Eisuke Morisaki

Person

Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer holder for manufacturing semiconductor
- Patent number D766850
- Issue date Sep 20, 2016
- TOKYO ELECTRON LIMITED
- Eisuke Morisaki
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Film deposition apparatus and film deposition method
- Patent number 8,696,814
- Issue date Apr 15, 2014
- Tokyo Electron Limited
- Eisuke Morisaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Film deposition apparatus and method
- Patent number 8,440,270
- Issue date May 14, 2013
- Tokyo Electron Limited
- Eisuke Morisaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Forming method of amorphous carbon film, amorphous carbon film, mul...
- Patent number 8,409,460
- Issue date Apr 2, 2013
- Tokyo Electron Limited
- Hiraku Ishikawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Film forming apparatus and method
- Patent number 8,328,943
- Issue date Dec 11, 2012
- Tokyo Electron Limited
- Eisuke Morisaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thermal processing apparatus
- Patent number 6,630,991
- Issue date Oct 7, 2003
- Tokyo Electron Limited
- Masayuki Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Radiation temperature measuring method and radiation temperature me...
- Patent number 6,488,407
- Issue date Dec 3, 2002
- Tokyo Electron Limited
- Masayuki Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Thermal treatment method and apparatus
- Patent number 6,473,993
- Issue date Nov 5, 2002
- Tokyo Electron Limited
- Yasushi Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual blackbody radiation system and radiation temperature measur...
- Patent number 6,467,952
- Issue date Oct 22, 2002
- Tokyo Electron Limited
- Eisuke Morisaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR TRANSFERRING SUBSTRATE FOR FORMING COMPUND SE...
- Publication number 20160148829
- Publication date May 26, 2016
- TOKYO ELECTRON LIMITED
- Eisuke MORISAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEAT TREATMENT DEVICE
- Publication number 20140174364
- Publication date Jun 26, 2014
- TOKYO ELECTRON LIMITED
- Ken Nakao
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SURFACE PROCESSING METHOD AND SURFACE PROCESSING APPARATUS
- Publication number 20120128892
- Publication date May 24, 2012
- TOKYO ELECTRON LIMITED
- Noriaki TOYODA
- C30 - CRYSTAL GROWTH
Information Patent Application
FORMING METHOD OF AMORPHOUS CARBON FILM, AMORPHOUS CARBON FILM, MUL...
- Publication number 20100105213
- Publication date Apr 29, 2010
- TOKYO ELECTRON LIMITED
- Hiraku Ishikawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FILM DEPOSITION APPARATUS AND FILM DEPOSITION METHOD
- Publication number 20100092666
- Publication date Apr 15, 2010
- TOKYO ELECTRON LIMITED
- Eisuke Morisaki
- C30 - CRYSTAL GROWTH
Information Patent Application
FILM FORMING APPARATUS AND METHOD
- Publication number 20100047448
- Publication date Feb 25, 2010
- Tokyo Electron Limited
- Eisuke Morisaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FILM DEPOSITION APPARATUS AND METHOD
- Publication number 20100015359
- Publication date Jan 21, 2010
- Tokyo Electron Limited
- Eisuke Morisaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
VIRTUAL BLACKBODY RADIATION SYSTEM AND RADIATION TEMPERATURE MEASUR...
- Publication number 20020106000
- Publication date Aug 8, 2002
- Eisuke Morisaki
- G01 - MEASURING TESTING
Information Patent Application
Thermal processing apparatus
- Publication number 20020020696
- Publication date Feb 21, 2002
- Masayuki Kitamura
- G01 - MEASURING TESTING

Eisuke Morisaki

Person

Patents Grantslast 30 patents

Wafer holder for manufacturing semiconductor

Film deposition apparatus and film deposition method

Film deposition apparatus and method

Forming method of amorphous carbon film, amorphous carbon film, mul...

Film forming apparatus and method

Thermal processing apparatus

Radiation temperature measuring method and radiation temperature me...

Thermal treatment method and apparatus

Virtual blackbody radiation system and radiation temperature measur...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR TRANSFERRING SUBSTRATE FOR FORMING COMPUND SE...

HEAT TREATMENT DEVICE

SURFACE PROCESSING METHOD AND SURFACE PROCESSING APPARATUS

FORMING METHOD OF AMORPHOUS CARBON FILM, AMORPHOUS CARBON FILM, MUL...

FILM DEPOSITION APPARATUS AND FILM DEPOSITION METHOD

FILM FORMING APPARATUS AND METHOD

FILM DEPOSITION APPARATUS AND METHOD

VIRTUAL BLACKBODY RADIATION SYSTEM AND RADIATION TEMPERATURE MEASUR...

Thermal processing apparatus