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Akihiro Masuda
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Nishiwaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Contact probe and probe device
Patent number
7,015,710
Issue date
Mar 21, 2006
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,937,042
Issue date
Aug 30, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,919,732
Issue date
Jul 19, 2005
Genesis Technology Incorporation
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,917,211
Issue date
Jul 12, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,903,563
Issue date
Jun 7, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,900,647
Issue date
May 31, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and probe device
Patent number
6,710,608
Issue date
Mar 23, 2004
Mitsubishi Materials Corporation
Hideaki Yoshida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Contact probe and probe device
Publication number
20050007130
Publication date
Jan 13, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20050001642
Publication date
Jan 6, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20050001641
Publication date
Jan 6, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20050001643
Publication date
Jan 6, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20050001644
Publication date
Jan 6, 2005
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20040160236
Publication date
Aug 19, 2004
Genesis Technology Incorporated
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Contact probe and probe device
Publication number
20020186030
Publication date
Dec 12, 2002
MITSUBISHI MATERIALS CORPORATION
Hideaki Yoshida
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE AND PROBE DEVICE
Publication number
20010019276
Publication date
Sep 6, 2001
HIDEAKI YOSHIDA
G01 - MEASURING TESTING