Adolphus E. MCCLANAHAN

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Garland, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Seal monitor for probe or test chamber
- Patent number 10,732,218
- Issue date Aug 4, 2020
- Texas Instruments Incorporated
- Adolphus E. McClanahan
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and temperature stabilizer for testing semiconductor dev...
- Patent number 7,495,458
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Adolphus E. McClanahan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the probing of a wafer
- Patent number 7,068,056
- Issue date Jun 27, 2006
- Texas Instruments Incorporated
- Byron H. Gibbs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEAL MONITOR FOR PROBE OR TEST CHAMBER
- Publication number 20170059442
- Publication date Mar 2, 2017
- TEXAS INSTRUMENTS INCORPORATED
- ADOLPHUS E. MCCLANAHAN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TEMPERATURE STABILIZER FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20090115441
- Publication date May 7, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Adolphus E. MCCLANAHAN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TEMPERATURE STABILIZER FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20070268029
- Publication date Nov 22, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Adolphus E. McClanahan
- G01 - MEASURING TESTING
Information Patent Application
System and method for the probing of a wafer
- Publication number 20060071679
- Publication date Apr 6, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Byron H. Gibbs
- G01 - MEASURING TESTING