This application claims the benefit of the Korean Patent Application No. 10-2024-0003376 filed on Jan. 9, 2024, which is hereby incorporated by reference as if fully set forth herein.
The present disclosure relates to a touch sensing display device and a driving method thereof.
As information technology advances, the market for display devices which are a connection medium between a user and information is growing. Therefore, the use of display devices such as light emitting display devices, quantum dot display (QDD) devices, and liquid crystal display (LCD) devices is increasing.
The display devices described above include a display panel which includes a plurality of subpixels, a driver which outputs a driving signal for driving the display panel, and a power supply which generates power which is to be supplied to the display panel or the driver.
In such display devices, when the driving signal (for example, a scan signal and a data signal) is supplied to each of the subpixels provided in the display panel, a selected subpixel may transmit light or may self-emit light, and thus, an image may be displayed.
The present disclosure may decrease a carry signal transfer time to secure a touch sensing time, and based thereon, may enhance sensitivity based on a touch sensing operation, may increase an obtainment target (a touch screen block) of touch data, and may secure a time for analyzing coordinates of a touch input position.
As embodied and broadly described herein, a touch sensing display device includes: a display panel configured to alternately perform display driving and touch sensing driving; and a gate driving circuit including stage circuits for driving gate lines of the display panel, wherein the gate driving circuit outputs a display scan signal generated based on a display carry clock to the display panel during a display frame defining a display driving period and outputs a touch scan signal generated based on a touch carry clock to the display panel during a touch frame defining a touch sensing driving period, and a position at which the touch carry clock is generated during a first touch sensing frame included in the touch sensing driving period differs from a position at which the touch carry clock is generated during a second touch sensing frame included in the touch sensing driving period.
The touch carry clock may move in a forward direction with respect to the display panel during the first touch sensing frame and may move in a reverse direction with respect to the display panel during the second touch sensing frame.
The gate driving circuit may apply a forward voltage for driving the stage circuits in the forward direction during the first touch sensing frame and may apply a reverse voltage for driving the stage circuits in the reverse direction during the second touch sensing frame.
The touch carry clock may be generated from a first gate line of the display panel and may move up to a gate line disposed in a center region of the display panel during the first touch sensing frame, and during the second touch sensing frame, the touch carry clock may be generated from a last gate line of the display panel and may move up to the gate line disposed in the center region of the display panel.
During the touch sensing driving period, a first stage of the stage circuits may supply a first touch scan signal to one first gate line included in a first touch screen block of the display panel, and a second stage of the stage circuits may supply a second touch scan signal to one second gate line included in a second touch screen block of the display panel.
The touch sensing display device may further include a sensing circuit configured to sense a voltage of a source node of a representative pixel formed in a substrate of the display panel according to the touch scan signal, so as to sense a touch input applied to the display panel during the touch sensing driving period.
The representative pixel may include a driving transistor including a source electrode connected to the source node and a gate electrode connected to a gate node, the gate node may include a first conductive pattern which faces the source node with at least one insulation layer therebetween and is one electrode of a storage capacitor and a second conductive pattern connected to the first conductive pattern through a contact hole passing through the at least one insulation layer, the source node may include a third conductive pattern which is disposed on the at least one insulation layer and is the other electrode of the storage capacitor, and the first conductive pattern may be disposed closer to the substrate than the second conductive pattern and the third conductive pattern.
In another aspect of the present disclosure, a driving method of a touch sensing display device, including a display panel alternately performing display driving and touch sensing driving and a gate driving circuit including stage circuits for driving gate lines of the display panel, includes: outputting a display scan signal generated based on a display carry clock to the display panel during a display frame defining a display driving period; and outputting a touch scan signal generated based on a touch carry clock to the display panel during a touch frame defining a touch sensing driving period, wherein a position at which the touch carry clock is generated during a first touch sensing frame included in the touch sensing driving period differs from a position at which the touch carry clock is generated during a second touch sensing frame included in the touch sensing driving period.
The touch carry clock may move in a forward direction with respect to the display panel during the first touch sensing frame and may move in a reverse direction with respect to the display panel during the second touch sensing frame.
The touch carry clock may be generated from a first gate line of the display panel and may move up to a gate line disposed in a center region of the display panel during the first touch sensing frame, and during the second touch sensing frame, the touch carry clock may be generated from a last gate line of the display panel and may move up to the gate line disposed in the center region of the display panel.
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the disclosure and together with the description serve to explain the principle of the disclosure. In the drawings:
Hereinafter, the present disclosure will be described more fully with reference to the accompanying drawings, in which exemplary embodiments of the disclosure are shown. The disclosure may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the disclosure to those skilled in the art.
A display device according to the present disclosure may be applied to televisions (TVs), video players, personal computers (PCs), home theaters, electronic devices for vehicles, and smartphones, but is not limited thereto. The display device according to the present disclosure may be implemented as a light emitting display device, a quantum dot display (QDD) device, or a liquid crystal display (LCD) device. Hereinafter, for convenience of description, a light emitting display device self-emitting light by using an inorganic light emitting diode or an organic light emitting diode will be described for example.
