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Jeo-Yen Lee
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Taipei City, TW
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Patents Grants
last 30 patents
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Patent Grant
Cell structures and semiconductor devices having same
Patent number
11,281,836
Issue date
Mar 22, 2022
Taiwan Semiconductor Manufacturing Company, Ltd
Fong-Yuan Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cell structures and semiconductor devices having same
Patent number
10,970,450
Issue date
Apr 6, 2021
Taiwan Semiconductor Manufacturing Company, Ltd
Fong-Yuan Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit with combined cells and method for manufacturing the same
Patent number
10,396,063
Issue date
Aug 27, 2019
Taiwan Semiconductor Manufacturing Company Ltd.
Fong-Yuan Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and circuit of pulse-vanishing test
Patent number
9,720,038
Issue date
Aug 1, 2017
Mentor Graphics, A Siemens Business
Shi-Yu Huang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CELL STRUCTURES AND SEMICONDUCTOR DEVICES HAVING SAME
Publication number
20210224460
Publication date
Jul 22, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Fong-Yuan CHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CELL STRUCTURES AND SEMICONDUCTOR DEVICES HAVING SAME
Publication number
20180150592
Publication date
May 31, 2018
Taiwan Semiconductor Manufacturing Company, Ltd.
Fong-Yuan CHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CIRCUIT WITH COMBINED CELLS AND METHOD FOR MANUFACTURING THE SAME
Publication number
20170345809
Publication date
Nov 30, 2017
Taiwan Semiconductor Manufacturing company Ltd.
FONG-YUAN CHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Circuit Of Pulse-Vanishing Test
Publication number
20140347088
Publication date
Nov 27, 2014
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING