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Balwant Singh
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Greater Noida, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Scheme to measure individually rise and fall delays of non-invertin...
Patent number
10,386,412
Issue date
Aug 20, 2019
STMicroelectronics International N.V.
Saurabh Kumar Singh
G01 - MEASURING TESTING
Information
Patent Grant
Scheme to measure individually rise and fall delays of non-invertin...
Patent number
9,804,225
Issue date
Oct 31, 2017
STMicroelectronics International N.V.
Saurabh Kumar Singh
G01 - MEASURING TESTING
Information
Patent Grant
Flexible on chip testing circuit for I/O's characterization
Patent number
7,772,833
Issue date
Aug 10, 2010
STMicroelectronics Pvt. Ltd.
Narayanan Vijayaraghavan
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for measuring maximum operating frequency and cor...
Patent number
7,710,101
Issue date
May 4, 2010
STMicroelectronics Pvt. Ltd.
Vijayaraghavan Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Resolution in measuring the pulse width of digital signals
Patent number
7,516,032
Issue date
Apr 7, 2009
STMicroelectronics Pvt. Ltd.
Balwant Singh
G01 - MEASURING TESTING
Information
Patent Grant
On-chip storage memory for storing variable data bits
Patent number
7,372,755
Issue date
May 13, 2008
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-chip and at-speed tester for testing and characterization of dif...
Patent number
7,353,442
Issue date
Apr 1, 2008
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G11 - INFORMATION STORAGE
Information
Patent Grant
Glitch free controlled ring oscillator and associated methods
Patent number
7,332,978
Issue date
Feb 19, 2008
STMicroelectronics Pvt. Ltd.
Naveen Tiwari
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Configurable length first-in first-out memory
Patent number
7,321,520
Issue date
Jan 22, 2008
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-chip analysis and computation of transition behavior of embedded...
Patent number
7,248,066
Issue date
Jul 24, 2007
STMicroelectronics Pvt. Ltd.
Ruchir Saraswat
G01 - MEASURING TESTING
Information
Patent Grant
Digital circuit for frequency and timing characterization
Patent number
7,242,179
Issue date
Jul 10, 2007
STMicroelectronics Pvt. Ltd.
Ruchir Saraswat
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of timing skew between two digital signals
Patent number
7,058,911
Issue date
Jun 6, 2006
STMicroelectronics Pvt. Ltd.
Balwant Singh
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SCHEME TO MEASURE INDIVIDUALLY RISE AND FALL DELAYS OF NON INVERTIN...
Publication number
20170370991
Publication date
Dec 28, 2017
STMicroelectronics International N.V.
Saurabh Kumar Singh
G01 - MEASURING TESTING
Information
Patent Application
SCHEME TO MEASURE INDIVIDUALLY RISE AND FALL DELAYS OF NON-INVERTIN...
Publication number
20160061894
Publication date
Mar 3, 2016
STMicroelectronics International N.V
Saurabh Kumar Singh
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE ON CHIP TESTING CIRCUIT FOR I/O'S CHARACTERIZATION
Publication number
20090076753
Publication date
Mar 19, 2009
STMicroelectronics Pvt. Ltd.
Narayanan Vijayaraghavan
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE ON CHIP TESTING CIRCUIT FOR I/O'S CHARACTERIZATION
Publication number
20080231310
Publication date
Sep 25, 2008
STMICROELECTRONICS PVT. LTD.
Narayanan Vijayaraghavan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING MAXIMUM OPERATING FREQUENCY AND COR...
Publication number
20080030186
Publication date
Feb 7, 2008
STMICROELECTRONICS PVT. LTD.
Vijayaraghavan NARAYANAN
G01 - MEASURING TESTING
Information
Patent Application
Configurable length first-in first-out memory
Publication number
20060256636
Publication date
Nov 16, 2006
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Glitch free controlled ring oscillator and associated methods
Publication number
20060132246
Publication date
Jun 22, 2006
STMicroelectronics Pvt. Ltd.
Naveen Tiwari
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
On-chip and at-speed tester for testing and characterization of dif...
Publication number
20050246602
Publication date
Nov 3, 2005
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G01 - MEASURING TESTING
Information
Patent Application
On-chip storage memory for storing variable data bits
Publication number
20050232028
Publication date
Oct 20, 2005
STMicroelectronics Pvt. Ltd.
Swapnil Bahl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Digital circuit for frequency and timing characterization
Publication number
20050182586
Publication date
Aug 18, 2005
STMicroelectronics Pvt. Ltd.
Ruchir Saraswat
G01 - MEASURING TESTING
Information
Patent Application
On-chip analysis & computation of transition behaviour of embedded...
Publication number
20050174102
Publication date
Aug 11, 2005
STMicroelectronics Pvt. Ltd.
Ruchir Saraswat
G01 - MEASURING TESTING
Information
Patent Application
Resolution in measuring the pulse width of digital signals
Publication number
20030154043
Publication date
Aug 14, 2003
STMicroelectronics Pvt. Ltd.
Balwant Singh
G01 - MEASURING TESTING
Information
Patent Application
Measurement of timing skew between two digital signals
Publication number
20030117868
Publication date
Jun 26, 2003
STMicroelectronics Pvt. Ltd.
Balwant Singh
G11 - INFORMATION STORAGE