Alan P. Aronoff

Follow

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 11,650,244
- Issue date May 16, 2023
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing and emulation of integrated circuits
- Patent number 5,331,571
- Issue date Jul 19, 1994
- NEC Electronics, Inc.
- Alan P. Aronoff
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
- Publication number 20230280392
- Publication date Sep 7, 2023
- Alan Paul Aronoff
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
- Publication number 20210389364
- Publication date Dec 16, 2021
- Alan Paul Aronoff
- G01 - MEASURING TESTING
Information Patent Application
System for Optimizing Semiconductor Yield and enabling Product Trac...
- Publication number 20210389754
- Publication date Dec 16, 2021
- Alan Paul Aronoff
- G05 - CONTROLLING REGULATING