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Marco Fuhrmann
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Gilbert, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Pressure sensor featuring offset cancellation and method of making
Patent number
7,673,519
Issue date
Mar 9, 2010
FREESCALE SEMICONDUCTOR, INC.
Marco Fuhrmann
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for closed loop offset cancellation
Patent number
7,665,361
Issue date
Feb 23, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Symmetrical differential capacitive sensor and method of making same
Patent number
7,578,190
Issue date
Aug 25, 2009
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
Publication number
20140182351
Publication date
Jul 3, 2014
TODD F. MILLER
G01 - MEASURING TESTING
Information
Patent Application
CONTINUOUS SELFTEST FOR INERTIAL SENSORS AT 0 HZ
Publication number
20100122565
Publication date
May 20, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR FEATURING OFFSET CANCELLATION AND METHOD OF MAKING
Publication number
20100050776
Publication date
Mar 4, 2010
Marco Fuhrmann
G01 - MEASURING TESTING
Information
Patent Application
SYMMETRICAL DIFFERENTIAL CAPACITIVE SENSOR AND METHOD OF MAKING SAME
Publication number
20090031809
Publication date
Feb 5, 2009
FREESCALE SEMICONDUCTOR, INC.
Yizhen Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CLOSED LOOP OFFSET CANCELLATION
Publication number
20080178671
Publication date
Jul 31, 2008
Todd F. Miller
G01 - MEASURING TESTING