Kazuhiro Honda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle source and charged particle beam device
- Patent number 11,990,311
- Issue date May 21, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro Fukuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and charged particle beam device
- Patent number 11,929,230
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source and charged particle beam device
- Patent number 11,651,929
- Issue date May 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Masahiro Fukuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming apparatus
- Patent number 10,969,721
- Issue date Apr 6, 2021
- Canon Kabushiki Kaisha
- Kazuhiro Honda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional laminating and shaping apparatus, control method...
- Patent number 10,406,748
- Issue date Sep 10, 2019
- TECHNOLOGY RESEARCH ASSOCIATION FOR FUTURE ADDITIVE MANUFACTURING
- Kazuhiro Honda
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Method and apparatus for image signal processing
- Patent number 8,885,968
- Issue date Nov 11, 2014
- Jeol Ltd.
- Kazuhiro Honda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Charged-particle beam system
- Patent number 7,605,378
- Issue date Oct 20, 2009
- Jeol Ltd.
- Kazuhiro Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automatically correcting charged-particle...
- Patent number 7,355,175
- Issue date Apr 8, 2008
- Jeol Ltd.
- Kazuhiro Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument and method for metrology
- Patent number 6,928,184
- Issue date Aug 9, 2005
- Jeol Ltd.
- Kazuhiro Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aberration corrector for instrument utilizing charged-particle beam
- Patent number 6,723,997
- Issue date Apr 20, 2004
- Jeol Ltd.
- Miyuki Matsuya
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Rule based control for charged-particle beam instrument
- Patent number 5,767,515
- Issue date Jun 16, 1998
- Jeol Ltd.
- Kazuhiro Honda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Energy Filter, and Energy Analyzer and Charged Particle Beam Device...
- Publication number 20230298845
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Kazuhiro HONDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source and Charged Particle Beam Device
- Publication number 20230238205
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220199349
- Publication date Jun 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source and Charged Particle Beam Device
- Publication number 20210296076
- Publication date Sep 23, 2021
- Hitachi High-Tech Corporation
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20210011408
- Publication date Jan 14, 2021
- Canon Kabushiki Kaisha
- Kazuhiro Honda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Signal Processing
- Publication number 20130241633
- Publication date Sep 19, 2013
- JEOL Ltd.
- Kazuhiro Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged-particle beam system
- Publication number 20070114408
- Publication date May 24, 2007
- JEOL Ltd.
- Kazuhiro Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for automatically correcting charged-particle...
- Publication number 20060169895
- Publication date Aug 3, 2006
- JEOL Ltd.
- Kazuhiro Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration corrector for instrument utilizing charged-particle beam
- Publication number 20030098415
- Publication date May 29, 2003
- JEOL Ltd.
- Miyuki Matsuya
- G01 - MEASURING TESTING
Information Patent Application
Instrument and method for metrology
- Publication number 20020028012
- Publication date Mar 7, 2002
- JEOL Ltd.
- Kazuhiro Honda
- G06 - COMPUTING CALCULATING COUNTING

Kazuhiro Honda

Person

Patents Grantslast 30 patents

Charged particle source and charged particle beam device

Electron source and charged particle beam device

Charged particle source and charged particle beam device

Image forming apparatus

Three-dimensional laminating and shaping apparatus, control method...

Method and apparatus for image signal processing

Charged-particle beam system

Method and apparatus for automatically correcting charged-particle...

Instrument and method for metrology

Aberration corrector for instrument utilizing charged-particle beam

Rule based control for charged-particle beam instrument

Patents Applicationslast 30 patents

Energy Filter, and Energy Analyzer and Charged Particle Beam Device...

Charged Particle Source and Charged Particle Beam Device

ELECTRON SOURCE AND CHARGED PARTICLE BEAM DEVICE

Charged Particle Source and Charged Particle Beam Device

IMAGE FORMING APPARATUS

Method and Apparatus for Signal Processing

Charged-particle beam system

Method and apparatus for automatically correcting charged-particle...

Aberration corrector for instrument utilizing charged-particle beam

Instrument and method for metrology