Manabu Miura

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, unique ID of semiconductor device and method...
- Patent number 7,809,997
- Issue date Oct 5, 2010
- Renesas Electronics Corporation
- Yasufumi Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device downsizing its built-in driver
- Patent number 6,756,803
- Issue date Jun 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit for multi-chip package with means...
- Patent number 6,724,237
- Issue date Apr 20, 2004
- Renesas Technology Corp.
- Takekazu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing a semiconductor memory device
- Patent number 6,715,117
- Issue date Mar 30, 2004
- Renesas Technology Corp.
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Grant
Line delay generator using one-port RAM
- Patent number 6,570,572
- Issue date May 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device allowing accurate evaluatio...
- Patent number 6,512,707
- Issue date Jan 28, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Miura
- G11 - INFORMATION STORAGE
Information Patent Grant
Variable delay circuit for varying delay time and pulse width
- Patent number 5,949,268
- Issue date Sep 7, 1999
- Misubishi Denki Kabushiki Kaisha
- Manabu Miura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
First-in first-out memory device
- Patent number 5,375,092
- Issue date Dec 20, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Masaharu Taniguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device, unique ID of semiconductor device and method...
- Publication number 20070296403
- Publication date Dec 27, 2007
- Renesas Technology Corp.
- Yasufumi Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Audio data processor
- Publication number 20060015795
- Publication date Jan 19, 2006
- Renesas Technology Corp.
- Manabu Miura
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE DOWNSIZING ITS BUILT-IN DRIVER
- Publication number 20040027150
- Publication date Feb 12, 2004
- Manabu Miura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device allowing accurate evaluatio...
- Publication number 20030067815
- Publication date Apr 10, 2003
- Manabu Miura
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit and multi-chip package
- Publication number 20030057775
- Publication date Mar 27, 2003
- Takekazu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit facilitating its unit test
- Publication number 20020162060
- Publication date Oct 31, 2002
- Makoto Hatakenaka
- G01 - MEASURING TESTING
Information Patent Application
Method of testing a semiconductor memory device
- Publication number 20020048856
- Publication date Apr 25, 2002
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device allowing accurate evaluatio...
- Publication number 20010055226
- Publication date Dec 27, 2001
- Manabu Miura
- G11 - INFORMATION STORAGE

Manabu Miura

Person

Patents Grantslast 30 patents

Semiconductor device, unique ID of semiconductor device and method...

Semiconductor device downsizing its built-in driver

Semiconductor integrated circuit for multi-chip package with means...

Method of testing a semiconductor memory device

Line delay generator using one-port RAM

Semiconductor integrated circuit device allowing accurate evaluatio...

Variable delay circuit for varying delay time and pulse width

First-in first-out memory device

Patents Applicationslast 30 patents

Semiconductor device, unique ID of semiconductor device and method...

Audio data processor

SEMICONDUCTOR DEVICE DOWNSIZING ITS BUILT-IN DRIVER

Semiconductor integrated circuit device allowing accurate evaluatio...

Semiconductor integrated circuit and multi-chip package

Integrated circuit facilitating its unit test

Method of testing a semiconductor memory device

Semiconductor integrated circuit device allowing accurate evaluatio...