In the following description, a scan signal (or a gate signal) applied to pixels may swing between a gate on voltage and a gate off voltage. The gate on voltage may be set to a voltage which is higher than a threshold voltage of a transistor, and the gate off voltage may be set to a voltage which is lower than the threshold voltage of the transistor. The transistor may be turned on in response to the gate on voltage and may be turned off in response to the gate off voltage. In N-channel transistors, the gate on voltage may be a gate high voltage (VGH), and the gate off voltage may be a gate low voltage (VGL). In P-channel transistors, the gate on voltage may be the gate low voltage (VGL), and the gate off voltage may be the gate high voltage (VGH).
As illustrated in
In a screen displaying an input image in the display panel 10, first signal lines 14 extending in a column direction (or a vertical direction) may intersect with second signal lines 15 extending in a row direction (or a horizontal direction), and a plurality of pixels P may be respectively provided in a plurality of intersection areas and may be arranged as a matrix type to configure a pixel array. The first signal lines 14 may include a plurality of data lines 14A through which data voltages are supplied and a plurality of reference voltage lines 14B through which a reference voltage is supplied. The reference voltage lines 14B may connect the pixels P with the sensing circuit SU and may be referred to as a sensing line. The second signal lines 15 may be gate lines through which scan signals are supplied.
The pixel array may include a plurality of pixel set lines PL. Here, the pixel set line PL may not denote a physical signal line but may be defined as a pixel set of pixels of one line arranged adjacent to one another in a horizontal direction or defined as a pixel block of pixels of one line. The pixels P may be grouped into a plurality of groups and may implement various colors. When a pixel group for implementing colors is defined as a unit pixel UPXL, one unit pixel UPXL may include red (R), green (G), blue (B), and white (W) pixels. The pixels configuring the one unit pixel UPXL may be arranged adjacent to one another in a horizontal direction and may be designed to share the same reference voltage line 14B, and thus, the pixel array may be simplified.
The timing controller 11 may convert a non-touch driving mode into a touch driving mode or a driving mode opposite thereto, based on whether there is a touch input, mode selection information about a user, and distance information between a display device and a user. The non-touch driving mode may be a driving mode for performing a display operation and an external compensation operation. The touch driving mode may be a driving mode for further performing a touch sensing operation in addition to a display operation and an external compensation operation.
In the non-touch driving mode, all frames may be display frames for display driving. On the other hand, in the touch driving mode, a display frame for display driving and a touch frame for touch sensing driving may be alternately performed at a period of a certain time. Here, the certain time may be a one-frame time, and in this case, one display frame may be arranged between adjacent touch frames. However, the inventive concept is not limited thereto. The certain time may be a several-frame time, and in this case, a plurality of display frames may be arranged between adjacent touch frames.
One frame may include a vertical active period where new image data DATA is scanned (or refreshed or updated) and a vertical blank period where scanning of the image data DATA is not performed. Display driving may be performed in a vertical active period of a display frame, and touch sensing driving may be performed in a vertical active period of a touch frame. External compensation driving may be performed in a vertical blank period of each of the display frame and the touch frame. The external compensation driving may be for sensing a device characteristic value (a threshold voltage and electron mobility of a driving transistor and a threshold voltage of a light emitting device) of a pixel P.
The timing controller 11 may correct digital video data input from a host system by using a compensation value based on a pixel sensing value based on external compensation driving, and then, may supply corrected image data DATA to the data driving circuit 12. The timing controller 11 may receive a timing signal such as a vertical synchronization signal Vsync, a horizontal synchronization signal Hsync, a data enable signal DE, and a dot clock DCLK from the host system to generate a gate timing control signal GDC for controlling an operation timing of the gate driving circuit 13 and a data timing control signal DDC for controlling an operation timing of the data driving circuit 12.
The timing controller 11 may compare a predetermined reference value with a touch sensing value based on a touch sensing operation to obtain coordinate information about a touch input position and may transfer the coordinate information to the host system. The host system may execute a touch application corresponding to the coordinate information.
The data driving circuit 12 may include one or more source driving ICs SDIC. Each of the source driving ICs SDIC may include a latch array, a plurality of digital-to-analog converters DAC respectively connected to the data lines 14A, a plurality of sensing circuits SU respectively connected to the sensing lines 14B, a plurality of multiplex switches SS which selectively connect the sensing circuits SU to a plurality of analog-to-digital converters ADC, and a shift register SR which sequentially turns on the multiplex switches SS.
The latch array may latch the corrected image data DATA input from the timing controller 11, based on the data control signal DDC, and may supply the latched image data DATA to the digital-to-analog converters DAC. The digital-to-analog converters DAC may convert the latched image data DATA into display data voltages and may supply the display data voltages to the data lines 14A. In external compensation driving, the digital-to-analog converters DAC may generate a predetermined external sensing data voltage and may supply the external sensing data voltage to the data lines 14A. In touch sensing driving, the digital-to-analog converters DAC may generate a predetermined touch driving data voltage and may supply the touch driving data voltage to the data lines 14A.
