Paolo Dalla Ricca

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable multi-function module for automatic test equipment sys...
- Patent number 7,343,538
- Issue date Mar 11, 2008
- Credence Systems Corporation
- Paolo Dalla Ricca
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for use of high sampling frequency A/D convert...
- Patent number 7,254,203
- Issue date Aug 7, 2007
- Credence Systems Corporation
- Maurizio Gavardoni
- G11 - INFORMATION STORAGE
Information Patent Grant
Low-jitter clock for test system
- Patent number 7,093,177
- Issue date Aug 15, 2006
- Schlumberger Technologies, Inc.
- Burnell G. West
- G11 - INFORMATION STORAGE
Information Patent Grant
Test instrument with multiple analog modules
- Patent number 6,870,384
- Issue date Mar 22, 2005
- Credence Systems Corporation
- Paolo Dalla Ricca
- G01 - MEASURING TESTING
Information Patent Grant
Generating pulses in analog channel of ATE tester
- Patent number 5,918,198
- Issue date Jun 29, 1999
- Schlumberger Technologies Inc.
- Paolo Dalla Ricca
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Programmable multi-function module for automatic test equipment sys...
- Publication number 20040177293
- Publication date Sep 9, 2004
- Paolo Dalla Ricca
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Programmable digital interface for analog test equipment systems
- Publication number 20040162694
- Publication date Aug 19, 2004
- Paolo Dalla Ricca
- G01 - MEASURING TESTING
Information Patent Application
Low-jitter clock for test system
- Publication number 20030005360
- Publication date Jan 2, 2003
- Burnell G. West
- G01 - MEASURING TESTING