Hideyuki Moribe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection method of fine structure object and defect inspec...
- Patent number 8,614,415
- Issue date Dec 24, 2013
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Grant
Photomask mounting/housing device and resist inspection method and...
- Patent number 8,179,523
- Issue date May 15, 2012
- NEC Corporation
- Yoshikazu Katou
- G01 - MEASURING TESTING
Information Patent Grant
Photomask mounting/housing device and resist inspection method and...
- Patent number 8,009,285
- Issue date Aug 30, 2011
- NEC Corporation
- Yoshikazu Katou
- G01 - MEASURING TESTING
Information Patent Grant
Optical exterior inspection apparatus and method
- Patent number 7,773,213
- Issue date Aug 10, 2010
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a pattern
- Patent number 7,436,507
- Issue date Oct 14, 2008
- NEC Corporation
- Hideyuki Moribe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection apparatus and optical inspection method
- Patent number 7,423,745
- Issue date Sep 9, 2008
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Grant
Focusing method
- Patent number 6,664,524
- Issue date Dec 16, 2003
- NEC Corporation
- Yukio Ogura
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PHOTOMASK MOUNTING/HOUSING DEVICE AND RESIST INSPECTION METHOD AND...
- Publication number 20110279816
- Publication date Nov 17, 2011
- YOSHIKAZU KATOU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EXTERIOR INSPECTION APPARATUS AND METHOD
- Publication number 20090262340
- Publication date Oct 22, 2009
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Application
IMAGE FORMING METHOD AND IMAGE FORMING APPARATUS
- Publication number 20090166517
- Publication date Jul 2, 2009
- HIDEYUKI MORIBE
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMASK MOUNTING/HOUSING DEVICE AND RESIST INSPECTION METHOD AND...
- Publication number 20090161098
- Publication date Jun 25, 2009
- YOSHIKAZU KATOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A PATTERN
- Publication number 20070292015
- Publication date Dec 20, 2007
- NEC Corporation
- Hideyuki MORIBE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical inspection apparatus and optical inspection method
- Publication number 20060066844
- Publication date Mar 30, 2006
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Application
Focusing method
- Publication number 20010019100
- Publication date Sep 6, 2001
- NEC Corporation
- Yukio Ogura
- G02 - OPTICS