A gradient vector g is calculated in module 512 according to
{right arrow over (g)}=Jn†{right arrow over (r)}.
In module 514, for some suitably chosen epsilon E, a correction vector Δ{right arrow over (x)} is calculated
Δ{right arrow over (x)}=V(D2+εI)−1/2{right arrow over (g)}C−1/2,
where I is an identity matrix chosen so that the dimension of εI matches that of D.
The loop comprising modules 504 through 516 may be repeated for various values of ε. For some embodiments, a series of candidate values for ε such as ε={10−2, 10−1, 1, 102, 104} may be chosen. On the first iteration of the loop comprising modules 504 through 516, a search may be made through the series for ε to find an {right arrow over (x)} that results in the smallest norm (smallest sum of squares of the components) of the residual vector. For subsequent iterations, the previously used values in the series for ε may be multiplied by the previous found value for ε that produced the minimum norm of the residual vector {right arrow over (r)}. With the updated series, a search is again made for the best ε as was done in the previous iteration. This process may be stopped after some chosen criterion of goodness is satisfied. Criteria of goodness other than the norm of the residual vector may be considered in finding the best ε. For example, a minimum norm criterion in conjunction with a criterion based on the least number of significant components in the {right arrow over (x)} vector may be combined into a criterion of goodness.
The above-described method for updating the concentration vector over several iterations of the loop comprising modules 504 through 516 may then be performed for various starting points {right arrow over (x)}0. For some embodiments, the various starting points may be chosen randomly (or more practically, pseudorandomly.) Some criterion of goodness, such as the norm of the residual vector, may be considered when choosing the final result for the various starting points.
As discussed with respect to the flow diagram of
Various polymers may be chosen for the sensor films. Examples are: Poly (4-vinylphenol-co-methyl methacrylate); Poly (ethylene-co-acrylic acid); Poly (styrene-co-maleic acid); Poly (2-vinyl pyridine); Poly (4-vinylpyridine); Vinyl alcohol/vinyl butyral copolymer; Cyanoethyl hydroxyethyl cellulose; Soluble polyimide; Polyepichlorohydrin; Poly (epichlorohydrin-co-ethylene oxide); and Polyethylene oxide.
Although the subject matter has been described in language specific to structural features and methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims. Accordingly, various modifications may be made to the described embodiments without departing from the scope of the invention as claimed below.
Throughout the description of the embodiments, various mathematical relationships are used to describe relationships among one or more quantities. For example, a mathematical relationship or mathematical transformation may express a relationship by which a quantity is derived from one or more other quantities by way of various mathematical operations, such as addition, subtraction, multiplication, division, etc. Or, a mathematical relationship may indicate that a quantity is larger, smaller, or equal to another quantity. These relationships and transformations are in practice not satisfied exactly, and should therefore be interpreted as “designed for” relationships and transformations. One of ordinary skill in the art may design various working embodiments to satisfy various mathematical relationships or transformations, but these relationships or transformations can only be met within the tolerances of the technology available to the practitioner.
Accordingly, in the following claims, it is to be understood that claimed mathematical relationships or transformations can in practice only be met within the tolerances or precision of the technology available to the practitioner, and that the scope of the claimed subject matter includes those embodiments that substantially satisfy the mathematical relationships or transformations so claimed.
This application claims the benefit of U.S. Provisional Application No. 60/861,617, filed 29 Nov. 2007.
The invention described herein was made in the performance of work under a NASA contract, and is subject to the provisions of Public Law 96-517 (35 USC 202) in which the Contractor has elected to retain title.
Number | Date | Country | |
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60861617 | Nov 2006 | US |