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Aniketa A. Shinde
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Upland, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor suitable for use in photoanode
Patent number
11,605,746
Issue date
Mar 14, 2023
California Institute of Technology
John M. Gregoire
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Grant
Oxygen evolution reaction catalysis
Patent number
11,047,054
Issue date
Jun 29, 2021
California Institute of Technology
John M Gregoire
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
Scanning drop sensor
Patent number
9,645,109
Issue date
May 9, 2017
California Institute of Technology
Jian Jin
G01 - MEASURING TESTING
Information
Patent Grant
Oxygen evolution reaction catalysis
Patent number
9,435,043
Issue date
Sep 6, 2016
California Institute of Technology
Joel A. Haber
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Patents Applications
last 30 patents
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Patent Application
OXYGEN EVOLUTION REACTION CATALYSIS
Publication number
20220056601
Publication date
Feb 24, 2022
California Institute of Technology
John M. Gregoire
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
SEMICONDUCTOR SUITABLE FOR USE IN PHOTOANODE
Publication number
20210111290
Publication date
Apr 15, 2021
California Institute of Technology
John M. Gregoire
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OXYGEN EVOLUTION REACTION CATALYSIS
Publication number
20180305831
Publication date
Oct 25, 2018
California Institute of Technology
John M. Gregoire
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
OXYGEN EVOLUTION REACTION CATALYSIS
Publication number
20150292095
Publication date
Oct 15, 2015
THE CALIFORNIA INSTITUTE OF TECHNOLOGY
Joel A. Haber
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
SCANNING DROP SENSOR
Publication number
20150212036
Publication date
Jul 30, 2015
California Institute of Technology
Jian Jin
G01 - MEASURING TESTING