Nicholas Eric Gagliolo

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Washington, DC, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for localization of open defects in electronic de...
- Patent number 9,529,035
- Issue date Dec 27, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR LOCALIZATION OF OPEN DEFECTS IN ELECTRONIC DE...
- Publication number 20140253111
- Publication date Sep 11, 2014
- Antonio Orozco
- G01 - MEASURING TESTING