The sensing circuit SU may be used in common in external compensation driving and touch sensing driving, and thus, a separate touch sensing circuit for touch sensing may be removed. Because touch sensing is possible without the separate touch sensing circuit, the source driving IC may be simplified, and thus, power consumption and the manufacturing cost may be reduced.
The sensing circuit SU may supply a reference voltage Vpre to the sensing line 14B, based on the data control signal DDC, or may sample a touch sensing value or a device characteristic sensing value input through the sensing line 14B and may supply a sampled touch sensing value or device characteristic sensing value to the analog-to-digital converter ADC.
The analog-to-digital converter ADC may convert the touch sensing value or the device characteristic sensing value, input from the sensing circuits SU, into a digital sensing signal SLV and may transfer the digital sensing signal SLV to the timing controller 11.
The gate driving circuit 13 may generate a scan signal (SCAN of
The gate control signal GDC may include a plurality of scan clocks and a plurality of carry clocks. An on pulse width of the carry clock may be designed narrower in touch sensing driving than display driving, and thus, a transfer time of a carry signal may be shortened in a touch frame. A time capable of being allocated for an output of a touch scan signal in a touch frame may increase in proportion to a reduction in transfer time of the carry signal, and thus, touch performance may be enhanced.
As illustrated in
The light emitting device OLED may include an anode electrode connected to a source node DTS, a cathode electrode connected to an input terminal of a low level driving voltage EVSS, and an organic compound layer disposed between the anode electrode and the cathode electrode. The organic compound layer may include a hole injection layer (HIL), a hole transport layer (HTL), an emission layer (EML), an electron transport layer (ETL), and an electron injection layer (EIL).
The driving transistor DT may control a level of a drain-source current (hereinafter referred to as Ids) of the driving transistor DT input to the light emitting device OLED, based on a gate-source voltage (hereinafter referred to as Vgs) thereof. The driving transistor DT may include a gate electrode connected with a gate node DTG, a drain electrode connected with an input terminal of a high level driving voltage EVDD, and a source electrode connected with a source node DTS.
The storage capacitor Cst may be connected between the gate node DTG and the source node DTS and may hold the gate-source voltage of the driving transistor DT during a predetermined period.
The first switch transistor ST1 may electrically connect a data line 14A with the gate node DTG, based on a scan signal SCAN from a gate line 15, and may allow a data voltage Vdata to be charged into the gate node DTG. The first switch transistor ST1 may include a gate electrode connected with the gate line 15, a drain electrode connected with the data line 14A, and a source electrode connected with the gate node DTG.
The second switch transistor ST2 may electrically connect the source node DTS with the sensing line 14B, based on the scan signal SCAN, and thus, may allow a reference voltage Vpre to be charged into the source node DTS. The second switch transistor ST2 may allow a source node voltage, corresponding to the Ids of the driving transistor DT, to be charged into a line capacitor LCa of the sensing line 14B. The second switch transistor ST2 may include a gate electrode connected with the gate line 15, a drain electrode connected with the sensing line 14B, and a source electrode connected with the source node DTS.
The sensing circuit SU may be implemented as a voltage sensing type. The sensing circuit SU may be for sensing a voltage stored in the line capacitor LCa of the sensing line 14B and may include a reference voltage control switch SW1, a sampling switch SW2, and a sample and hold unit S/H.
The reference voltage control switch SW1 may be turned on and may connect an input terminal of the reference voltage Vpre with the sensing line 14B, based on the reference control voltage signal SPRE. The sampling switch SW2 may be turned on and may connect the sensing line 14B with the sample and hold unit S/H, based on the sampling control signal SAM.
When the driving transistor DT is degraded or there is a touch input, the Vgs of the driving transistor DT may vary, and thus, the Ids of the driving transistor DT may vary. A voltage of the source node DTS of the driving transistor DT may vary based on a level of the Ids of the driving transistor DT. While the second switch transistor ST2 is being turned on, the voltage of the source node DTS of the driving transistor DT may be stored in the line capacitor LCa of the sensing line 14B. The sample and hold unit S/H may sample and hold the voltage of the source node DTS of the driving transistor DT stored in the line capacitor LCa of the sensing line 14B while the sampling switch SW2 is being turned on, and then, may transfer a sampled voltage to the analog-to-digital converter ADC.
The principle that a touch input is sensed in the touch sensing display device according to the present embodiment will be described below with reference to
The touch capacitor Ctouch may be a capacitive capacitor between the touch input object and a gate node DTG of the driving transistor. When the Vgs of the driving transistor is reduced, an Ids of the driving transistor may decrease, and thus, whether there is a touch input may be determined based on that a source node voltage Vs of the driving transistor varies between a pixel touched by the touch input object and an untouched pixel. According to a TFT current formula, the Ids may be proportional to the square of Vgs.
