Jamie Michael Sullivan

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for biological sample processing and analysis
- Patent number 10,344,328
- Issue date Jul 9, 2019
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Methods and systems for analyte detection and analysis
- Patent number 10,273,528
- Issue date Apr 30, 2019
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Systems for biological sample processing and analysis
- Patent number 10,267,790
- Issue date Apr 23, 2019
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 10,060,884
- Issue date Aug 28, 2018
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,970,883
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method for oblique incidence scanning with 2D array of s...
- Patent number 9,891,175
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Systems and methods for run-time alignment of a spot scanning wafer...
- Patent number 9,864,173
- Issue date Jan 9, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,546,962
- Issue date Jan 17, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 9,395,340
- Issue date Jul 19, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced high-speed logarithmic photo-detector for spot scanning sy...
- Patent number 9,389,166
- Issue date Jul 12, 2016
- KLA-Tencor Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 9,208,553
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 8,995,746
- Issue date Mar 31, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems configured to inspect a specimen
- Patent number 7,535,563
- Issue date May 19, 2009
- KLA-Tencor Technologies Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 7,012,683
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneous or sequential multi-perspectiv...
- Patent number 6,922,236
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corp.
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 6,833,913
- Issue date Dec 21, 2004
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for scanning a beam of light across a specimen
- Patent number 6,775,051
- Issue date Aug 10, 2004
- KLA Tencor Technologies
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional UV compatible programmable spatial filter
- Patent number 6,686,995
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G01 - MEASURING TESTING
Information Patent Grant
UV compatible programmable spatial filter
- Patent number 6,686,994
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter Wilk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20190153520
- Publication date May 23, 2019
- Ultima Genomics, Inc.
- Kristopher BARBEE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHODS FOR BIOLOGICAL SAMPLE PROCESSING AND ANALYSIS
- Publication number 20190153531
- Publication date May 23, 2019
- Ultima Genomics, Inc.
- Kristopher BARBEE
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20170115232
- Publication date Apr 27, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
System and Method for Oblique Incidence Scanning with 2D Array of S...
- Publication number 20160327493
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...
- Publication number 20160313256
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20160290971
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20150226677
- Publication date Aug 13, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20150170357
- Publication date Jun 18, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20140270471
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20140260640
- Publication date Sep 18, 2014
- KLA-Tencor Corporation Drive
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
ENHANCED HIGH-SPEED LOGARITHMIC PHOTO-DETECTOR FOR SPOT SCANNING SY...
- Publication number 20130169957
- Publication date Jul 4, 2013
- KLA-Tencor Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for optically inspecting a sample for anomalies
- Publication number 20050092899
- Publication date May 5, 2005
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER
- Publication number 20040001198
- Publication date Jan 1, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS
Information Patent Application
UV compatible programmable spatial filter
- Publication number 20030184739
- Publication date Oct 2, 2003
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS
Information Patent Application
Systems and methods for simultaneous or sequential multi-perspectiv...
- Publication number 20030011760
- Publication date Jan 16, 2003
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for scanning a beam of light across a specimen
- Publication number 20020181119
- Publication date Dec 5, 2002
- Jamie Sullivan
- G01 - MEASURING TESTING

Jamie Michael Sullivan

Person

Patents Grantslast 30 patents

Methods for biological sample processing and analysis

Methods and systems for analyte detection and analysis

Systems for biological sample processing and analysis

Interleaved acousto-optical device scanning for suppression of opti...

Multi-spot scanning collection optics

System and method for oblique incidence scanning with 2D array of s...

Systems and methods for run-time alignment of a spot scanning wafer...

System and method for apodization in a semiconductor device inspect...

Multi-spot scanning collection optics

Interleaved acousto-optical device scanning for suppression of opti...

Enhanced high-speed logarithmic photo-detector for spot scanning sy...

Image synchronization of scanning wafer inspection system

System and method for apodization in a semiconductor device inspect...

Image synchronization of scanning wafer inspection system

Systems configured to inspect a specimen

Apparatus and methods for optically inspecting a sample for anomalies

Systems and methods for simultaneous or sequential multi-perspectiv...

Apparatus and methods for optically inspecting a sample for anomalies

Systems and methods for scanning a beam of light across a specimen

Two-dimensional UV compatible programmable spatial filter

UV compatible programmable spatial filter

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

METHODS FOR BIOLOGICAL SAMPLE PROCESSING AND ANALYSIS

MULTI-SPOT SCANNING COLLECTION OPTICS

System and Method for Oblique Incidence Scanning with 2D Array of S...

Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...

MULTI-SPOT SCANNING COLLECTION OPTICS

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...

ENHANCED HIGH-SPEED LOGARITHMIC PHOTO-DETECTOR FOR SPOT SCANNING SY...

Apparatus and methods for optically inspecting a sample for anomalies

TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER

UV compatible programmable spatial filter

Systems and methods for simultaneous or sequential multi-perspectiv...

Systems and methods for scanning a beam of light across a specimen