Jeffrey Alan Hawthorne

Person

Decatur, GA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Patterned wafer inspection system using a non-vibrating contact pot...
- Patent number 8,275,564
- Issue date Sep 25, 2012
- Qcept Technologies, Inc.
- Mark A. Schulze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification utilizing data from a non-vibrating contact p...
- Patent number 7,900,526
- Issue date Mar 8, 2011
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Patent number 7,659,734
- Issue date Feb 9, 2010
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,634,365
- Issue date Dec 15, 2009
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 7,379,826
- Issue date May 27, 2008
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,337,076
- Issue date Feb 26, 2008
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 7,308,367
- Issue date Dec 11, 2007
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of motions of rotating shafts using non-vibrating conta...
- Patent number 7,152,476
- Issue date Dec 26, 2006
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,107,158
- Issue date Sep 12, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and apparatus
- Patent number 7,103,482
- Issue date Sep 5, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 7,092,826
- Issue date Aug 15, 2006
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system
- Patent number 6,957,154
- Issue date Oct 18, 2005
- Qcept Technologies, Inc.
- M. Brandon Steele
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...
- Publication number 20090139312
- Publication date Jun 4, 2009
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Publication number 20080217530
- Publication date Sep 11, 2008
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND APPARATUS
- Publication number 20080162066
- Publication date Jul 3, 2008
- QCEPT TECHNOLOGIES, INC.
- M. Brandon STEELE
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and apparatus
- Publication number 20070010954
- Publication date Jan 11, 2007
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection system
- Publication number 20060276976
- Publication date Dec 7, 2006
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection system
- Publication number 20050234658
- Publication date Oct 20, 2005
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and apparatus
- Publication number 20050162178
- Publication date Jul 28, 2005
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND APPARATUS
- Publication number 20050059174
- Publication date Mar 17, 2005
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Measurement of motions of rotating shafts using non-vibrating conta...
- Publication number 20050016279
- Publication date Jan 27, 2005
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20040241890
- Publication date Dec 2, 2004
- QCEPT TECHNOLOGIES, INC.
- M. Brandon Steele
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection system
- Publication number 20040152250
- Publication date Aug 5, 2004
- QCEPT TECHNOLOGIES
- M. Brandon Steele
- G01 - MEASURING TESTING

Jeffrey Alan Hawthorne

Person

Patents Grantslast 30 patents

Patterned wafer inspection system using a non-vibrating contact pot...

Defect classification utilizing data from a non-vibrating contact p...

Semiconductor inspection system and apparatus utilizing a non-vibra...

Inspection system and apparatus

Semiconductor wafer inspection system

Inspection system and apparatus

Wafer inspection system

Measurement of motions of rotating shafts using non-vibrating conta...

Inspection system and apparatus

Inspection system and apparatus

Semiconductor wafer inspection system

Semiconductor wafer inspection system

Patents Applicationslast 30 patents

DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...

Semiconductor inspection system and apparatus utilizing a non-vibra...

INSPECTION SYSTEM AND APPARATUS

Inspection system and apparatus

Semiconductor wafer inspection system

Semiconductor wafer inspection system

Inspection system and apparatus

INSPECTION SYSTEM AND APPARATUS

Measurement of motions of rotating shafts using non-vibrating conta...

Wafer inspection system

Semiconductor wafer inspection system