Chung-Seog Oh

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Yuseong-gu, KR

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Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscope with probe with improved tip movement
- Patent number 7,246,517
- Issue date Jul 24, 2007
- Korea Institute of Machinery & Materials
- Hak-Joo Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Atomic force microscope with probe with improved tip movement
- Publication number 20060243036
- Publication date Nov 2, 2006
- Hak-Joo Lee
- G01 - MEASURING TESTING