Jack R. Little, JR.

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Baton Rouge, LA, US

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Patents Grantslast 30 patents

Information Patent Grant
High-resolution, nondestructive imaging of dielectric materials
- Patent number 8,035,400
- Issue date Oct 11, 2011
- Jack R. Little, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution, nondestructive imaging of dielectric materials
- Patent number 7,777,499
- Issue date Aug 17, 2010
- Jack R. Little, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-Resolution, Nondestructive Imaging of Dielectric Materials
- Publication number 20100283483
- Publication date Nov 11, 2010
- Jack R. Little, JR.
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution, Nondestructive Imaging of Dielectric Materials
- Publication number 20090009191
- Publication date Jan 8, 2009
- Jack R. Little, JR.
- G01 - MEASURING TESTING