Michael P. HARRIS

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Garland, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and temperature stabilizer for testing semiconductor dev...
- Patent number 7,495,458
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Adolphus E. McClanahan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for evaluating the planarity and parallelism of a...
- Patent number 6,870,382
- Issue date Mar 22, 2005
- Texas Instruments Incorporated
- Michael P. Harris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND TEMPERATURE STABILIZER FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20090115441
- Publication date May 7, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Adolphus E. MCCLANAHAN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TEMPERATURE STABILIZER FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20070268029
- Publication date Nov 22, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Adolphus E. McClanahan
- G01 - MEASURING TESTING
Information Patent Application
System and method for evaluating the planarity and parallelism of a...
- Publication number 20030206031
- Publication date Nov 6, 2003
- Michael P. Harris
- G01 - MEASURING TESTING