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Meng Lu
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Montreal, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Fault tolerant scan chain for a parallel processing system
Patent number
6,928,606
Issue date
Aug 9, 2005
Hyperchip Inc.
Yvon Savaria
G01 - MEASURING TESTING
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Patent Grant
Method of generating large scale signal paths in a parallel process...
Patent number
6,858,356
Issue date
Feb 22, 2005
Hyperchip Inc.
Yvon Savaria
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Method of generating large scale signal paths in a parallel process...
Publication number
20030138705
Publication date
Jul 24, 2003
Yvon Savaria
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Fault tolerant scan chain for a parallel processing system
Publication number
20030120987
Publication date
Jun 26, 2003
Yvon Savaria
G01 - MEASURING TESTING