Accordingly, even when the amount of Vgs variation based on a touch input is small, the Ids may be amplified, and thus, the source node voltage Vs may be quickly shifted, thereby enhancing touch sensing performance. In
Because an area contacting a touch input object is far greater than an area occupied by one pixel, the touch sensing device according to the present embodiment may sense a touch input with respect to only some pixels (hereinafter referred to as representative pixels), and thus, a touch sensing period may be shortened, thereby enhancing a touch report rate.
As illustrated in
The circuit unit CP of the pixel P may include insulation layers BUF, GI, and OC and conductive patterns M1, M2, and PXL stacked on a substrate GLS. In inputting a touch, as Vgs of the driving transistor increases, touch sensing performance may increase. In some implementations, a gate node is connected with the gate electrode of the driving transistor is disposed closer to the substrate GLS than a source node connected with the source electrode of the driving transistor. Therefore, reactivity on a touch input may be improved.
Moreover, because the source node of the driving transistor is connected with an internal capacitor of the light emitting device, when the source node is disposed closer to the substrate GLS than the gate node, a variation of Vgs (i.e., reactivity on a touch input) corresponding to the touch input may be very small, and thus, may be unsuitable for touch sensing. The internal capacitor of the light emitting device may be a capacitor which is between an anode electrode PXL and a cathode electrode.
An array configuration of the pixel P will be described below in detail with reference to
A voltage of a source node DTS of the pixel P may be a target for touch sensing. The pixel P may include a gate node DTG which is electrically disconnected from the source node DTS. The gate node DTG may include a first conductive pattern M1, which faces the source node DTS with one or more insulation layers GI and BUF therebetween and is one electrode of the storage capacitor Cst, and a second conductive pattern M2 which is connected with the first conductive pattern M1 through a first contact hole CH1 passing through the insulation layers GI and BUF.
The source node DTS may be a third conductive pattern M3 which is disposed on the insulation layers GI and BUF and is the other electrode of the storage capacitor Cst. In this case, the first conductive pattern M1 among the first conductive pattern M1, the second conductive pattern M2, and the third conductive pattern M3 may be disposed closest to the substrate GLS. That is, the first conductive pattern M1 formed close to the substrate GLS may function as a touch electrode, and moreover, may function as a light blocking pattern. The first conductive pattern M1 may block external light which is incident on a semiconductor layer ACT of the driving transistor, thereby preventing a characteristic value of the driving transistor from being degraded by the external light.
The first conductive pattern M1 may be covered by a buffer insulation layer BUF and a gate insulation layer GI and may be electrically connected with the second conductive pattern M2, disposed on the gate insulation layer GI, through the first contact hole CH1. The second conductive pattern M2 may configure the gate electrode of the driving transistor.
The third conductive pattern M3 which is the other electrode of the storage capacitor Cst may be disposed on the first conductive pattern M1 with the buffer insulation layer BUF and the gate insulation layer GI therebetween. The third conductive pattern M3 may include the same material as that of the second conductive pattern M2 and may configure the same layer along with the second conductive pattern M2. The source electrode of the driving transistor may be formed by providing a conductivity of the semiconductor layer ACT or stacking a conductive layer on the semiconductor layer ACT and may be electrically connected with the third conductive pattern M3 through a contact hole.
The second conductive pattern M2 and the third conductive pattern M3 may be covered by a planarization layer OC, and the anode electrode PXL of the light emitting device may be formed on the planarization layer OC. Although not shown, the source node DTS of the driving transistor and the anode electrode PXL of the light emitting device may be electrically connected with each other through a contact hole passing through the planarization layer OC.
As illustrated in
When a touch input is received at a first timing t1 of the on pulse period, Ids1 corresponding to Vgs1 may flow in the driving transistor. The Ids1 of the driving transistor may be less than Ids2 of when there is no touch input. In other words, Ids1 of a first representative pixel corresponding to a position at which there is a touch input may be less than Ids2 of a second representative pixel corresponding to a position at which there is no touch input.
When touch sensing is performed at a second timing t2 of the on pulse period, a voltage of the source node DTS of the driving transistor may be sensed as Vsen based on Ids1. The Vsen of the driving transistor may be less than Vsen′ based on Ids2 of when there is no touch input. In other words, Vsen of the first representative pixel corresponding to a position at which there is a touch input may be less than Vsen′ of the second representative pixel corresponding to a position at which there is no touch input. Accordingly, whether there is a touch input corresponding to pixels may be determined based on a difference between Vsen and Vsen′ which are a voltage of the source node DTS of the driving transistor.
As illustrated in
Display driving may be for writing image data in all pixels P of a display panel to update an image and may be performed in a vertical active period of the display frame D-Frame. Touch sensing driving may be performed in a vertical active period of the touch frame T-Frame, and because touch sensing driving is performed on only representative pixels P, a time allocated to touch sensing may be secured to be long. Because the time allocated to touch sensing is long, a touch sensing period may be shortened, and a touch report rate may be enhanced.
Furthermore, external compensation driving may be performed in a vertical blank period of each of the display frame D-Frame and the touch frame T-Frame.
