Aki Urakami

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Output circuit of semiconductor device having adjustable driving ca...
- Patent number 6,794,909
- Issue date Sep 21, 2004
- Renesas Technology Corp.
- Aki Urakami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit with efficient testing arrangement
- Patent number 6,345,005
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Aki Urakami
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit with efficient testing arrangement
- Publication number 20010043485
- Publication date Nov 22, 2001
- Aki Urakami
- G11 - INFORMATION STORAGE