Erik Michiel Franken

Person

Nuenen, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and correction of optical aberrations in charged partic...
- Patent number 11,990,315
- Issue date May 21, 2024
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
- Patent number 11,887,809
- Issue date Jan 30, 2024
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for quantum computing based sample analysis
- Patent number 11,799,486
- Issue date Oct 24, 2023
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,756,762
- Issue date Sep 12, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for quantum computing based sample analysis
- Patent number 11,501,197
- Issue date Nov 15, 2022
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,257,656
- Issue date Feb 22, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using convolution neural networks for on-the-fly single particle re...
- Patent number 11,151,356
- Issue date Oct 19, 2021
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of imaging a sample using an electron microscope
- Patent number 10,937,625
- Issue date Mar 2, 2021
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Innovative imaging technique in transmission charged particle micro...
- Patent number 10,825,647
- Issue date Nov 3, 2020
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent pre-scan in scanning transmission charged particle micr...
- Patent number 10,665,419
- Issue date May 26, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting particulate radiation
- Patent number 10,389,955
- Issue date Aug 20, 2019
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting particulate radiation
- Patent number 10,122,946
- Issue date Nov 6, 2018
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 8,912,491
- Issue date Dec 16, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY
- Publication number 20250125116
- Publication date Apr 17, 2025
- FEI Company
- Erik Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES
- Publication number 20240402103
- Publication date Dec 5, 2024
- FEI Company
- Erik Michiel Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20230377835
- Publication date Nov 23, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...
- Publication number 20230274908
- Publication date Aug 31, 2023
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRITICAL DIMENSION MEASUREMENT IN 3D WITH GEOMETRIC MODELS
- Publication number 20230245334
- Publication date Aug 3, 2023
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC PARTICLE BEAM FOCUSING
- Publication number 20230245291
- Publication date Aug 3, 2023
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTO-TUNING STAGE SETTLING TIME WITH FEEDBACK IN CHARGED PARTICLE M...
- Publication number 20230238207
- Publication date Jul 27, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS
- Publication number 20230170910
- Publication date Jun 1, 2023
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY
- Publication number 20230005702
- Publication date Jan 5, 2023
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20220157557
- Publication date May 19, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20210319975
- Publication date Oct 14, 2021
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS
- Publication number 20210049493
- Publication date Feb 18, 2021
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING CONVOLUTION NEURAL NETWORKS FOR ON-THE-FLY SINGLE PARTICLE RE...
- Publication number 20200272805
- Publication date Aug 27, 2020
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
- Publication number 20200168433
- Publication date May 28, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...
- Publication number 20190295814
- Publication date Sep 26, 2019
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING PARTICULATE RADIATION
- Publication number 20190075258
- Publication date Mar 7, 2019
- FEI Company
- Bart Josef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING PARTICULATE RADIATION
- Publication number 20170134674
- Publication date May 11, 2017
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...
- Publication number 20140145077
- Publication date May 29, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING

Erik Michiel Franken

Person

Patents Grantslast 30 patents

Automatic particle beam focusing

Rotating sample holder for random angle sampling in tomography

Measurement and correction of optical aberrations in charged partic...

Auto-tuning stage settling time with feedback in charged particle m...

Systems and methods for quantum computing based sample analysis

Rotating sample holder for random angle sampling in tomography

Defective pixel management in charged particle microscopy

Systems and methods for quantum computing based sample analysis

Rotating sample holder for random angle sampling in tomography

Using convolution neural networks for on-the-fly single particle re...

Method of imaging a sample using an electron microscope

Innovative imaging technique in transmission charged particle micro...

Intelligent pre-scan in scanning transmission charged particle micr...

Method for detecting particulate radiation

Method for detecting particulate radiation

Method of performing tomographic imaging of a sample in a charged-p...

Patents Applicationslast 30 patents

CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY

METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...

CRITICAL DIMENSION MEASUREMENT IN 3D WITH GEOMETRIC MODELS

AUTOMATIC PARTICLE BEAM FOCUSING

AUTO-TUNING STAGE SETTLING TIME WITH FEEDBACK IN CHARGED PARTICLE M...

SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS

DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS

USING CONVOLUTION NEURAL NETWORKS FOR ON-THE-FLY SINGLE PARTICLE RE...

METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE

INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...

METHOD FOR DETECTING PARTICULATE RADIATION

METHOD FOR DETECTING PARTICULATE RADIATION

METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...