Christof Baur

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Patterned atomic layer epitaxy
- Patent number 7,799,132
- Issue date Sep 21, 2010
- Zyvex Labs, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,675,300
- Issue date Mar 9, 2010
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Patterned atomic layer epitaxy
- Patent number 7,326,293
- Issue date Feb 5, 2008
- Zyvex Labs, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,319,336
- Issue date Jan 15, 2008
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Probe current imaging
- Patent number 7,285,778
- Issue date Oct 23, 2007
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Positioning device for microscopic motion
- Patent number 7,196,454
- Issue date Mar 27, 2007
- Zyvex Corporation
- Christof Baur
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Systems and method for picking and placing of nanoscale objects uti...
- Patent number 6,987,277
- Issue date Jan 17, 2006
- Zyvex Corporation
- Christof Baur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nano-manipulation by gyration
- Patent number 6,812,460
- Issue date Nov 2, 2004
- Zyvex Corporation
- Richard E. Stallcup
- G01 - MEASURING TESTING
Information Patent Grant
System and method for accurate positioning of a scanning probe micr...
- Patent number 6,608,307
- Issue date Aug 19, 2003
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
- Publication number 20080150557
- Publication date Jun 26, 2008
- ZYVEX INSTRUMENTS, LLC
- Christof BAUR
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED ATOMIC LAYER EPITAXY
- Publication number 20080092803
- Publication date Apr 24, 2008
- ZYVEX LABS, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Application
Charged particle beam device probe operation
- Publication number 20060192116
- Publication date Aug 31, 2006
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Patterned atomic layer epitaxy
- Publication number 20050223968
- Publication date Oct 13, 2005
- Zyvex Corporation
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Application
Probe tip processing
- Publication number 20050184028
- Publication date Aug 25, 2005
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Probe current imaging
- Publication number 20050184236
- Publication date Aug 25, 2005
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Positioning device for microscopic motion
- Publication number 20050184623
- Publication date Aug 25, 2005
- Zyvex Corporation
- Christof Baur
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
System and method for picking and placing of nanoscale objects util...
- Publication number 20050077468
- Publication date Apr 14, 2005
- Zyvex Corporation
- Christof Baur
- B82 - NANO-TECHNOLOGY

Christof Baur

Person

Patents Grantslast 30 patents

Patterned atomic layer epitaxy

Charged particle beam device probe operation

Patterned atomic layer epitaxy

Charged particle beam device probe operation

Probe current imaging

Positioning device for microscopic motion

Systems and method for picking and placing of nanoscale objects uti...

Nano-manipulation by gyration

System and method for accurate positioning of a scanning probe micr...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE PROBE OPERATION

PATTERNED ATOMIC LAYER EPITAXY

Charged particle beam device probe operation

Patterned atomic layer epitaxy

Probe tip processing

Probe current imaging

Positioning device for microscopic motion

System and method for picking and placing of nanoscale objects util...