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Hideto Tamezane

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Abnormality determining method, and automatic analyzer
    • Patent number 11,714,095
    • Issue date Aug 1, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,169,166
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,041,874
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Saori Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,288,637
    • Issue date May 14, 2019
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,897,624
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,857,388
    • Issue date Jan 2, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,599,631
    • Issue date Mar 21, 2017
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and method for determining malfunction thereof
    • Patent number 9,470,570
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,335,335
    • Issue date May 10, 2016
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analyzer and Sample Dispensing Method
    • Publication number 20240426851
    • Publication date Dec 26, 2024
    • Hitachi High-Tech Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND DISPENSING METHOD OF REAGENT
    • Publication number 20230341425
    • Publication date Oct 26, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hideto TAMEZANE
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analysis System
    • Publication number 20230123687
    • Publication date Apr 20, 2023
    • Hitachi High-Tech Corporation
    • Shigeru YANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABNORMALITY DETERMINING METHOD, AND AUTOMATIC ANALYZER
    • Publication number 20210341502
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200096529
    • Publication date Mar 26, 2020
    • Hitachi High-Technologies Corporation
    • Saori CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180031589
    • Publication date Feb 1, 2018
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170089938
    • Publication date Mar 30, 2017
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150362514
    • Publication date Dec 17, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150323557
    • Publication date Nov 12, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150219680
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140220693
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR DETERMINING MALFUNCTION THEREOF
    • Publication number 20140190253
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING