Olivier Vaillant

Person

  • Chalons en Champagne, FR

Patents Grantslast 30 patents

  • Information Patent Grant

    Depth gauge

    • Patent number 6,786,090
    • Issue date Sep 7, 2004
    • Marwal Systems
    • Karim Benghezal
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Depth gauge

    • Publication number 20030140696
    • Publication date Jul 31, 2003
    • Marwal Systems
    • Karim Benghezal
    • G01 - MEASURING TESTING