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In-Seob Kwon
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Incheon, KR
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last 30 patents
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Patent Grant
Semiconductor chip testing apparatus for picking up and testing a s...
Patent number
9,664,706
Issue date
May 30, 2017
SEMICORE INC.
Duk-Soon Choi
G01 - MEASURING TESTING
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Patent Application
SEMICONDUCTOR CHIP TESTING APPARATUS
Publication number
20160154023
Publication date
Jun 2, 2016
Amkor Technology Korea, Inc.
Duk-Soon CHOI
G01 - MEASURING TESTING