ALCATERA LLC

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Los Angeles, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with a sample holder fed with electromagn...
- Patent number 11,674,976
- Issue date Jun 13, 2023
- ALCATERA INC.
- Marco Farina
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGN...
- Publication number 20220074968
- Publication date Mar 10, 2022
- ALCATERA LLC
- Marco Farina
- G01 - MEASURING TESTING