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Naoto KOSHIMURA
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Kobe-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Sample analyzer and method of selecting analysis regions of noise a...
Patent number
9,863,872
Issue date
Jan 9, 2018
SYSMEX CORPORATION
Naoto Koshimura
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, sample analyzing method, and program determining d...
Patent number
9,863,964
Issue date
Jan 9, 2018
Sysmex Corporation
Naoto Koshimura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND NON-TRANSITORY COMPUT...
Publication number
20160327582
Publication date
Nov 10, 2016
SYSMEX CORPORATION
Naoto KOSHIMURA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND NON TRANSITORY COMPUT...
Publication number
20160291040
Publication date
Oct 6, 2016
SYSMEX CORPORATION
Naoto KOSHIMURA
G01 - MEASURING TESTING
Information
Patent Application
IMMUNOASSAY METHOD AND IMMUNOASSAY APPARATUS
Publication number
20140212991
Publication date
Jul 31, 2014
SYSMEX CORPORATION
Naoto KOSHIMURA
G01 - MEASURING TESTING
Information
Patent Application
IMMUNOASSAY AND IMMUNOASSAY APPARATUS
Publication number
20140178908
Publication date
Jun 26, 2014
SYSMEX CORPORATION
Keiko YOSHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS RESULT PROVIDING SYSTEM, SAMPLE ANALYZING SYSTEM, ANALYSIS...
Publication number
20130260413
Publication date
Oct 3, 2013
SYSMEX CORPORATION
Naoto KOSHIMURA
G01 - MEASURING TESTING