Makoto Nakanishi

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Switch apparatus and test apparatus
- Patent number 9,184,741
- Issue date Nov 10, 2015
- Advantest Corporation
- Yoshiyuki Hata
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus and test apparatus
- Patent number 8,552,735
- Issue date Oct 8, 2013
- Advantest Corporation
- Yoshiyuki Hata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, method for manufacturing of semiconductor dev...
- Patent number 8,466,566
- Issue date Jun 18, 2013
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrum analyzer system and spectrum analyze method
- Patent number 8,072,206
- Issue date Dec 6, 2011
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Grant
Computer system, server, and method for supporting cooking, and com...
- Patent number 7,359,867
- Issue date Apr 15, 2008
- Ricoh Company, Ltd.
- Kenji Kuwana
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resin mold semiconductor device
- Patent number 6,710,464
- Issue date Mar 23, 2004
- Renesas Technology Corp.
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure detection system for detecting a failure in a power converter
- Patent number 5,786,641
- Issue date Jul 28, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Nakanishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING PROGNOSIS OF CANCER
- Publication number 20220120753
- Publication date Apr 21, 2022
- THE UNIVERSITY OF TOKYO
- Makoto NAKANISHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR REMOVING SENESCENT CELL, AND METHOD FOR PREPARING SENESC...
- Publication number 20220119768
- Publication date Apr 21, 2022
- THE UNIVERSITY OF TOKYO
- Makoto NAKANISHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DRIVE CIRCUIT, SWITCH APPARATUS, AND TEST APPARATUS
- Publication number 20140361790
- Publication date Dec 11, 2014
- Advantest Corporation
- Makoto NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
SWITCH APPARATUS AND TEST APPARATUS
- Publication number 20140002105
- Publication date Jan 2, 2014
- Advantest Corporation
- Yoshiyuki HATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEV...
- Publication number 20120074577
- Publication date Mar 29, 2012
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
- Publication number 20110316554
- Publication date Dec 29, 2011
- Advantest Corporation
- Yoshiyuki HATA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD
- Publication number 20090302829
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATION APPARATUS AND TEST APPARATUS
- Publication number 20090085579
- Publication date Apr 2, 2009
- Advantest Corporation
- Hiroaki TAKEUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SPECTRUM ANALYZER, SPECTRUM ANALYSIS METHOD AND RECORDING MEDIUM
- Publication number 20080231254
- Publication date Sep 25, 2008
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Application
Computer system, server, and method for supporting cooking, and com...
- Publication number 20060218048
- Publication date Sep 28, 2006
- Kenji Kuwana
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Resin mold semiconductor device
- Publication number 20030047815
- Publication date Mar 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computer system, server, and method for supporting cooking, and com...
- Publication number 20020143658
- Publication date Oct 3, 2002
- Kenji Kuwana
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device, and apparatus and method for die bonding the...
- Publication number 20020090752
- Publication date Jul 11, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS

Makoto Nakanishi

Person

Patents Grantslast 30 patents

Switch apparatus and test apparatus

Switching apparatus and test apparatus

Semiconductor device, method for manufacturing of semiconductor dev...

Spectrum analyzer system and spectrum analyze method

Computer system, server, and method for supporting cooking, and com...

Resin mold semiconductor device

Failure detection system for detecting a failure in a power converter

Patents Applicationslast 30 patents

METHOD FOR DETERMINING PROGNOSIS OF CANCER

METHOD FOR REMOVING SENESCENT CELL, AND METHOD FOR PREPARING SENESC...

DRIVE CIRCUIT, SWITCH APPARATUS, AND TEST APPARATUS

SWITCH APPARATUS AND TEST APPARATUS

SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEV...

SWITCHING APPARATUS AND TEST APPARATUS

SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD

ATTENUATION APPARATUS AND TEST APPARATUS

SPECTRUM ANALYZER, SPECTRUM ANALYSIS METHOD AND RECORDING MEDIUM

Computer system, server, and method for supporting cooking, and com...

Resin mold semiconductor device

Computer system, server, and method for supporting cooking, and com...

Semiconductor device, and apparatus and method for die bonding the...