GLOBALFOUNDERS Inc.

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Cayman Islands, KY

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test structure and method for forming the same
- Patent number 10,699,973
- Issue date Jun 30, 2020
- GLOBALFOUNDERS INC.
- Anthony K. Stamper
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONSTRAINING EPITAXIAL GROWTH ON FINS OF A FINFET DEVICE
- Publication number 20150372139
- Publication date Dec 24, 2015
- GLOBALFOUNDERS Inc.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-COUPLING-BASED DESIGN USING DIFFUSION CONTACT STRUCTURES
- Publication number 20140131816
- Publication date May 15, 2014
- GLOBALFOUNDERS Inc.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEOL ANTI-FUSE STRUCTURES FOR GATE LAST SEMICONDUCTOR DEVICES
- Publication number 20130062728
- Publication date Mar 14, 2013
- GLOBALFOUNDERS Inc.
- Andreas Kurz
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks