John M. Carulli, JR.

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Richardson, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for estimating test escapes in integrated circuits
- Patent number 7,865,849
- Issue date Jan 4, 2011
- Texas Instruments Incorporated
- Kenneth M. Butler
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating the early failure rate of semiconductor devices
- Patent number 7,292,058
- Issue date Nov 6, 2007
- Texas Instruments Incorporated
- Thomas J. Anderson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR OUTLIER IDENTIFICATION USING SERIALLY-COMBINED DATA T...
- Publication number 20110071782
- Publication date Mar 24, 2011
- TEXAS INSTRUMENTS INCORPORATED
- AMIT V. NAHAR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ESTIMATING TEST ESCAPES IN INTEGRATED CIRCUITS
- Publication number 20090210830
- Publication date Aug 20, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth M. Butler
- G01 - MEASURING TESTING