As illustrated in
A gate driving circuit may apply a display scan signal D-SCAN to all pixels in display frames D-Frame and may apply a touch scan signal T-SCAN to representative pixels in touch frames T-Frame. An on pulse width PW1 of the touch scan signal T-SCAN may be wider than an on pulse width PW2 of the display scan signal D-SCAN. Because the on pulse width PW1 of the touch scan signal T-SCAN is wide, touch sensing performance for the touch screen blocks TBLK may be enhanced.
As illustrated in
The gate driving voltage line 131 may transfer a high level voltage VDD and a low level voltage GVSS, supplied from a power supply circuit (not shown), to the first to kth stage circuits STG(1) to STG(k) and the dummy stage circuit DST1. In the present embodiment, the gate driving voltage line 131 may include two high level voltage lines which respectively transfer a first high level voltage GVDD1 and a second high level voltage GVDD2 having different voltage levels and three low level voltage lines which respectively transfer a first low level voltage GVSS1, a second low level voltage GVSS2, and a third low level voltage GVSS3 having different voltage levels. However, this may be merely an embodiment, and the number of voltage lines included in the gate driving voltage line 131 may be varied.
The clock signal line 132 may transfer a plurality of clock signals (for example, carry clock signals CRCLK and scan clock signals SCCLK), supplied from the timing controller 11, to the first to kth stage circuits STG(1) to STG(k) and the dummy stage circuit DST1.
The carry clock signals CRCLK may be implemented as first to third carry clocks CRCLK1, CRCLK2, and CRCLK3 having different phases, but are not limited thereto. The first to third carry clocks CRCLK1, CRCLK2, and CRCLK3 may be shifted in phase while swinging between a gate on voltage and a gate off voltage. The first to third carry clocks CRCLK1, CRCLK2, and CRCLK3 may be respectively supplied to the first to kth stage circuits STG(1) to STG(k) through first to third carry clock lines 132-1, 132-2, and 132-3. Each of the first to kth stage circuits STG(1) to STG(k) may receive one of the first to third carry clocks CRCLK1, CRCLK2, and CRCLK3, based on a phase sequence scheme, and may output carry signals C(1) to C(K) corresponding to the received carry clock. Each of the first to kth stage circuits STG(1) to STG(k) may be activated in stage operation, based on a previous carry signal.
The scan clock signals SCCLK may be implemented as first to twelfth scan clocks SCLK1 to SCLK12 having different phases, but are not limited thereto. The first to twelfth scan clocks SCLK1 to SCLK12 may be shifted in phase while swinging between the gate on voltage and the gate off voltage. The first to twelfth scan clocks SCLK1 to SCLK12 may be respectively supplied to the first to kth stage circuits STG(1) to STG(k) through first to twelfth scan clock lines 232-1 to 232-12. Each of the first to kth stage circuits STG(1) to STG(k) may receive one of the first to twelfth scan clocks SCLK1 to SCLK12, based on the phase sequence scheme, and may output scan signals SCOUT(1) to SCOUT(n) corresponding to the received scan clock. Each of the first to kth stage circuits STG(1) to STG(k) may be activated in stage operation, based on a previous carry signal.
Each stage circuit may output four gate signals SCOUT and one carry signal C. For example, the first stage circuit STG(1) may output first to fourth gate signals SCOUT(1) to SCOUT(4) and a first carry signal C(1), and the second stage circuit STG(2) may output fifth to eighth gate signals SCOUT(5) to SCOUT(8) and a second carry signal C(2).
The number of gate signals output from the first to kth stage circuits STG(1) to STG(k) may match the number of gate lines which are provided in the display panel. The number of stage circuits “k” may be ¼ of the number of gate lines “n.” That is, k may be n/4 (i.e., k=n/4).
As described above, when the number of stage circuits “k” is designed to be ¼ of the number of gate lines “n,” a mount area of the gate driving circuit 13 may be reduced, and thus, a bezel size of the display panel may be reduced.
As illustrated in
The M and Q node controller BK1 may start an operation, based on a ling selection signal LSP applied through a line selection signal line. The M and Q node controller BK1 may charge the Q node Q_o at a first high-level voltage GVDD1 level in response to an input of a previous carry signal C(n−2) and may discharge the Q node Q_o at a third high-level voltage GVSS3 level in response to an input of a start signal VST applied through the start signal line. Also, the M and Q node controller BK1 may charge the Q node Q_o at a forward voltage GVDD_F level applied through a forward voltage line in response to an input of the previous carry signal C(n−2) and may charge the Q node Q_o at a reverse voltage GVDD_R level applied through a reverse voltage line in response to an input of a next carry signal C(n+2). In some implementations, the M and Q node controller BK1 may include a plurality of transistors, and this will be described below.
An Ath transistor Ta and a Bth transistor Tb may transfer the previous carry signal C(n−2) to an M node M_o in response to the line selection signal LSP. A gate electrode of each of the Ath transistor Ta and the Bth transistor Tb may be connected to the line selection signal line, through which the line selection signal LSP is applied, in common. A first electrode of the Ath transistor Ta may be connected to a previous carry signal line through which the previous carry signal C(n−2) is applied, a first electrode of the Bth transistor Tb may be connected to a second electrode of the Ath transistor Ta, and the second electrode of the Bth transistor Tb may be connected to the M node M_o. A Cth transistor may include a gate electrode connected to the M node M_o, a first electrode connected to the first high-level voltage line which transfers the first high-level voltage GVDD1, and a second electrode connected to the second electrode of the Ath transistor Ta and the first electrode of the Bth transistor Tb.
A 1Ath transistor T1a and a first transistor T1 may transfer the forward voltage GVDD_F to the Q node Q_o in response to the previous carry signal C(n−2). A gate electrode of each of the 1Ath transistor T1a and the first transistor T1 may be connected to the previous carry signal line, through which the previous carry signal C(n−2) is applied, in common. The first transistor T1 may include a first electrode connected to the forward voltage line which transfers the forward voltage GVDD_F and a second electrode connected to a QH node Qh_o. The 1Ath transistor T1a may include a first electrode connected to the QH node Qh_o and a second electrode connected to the Q node Q_o.
A 1Bth transistor T1b and a 1Cth transistor T1c may transfer the first high-level voltage GVDD1 to the Q node Q_o in response to a voltage of the M node M_o. The 1Bth transistor T1b may include a gate electrode connected to the M node M_o, a first electrode connected to the first high-level voltage line which transfers the first high-level voltage GVDD1, and a second electrode connected to a first electrode of the 1Cth transistor T1c. The 1Cth transistor T1c may include a gate electrode connected to a reset signal line through which a reset signal RESET is applied, a first electrode connected to the second electrode of the 13th transistor T1b, and a second electrode connected to the Q node Q_o.
A 3NBth transistor T3nb and a 3NCth transistor T3nc may transfer a third low-level voltage GVSS3 to the Q node Q_o in response to the start signal VST. A gate electrode of each of the 3NBth transistor T3nb and the 3NCth transistor T3nc may be connected to a start signal line in common. The 3NBth transistor T3nb may include a first electrode connected to the Q node Q_o and a second electrode connected to the QH node Qh_o and a first electrode of the 3NCth transistor T3nc. The 3NCth transistor T3nc may include the first electrode connected to the QH node Qh_o and a second electrode connected to a third low-level voltage line which transfers the third low-level voltage GVSS3.
A 3Nth transistor T3n and a 3NAth transistor T3na may transfer the reverse voltage GVDD_R to the QH node Qh_o and the Q node Q_o in response to the next carry signal C(n+2). A gate electrode of each of the 3Nth transistor T3n and the 3NAth transistor T3na may be connected to the next carry signal line, which transfers the next carry signal C(n+2), in common. The 3Nth transistor T3n may include a first electrode connected to the Q node Q_o and a second electrode connected to the QH node Qh_o and a first electrode of the 3NAth transistor T3na. The 3NAth transistor T3na may include a first electrode connected to the second electrode of the 3Nth transistor T3n and the second electrode connected to the reverse voltage line which transfers the reverse voltage GVDD_R.
A 3Qth transistor T3q may transfer the first high-level voltage GVDD1 to the QH node Qh_o in response to the voltage of the Q node Q_o. The 3Qth transistor T3q may be formed as a dual gate electrode (double gate electrode) type so as to minimize the occurrence of a leakage current. The 3Qth transistor T3q may include a first electrode connected to the first high-level voltage line and a second electrode connected to the QH node Qh_o.
A third transistor T3 and a 3Ath transistor T3a may transfer a third low-level voltage GVSS3 to the QH node Qh_o and the Q node Q_o in response to a voltage of a QB node Qb_o. A gate electrode of each of the third transistor T3 and the 3Ath transistor T3a may be connected to the QB node Qb_o in common. The third transistor T3 may include a first electrode connected to the Q node Q_o and a second electrode connected to a first electrode of the 3Ath transistor T3a. The 3Ath transistor T3a may include the first electrode connected to the QH node Qh_o and the second electrode of the third transistor T3 and a second electrode connected to the third low-level voltage line which transfers the third low-level voltage GVSS3.
The QB node controller BK2 may charge a voltage of the QB node Qb_o, based on the voltage of the Q node Q_o. In some implementations, the QB node controller BK2 may include a plurality of transistors, and this will be described below.
A 41st transistor T41 may include a gate electrode and a first electrode, which are connected to a second high-level voltage line transferring the second high-level voltage GVDD2, and a second electrode connected to a gate electrode of a fourth transistor T4 and a first electrode of a 4Qth transistor T4q. The 41st transistor T41 may be formed as a dual gate electrode (double gate electrode) type so as to minimize the occurrence of a leakage current. The fourth transistor T4 may transfer the second high-level voltage GVDD2 to the QB node Qb_o in response to the second high-level voltage GVDD2. The fourth transistor T4 may include a first electrode connected to the second high-level voltage line and a second electrode connected to the QB node Qb_o. The 4Qth transistor T4q may transfer the second low-level voltage GVSS2 to the gate electrode of the fourth transistor T4 in response to the voltage of the Q node Q_o. The 4Qth transistor T4q may include a gate electrode connected to the Q node Q_o, a first electrode connected to the gate electrode of the fourth transistor T4, and a second electrode connected to the second low-level voltage line.
A 5Qth transistor T5q may transfer the third low-level voltage GVSS3 to the QB node Qb_o in response to the voltage of the Q node Q_o. The 5Qth transistor T5q may include a gate electrode connected to the Q node Q_o, a first electrode connected to the QB node Qb_o, and a second electrode connected to the third low-level voltage line.
Moreover, the QB node controller BK2 may transfer the third low-level voltage GVSS3 to the QB node Qb_o with the forward voltage GVDD_F or the reverse voltage GVDD_R which is applied in response to the previous carry signal C(n−2) or the next carry signal C(n+2). A 55th transistor T5s may transfer the forward voltage GVDD_F to a gate electrode of a fifth transistor T5 in response to the previous carry signal C(n−2). The 5th transistor T5s may include a gate electrode connected to the previous carry signal line, a first electrode connected to the gate electrode of the fifth transistor T5, and a second electrode connected to the forward voltage line. A 5Nth transistor T5n may transfer the reverse voltage GVDD_R to the gate electrode of the fifth transistor T5 in response to the next carry signal C(n+2). The 5Nth transistor T5n may include a gate electrode connected to the next carry signal line, a first electrode connected to the gate electrode of the fifth transistor T5, and a second electrode connected to the reverse voltage line. A 5Hth transistor T5h may transfer the third low-level voltage GVSS3 to the gate electrode of the fifth transistor T5 in response to the voltage of the QB node Qb_o. The 5Hth transistor T5h may include a gate electrode connected to the QB node Qb_o, a first electrode connected to the gate electrode of the fifth transistor T5, and a second electrode connected to the third low-level voltage line.
Moreover, the QB node controller BK2 may transfer the third low-level voltage GVSS3 to the QB node Qb_o in response to the reset signal RESET and a voltage of the M node M_o. A 5Ath transistor T5a may include a gate electrode connected to the reset signal line, a first electrode connected to the QB node Qb_o, and a second electrode connected to a first electrode of a 5Bth transistor T5b. The 5Bth transistor T5b may include a gate electrode connected to the M node M_o, a first electrode connected to the second electrode of the 5Ath transistor T5a, and a second electrode connected to the third low-level voltage line.
The signal output unit BK3 may output a carry clock CRCLK(n) as a carry signal C(n) of an on voltage and first to fourth scan clocks SCCLK(n) to SCCLK(n+3) as first to fourth scan signals SCOUT(n) to SCOUT(n+3) of an on voltage, while the Q node Q_o is being charged at an on voltage level. The signal output unit BK3 may output the third low-level voltage GVSS3 as a carry signal C(n) of an off voltage and the second low-level voltage GVSS2 as the first to fourth scan signals SCOUT(n) to SCOUT(n+3) of an off voltage, while the QB node Qb_o is being charged at an on voltage level. In some implementations, the signal output unit BK3 may include a plurality of transistors and a plurality of capacitors, and this will be described below.
A 6CRth transistor T6cr and a 7CRth transistor T7cr may output the carry signal C(n). The 6CRth transistor T6cr may include a gate electrode connected to the Q node Q_o, a first electrode connected to a carry clock line transferring the carry clock CRCLK(n), and a second electrode connected to a carry signal output line. A carry capacitor Cap_CR may bootstrap the Q node Q_o, based on the carry clock CRCLK(n). The carry capacitor Cap_CR may include a first electrode and a second electrode, which are respectively connected to the gate electrode and the second electrode of the 6CRth transistor T6cr. The 7CRth transistor T7cr may include a gate electrode connected to the QB node Qb_o, a first electrode connected to the carry signal output line, and a second electrode connected to the third low-level voltage line.
Four sixth transistors T6 and four seventh transistors T7 may output the first to fourth scan signals SCOUT(n) to SCOUT(n+3). The four sixth transistors T6 may respectively include gate electrodes connected to the Q node Q_o, first electrodes divisionally connected to first to fourth scan clock lines, and second electrodes divisionally connected to first to fourth scan signal output lines. Four scan capacitors Cap_SC may bootstrap the Q node Q_o, based on the first to fourth scan clocks SCCLK(n) to SCCLK(n+3). The four scan capacitors Cap_SC may each include a first electrode and a second electrode, which are respectively connected to the gate electrode and the second electrode of each of the four sixth transistors T6. The four seventh transistors T7 may respectively include gate electrodes connected to the QB node Qb_o, first electrodes divisionally connected to the scan signal output line, and second electrodes connected to the first low-level voltage line in common.
