Masayoshi TODOROKIHARA

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Munich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Frequency measurement device and electronic device
- Patent number 9,026,403
- Issue date May 5, 2015
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING
Information Patent Grant
Frequency measuring device and odor sensor and electronic equipment...
- Patent number 8,917,078
- Issue date Dec 23, 2014
- Seiko Epson Corporation
- Takayuki Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Frequency measurement method, frequency measurement device and appa...
- Patent number 8,718,961
- Issue date May 6, 2014
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit, sensor system equipped with the electric circuit,...
- Patent number 8,643,440
- Issue date Feb 4, 2014
- Seiko Epson Corporation
- Takayuki Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Signal generation circuit, frequency measurement device including t...
- Patent number 8,593,131
- Issue date Nov 26, 2013
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY MEASUREMENT DEVICE AND ELECTRONIC DEVICE
- Publication number 20120053903
- Publication date Mar 1, 2012
- SEIKO EPSON CORPORATION
- Masayoshi TODOROKIHARA
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY MEASURING DEVICE AND ODOR SENSOR AND ELECTRONIC EQUIPMENT...
- Publication number 20110309821
- Publication date Dec 22, 2011
- SEIKO EPSON CORPORATION
- Takayuki Kondo
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL GENERATION CIRCUIT, FREQUENCY MEASUREMENT DEVICE INCLUDING T...
- Publication number 20110084687
- Publication date Apr 14, 2011
- SEIKO EPSON CORPORATION
- Masayoshi TODOROKIHARA
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY MEASUREMENT METHOD, FREQUENCY MEASUREMENT DEVICE AND APPA...
- Publication number 20110082656
- Publication date Apr 7, 2011
- SEIKO EPSON CORPORATION
- Masayoshi TODOROKIHARA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CIRCUIT, SENSOR SYSTEM EQUIPPED WITH THE ELECTRIC CIRCUIT,...
- Publication number 20110050352
- Publication date Mar 3, 2011
- SEIKO EPSON CORPORATION
- Takayuki Kondo
- H03 - BASIC ELECTRONIC CIRCUITRY