Kazunori Somehara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system
- Patent number 9,349,569
- Issue date May 24, 2016
- Jeol Ltd.
- Takaki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Image Acquisition Method
- Publication number 20230127255
- Publication date Apr 27, 2023
- JEOL Ltd.
- Kazunori Somehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20150255245
- Publication date Sep 10, 2015
- JEOL Ltd.
- Takaki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS