Hisatoshi IKEDA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional surface potential distribution measurement system
- Patent number 11,333,697
- Issue date May 17, 2022
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional surface potential distribution measurement apparatus
- Patent number 10,041,980
- Issue date Aug 7, 2018
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface potential distribution measuring device
- Patent number 9,714,968
- Issue date Jul 25, 2017
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface potential distribution measuring device and surface potenti...
- Patent number 9,702,915
- Issue date Jul 11, 2017
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Yuichi Tsuboi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL SURFACE POTENTIAL DISTRIBUTION MEASUREMENT SYSTEM
- Publication number 20180348276
- Publication date Dec 6, 2018
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SURFACE POTENTIAL DISTRIBUTION MEASUREMENT APPARATUS
- Publication number 20170160314
- Publication date Jun 8, 2017
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE POTENTIAL DISTRIBUTION MEASURING DEVICE
- Publication number 20160041215
- Publication date Feb 11, 2016
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Masaaki FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE POTENTIAL DISTRIBUTION MEASURING DEVICE AND SURFACE POTENTI...
- Publication number 20140300368
- Publication date Oct 9, 2014
- Toshiba Mitsubishi-Electric Industrial Sys. Corp.
- Yuichi Tsuboi
- G01 - MEASURING TESTING