Osamu Kurosu

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Patents Grantslast 30 patents

Information Patent Grant
IC device inspection apparatus
- Patent number 6,377,064
- Issue date Apr 23, 2002
- NEC Corporation
- Osamu Kurosu
- G01 - MEASURING TESTING
Information Patent Grant
IC device temperature control system and IC device inspection appar...
- Patent number 6,262,584
- Issue date Jul 17, 2001
- McElectronics Co., Ltd.
- Osamu Kurosu
- G01 - MEASURING TESTING