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Akihiko Nakano
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Nara-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
6,759,722
Issue date
Jul 6, 2004
Sharp Kabushiki Kaisha
Eiji Yanagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device wherein detection of removal of wiring trigger...
Patent number
6,545,371
Issue date
Apr 8, 2003
Sharp Kabushiki Kaisha
Hironori Matsumoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
6,472,730
Issue date
Oct 29, 2002
Sharp Kabushiki Kaisha
Eiji Yanagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for observing a reaction process by transmission electron mi...
Patent number
6,005,248
Issue date
Dec 21, 1999
Sharp Kabushiki Kaisha
Kayoko Mori
G01 - MEASURING TESTING
Information
Patent Grant
Impurity free reference grid for use charged partiole beam spectros...
Patent number
5,336,895
Issue date
Aug 9, 1994
Sharp Kabushiki Kaisha
Akihiko Nakano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for inspecting a semiconductor device
Patent number
5,301,002
Issue date
Apr 5, 1994
Sharp Kabushiki Kaisha
Akihiko Nakano
B24 - GRINDING POLISHING
Information
Patent Grant
Apparatus and a method for checking a semiconductor
Patent number
5,132,507
Issue date
Jul 21, 1992
Sharp Kabushiki Kaisha
Akihiko Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and a method for checking a semiconductor
Patent number
5,089,774
Issue date
Feb 18, 1992
Sharp Kabushiki Kaisha
Akihiko Nakano
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
semiconductor device and method of manufacturing the same
Publication number
20010028115
Publication date
Oct 11, 2001
Eiji Yanagawa
H01 - BASIC ELECTRIC ELEMENTS