Hans D. Brust

Person

Dudweiler, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for finding a parked vehicle
- Patent number 6,650,999
- Issue date Nov 18, 2003
- Hans-Detlef Brust
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Process and system for measuring the temporal course of a periodic...
- Patent number 5,424,961
- Issue date Jun 13, 1995
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Process and system for measuring the course of a signal at a point...
- Patent number 5,281,909
- Issue date Jan 25, 1994
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Process and system for rapid analysis of the spectrum of a signal a...
- Patent number 5,260,648
- Issue date Nov 9, 1993
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Process and system for the asynchronous measurement of signal courses
- Patent number 5,185,571
- Issue date Feb 9, 1993
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Automatic frequency follow-up in particle beam metrology upon emplo...
- Patent number 4,972,142
- Issue date Nov 20, 1990
- Siemens Aktiengesellschaft
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for phase measurement of signals at a measurin...
- Patent number 4,967,150
- Issue date Oct 30, 1990
- Siemens Aktiengesellschaft
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measurement with an electron probe without external trigger...
- Patent number 4,954,773
- Issue date Sep 4, 1990
- Siemens Aktiengesellschaft
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for recording periodic signals with a laser...
- Patent number 4,902,963
- Issue date Feb 20, 1990
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for operating a scanning microscope
- Patent number 4,902,966
- Issue date Feb 20, 1990
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for detecting and imaging measuring points tha...
- Patent number 4,887,031
- Issue date Dec 12, 1989
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting and imaging a voltage signal of...
- Patent number 4,853,622
- Issue date Aug 1, 1989
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing arrangement
- Patent number 4,831,328
- Issue date May 16, 1989
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying points on a specimen having a...
- Patent number 4,820,977
- Issue date Apr 11, 1989
- Siemens Aktiengesellschaft
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for operating a scanning microscope
- Patent number 4,812,748
- Issue date Mar 14, 1989
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and arrangement for detecting secondary particles triggered...
- Patent number 4,803,357
- Issue date Feb 7, 1989
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for evaluating a test voltage by means of a...
- Patent number 4,780,669
- Issue date Oct 25, 1988
- Siemens Aktiengesellschaft
- Hans D. Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting and imaging measuring points tha...
- Patent number 4,771,235
- Issue date Sep 13, 1988
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for emphasizing a specimen surface region scan...
- Patent number 4,752,686
- Issue date Jun 21, 1988
- Siemens Aktiengesellschaft
- Hans D. Brust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting and imaging a voltage signal of...
- Patent number 4,745,362
- Issue date May 17, 1988
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method for the determination of points on a specimen carrying a spe...
- Patent number 4,689,555
- Issue date Aug 25, 1987
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for spectral analysis of a signal at a measuri...
- Patent number 4,678,988
- Issue date Jul 7, 1987
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for preventing burn-in spots on the picture screen of a vis...
- Patent number 4,677,351
- Issue date Jun 30, 1987
- Siemens Aktiengesellschaft
- Hans-Detlef Brust
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Hans D. Brust

Person

Patents Grantslast 30 patents

Method and device for finding a parked vehicle

Process and system for measuring the temporal course of a periodic...

Process and system for measuring the course of a signal at a point...

Process and system for rapid analysis of the spectrum of a signal a...

Process and system for the asynchronous measurement of signal courses

Automatic frequency follow-up in particle beam metrology upon emplo...

Method and apparatus for phase measurement of signals at a measurin...

Voltage measurement with an electron probe without external trigger...

Method and arrangement for recording periodic signals with a laser...

Method and apparatus for operating a scanning microscope

Method and apparatus for detecting and imaging measuring points tha...

Method and apparatus for detecting and imaging a voltage signal of...

Measurement processing arrangement

Method and apparatus for identifying points on a specimen having a...

Method and apparatus for operating a scanning microscope

Method and arrangement for detecting secondary particles triggered...

Method and arrangement for evaluating a test voltage by means of a...

Method and apparatus for detecting and imaging measuring points tha...

Method and apparatus for emphasizing a specimen surface region scan...

Method and apparatus for detecting and imaging a voltage signal of...

Method for the determination of points on a specimen carrying a spe...

Method and apparatus for spectral analysis of a signal at a measuri...

Circuit for preventing burn-in spots on the picture screen of a vis...