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Irene M. Walczak
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Boston, MA, US
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last 30 patents
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Patent Grant
Multiple output referencing system for evanescent wave sensor
Patent number
5,738,992
Issue date
Apr 14, 1998
Chiron Corporation
Thomas A. Cook
G01 - MEASURING TESTING
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Patent Grant
Multiple output referencing system for evanescent wave sensor
Patent number
5,525,466
Issue date
Jun 11, 1996
Ciba Corning Diagnostics Corp.
Rudolf E. Slovacek
G01 - MEASURING TESTING
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Patent Grant
Multiple surface evanescent wave sensor with a reference
Patent number
5,340,715
Issue date
Aug 23, 1994
Ciba Corning Diagnostics Corp.
Rudolf E. Slovacek
G01 - MEASURING TESTING