Ketan J. Shah

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
FIB based open via analysis and repair
- Patent number 7,786,436
- Issue date Aug 31, 2010
- DCG Systems, Inc.
- Theodore R. Lundquist
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,400,154
- Issue date Jul 15, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,943,572
- Issue date Sep 13, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050231219
- Publication date Oct 20, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Methods of using measured time resolved photon emission data and si...
- Publication number 20050024057
- Publication date Feb 3, 2005
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040189335
- Publication date Sep 30, 2004
- Romain Desplats
- G01 - MEASURING TESTING