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Edmund H, Linfield
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Cambridgeshire, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Laser system for imaging and materials analysis
Patent number
10,180,397
Issue date
Jan 15, 2019
The University of Queensland
Aleksandar D. Rakic
G01 - MEASURING TESTING
Information
Patent Grant
Oxide removal from semiconductor surfaces using a flux of indium atoms
Patent number
9,263,264
Issue date
Feb 16, 2016
University of Leeds
Lianhe Li
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Generating and detecting radiation
Patent number
8,809,092
Issue date
Aug 19, 2014
Edmund Linfield
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz radiation sources and methods
Patent number
7,498,593
Issue date
Mar 3, 2009
Cambridge University Technical Services Limited
Yao-chun Shen
G01 - MEASURING TESTING
Information
Patent Grant
THz semiconductor laser incorporating a controlled plasmon confinem...
Patent number
7,382,806
Issue date
Jun 3, 2008
INFM Istituto Nazionale per La Fisica Della Materia
Alessandro Tredicucci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for generating THz radiation
Patent number
7,122,813
Issue date
Oct 17, 2006
Cambridge University Technical Services Limited
Edmund Harold Linfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical device and imaging system
Patent number
6,388,799
Issue date
May 14, 2002
Toshiba Research Europe Limited
Donald Dominic Arnone
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
A LASER SYSTEM FOR IMAGING AND MATERIALS ANALYSIS
Publication number
20160202180
Publication date
Jul 14, 2016
The University of Queensland
Aleksandar D. RAKIC
G01 - MEASURING TESTING
Information
Patent Application
OXIDE REMOVAL FROM SEMICONDUCTOR SURFACES
Publication number
20140008767
Publication date
Jan 9, 2014
Lianhe Li
B82 - NANO-TECHNOLOGY
Information
Patent Application
GENERATING AND DETECTING RADIATION
Publication number
20120113417
Publication date
May 10, 2012
Edmund Linfield
C30 - CRYSTAL GROWTH
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING TERAHERTZ-ABSORPTION CHARACTERIS...
Publication number
20110310379
Publication date
Dec 22, 2011
University of Leeds
Matthew Byrne
G01 - MEASURING TESTING
Information
Patent Application
Terahertz radiation sources and methods
Publication number
20070034813
Publication date
Feb 15, 2007
Yao-chun Shen
G01 - MEASURING TESTING
Information
Patent Application
Terahertz spectroscopy
Publication number
20060049356
Publication date
Mar 9, 2006
Yaochun Shen
G01 - MEASURING TESTING
Information
Patent Application
Thz semiconductor laser incorporating a controlled plasmon confinem...
Publication number
20050117618
Publication date
Jun 2, 2005
Alessandro Tredicucci
B82 - NANO-TECHNOLOGY
Information
Patent Application
Device for generating thz radiation
Publication number
20040238760
Publication date
Dec 2, 2004
Edmund Harold Linfield
G02 - OPTICS