As illustrated in
As in an embodiment, a carry signal transfer method of a gate driving circuit may be changed for dividing each of the first touch frame 1_T-Frame and the second touch frame 2_T-Frame by ½. This will be described below with reference to
First, a gate driving circuit according to an embodiment may operate so that touch sensing (see a sensing area) is performed on an upper ½ region of a display panel during the first touch frame 1_T-Frame. The gate driving circuit may be set to a forward condition so that a carry signal C is generated in an upper region of the display panel and may be set so that a start signal VST is applied to a first stage circuit (or a first dummy stage circuit arranged at a front end with respect to the first stage circuit) where a first gate line is disposed.
In this case, the gate driving circuit may start an operation from the first stage circuit to output the carry signal C, and although not shown, may output a scan signal so that touch sensing is performed for a touch sensing time T. Also, such an operation may be performed sequentially up to an fth stage circuit, where a gate line is disposed in a center region of the display panel, from a first stage circuit where a first gate line of the display panel is disposed.
Subsequently, the gate driving circuit according to an embodiment may operate so that touch sensing (see a sensing area) is performed on a lower ½ region of the display panel during the second touch frame 2_T-Frame. The gate driving circuit may be set to a reverse condition so that the carry signal C is generated in a lower region of the display panel and may be set so that the start signal VST is applied to a kth stage circuit (or a kth dummy stage circuit arranged at a next end with respect to the kth stage circuit) where a last gate line is disposed.
In this case, the gate driving circuit may start an operation from the kth stage circuit to output the carry signal C, and although not shown, may output the scan signal so that touch sensing is performed for the touch sensing time T. Also, such an operation may be performed sequentially up to an f+1th stage circuit, where a gate line is disposed in the center region of the display panel, from the kth stage circuit where the last gate line of the display panel is disposed.
Hereinafter, a gate driving circuit implemented based on the stages of
As illustrated in
When the driving condition of the gate driving circuit is set to forward, a set signal SET may be transferred (forward direction) from an Ath stage STG(a) to a Bth stage STG(b) and from the Bth stage STG(b) to a Cth stage STG(c). On the other hand, a reset signal RESET may be transferred (reverse direction) from the Cth stage STG(c) to the Bth stage STG(b) and from the Bth stage STG(b) to the Ath stage STG(a).
As illustrated in
The carry clocks CRCLK1 to CRCLK3 may be generated to each have an on pulse width of at least two horizontal period 2H. In this case, the carry clocks CRCLK1 to CRCLK3 may be generated so that on pulse width generating times do not overlap per off pulse width of at least two horizontal period 2H. For example, an off pulse separation time of at least two horizontal period 2H may be between an on pulse of the first carry clock CRCLK1 and the second carry clock CRCLK2.
The scan clocks SCLK1 to SCLK12 may be generated to each have an on pulse width of at least two horizontal periods 2H. In this case, the scan clocks SCLK1 to SCLK12 may be generated so that on pulse width generating times sequentially overlap per one horizontal period which is half of two horizontal period 2H. For example, an on pulse overlap time of at least one horizontal time may be between an on pulse of the first scan clock SCLK1 and the second scan clock SCLK2.
As in
As in
Moreover, in
As illustrated in
When the driving condition of the gate driving circuit is set to reverse, a set signal SET may be transferred (reverse direction) from a Cth stage STG(c) to a Bth stage STG(b) and from the Bth stage STG(b) to an Ath stage STG(a). On the other hand, a reset signal RESET may be transferred (forward direction) from the Ath stage STG(a) to the Bth stage STG(b) and from the Bth stage STG(b) to the Cth stage STG(c).
As illustrated in
A generating condition of the carry clocks CRCLK1 to CRCLK3 and the scan clocks SCLK1 to SCLK12 may be as described above with reference to
As in
As in
Moreover, in
Furthermore, in
The comparative example of
Comparing the comparative example of
In an embodiment, although a touch frame is divided into two touch frames, because the carry signal transfer time CT decreases by about half (CT/2), a time may be more sufficient than the comparative example, and thus, sensitivity based on a touch sensing operation may be enhanced. Also, touch data may be obtained, and moreover, a time for analyzing coordinates of a touch input position may be secured.
Hereinabove, the present disclosure may decrease a carry signal transfer time to secure a touch sensing time, and based thereon, may enhance sensitivity based on a touch sensing operation. Also, the present disclosure may increase an obtainment target (a touch screen block) of touch data and may secure a time for analyzing coordinates of a touch input position.
The effects according to the present disclosure are not limited to the above examples, and other various effects may be included in the specification.
While the present disclosure has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present disclosure including the following claims.
The various embodiments described above can be combined to provide further embodiments. Aspects of the embodiments can be modified, if necessary to employ concepts of the various embodiments to provide yet further embodiments.
These and other changes can be made to the embodiments in light of the above-detailed description. In general, in the following claims, the terms used should not be construed to limit the claims to the specific embodiments disclosed in the specification and the claims, but should be construed to include all possible embodiments along with the full scope of equivalents to which such claims are entitled. Accordingly, the claims are not limited by the disclosure.
| Number | Date | Country | Kind |
|---|---|---|---|
| 10-2024-0003376 | Jan 2024 | KR | national |